Proceedings 1988: San Diego, CA, USA, February 10 - 12, 1988
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York, NY
Inst. of Electrical and Electronics Engineers
1988
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| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | 158 S. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV006159291 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 930204s1988 d||| |||| 10||| undod | ||
| 035 | |a (OCoLC)631456290 | ||
| 035 | |a (DE-599)BVBBV006159291 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-91 | ||
| 084 | |a ELT 249f |2 stub | ||
| 111 | 2 | |a Semiconductor Thermal and Temperature Measurement Symposium |n 4 |d 1988 |c San Diego, Calif. |j Verfasser |0 (DE-588)812396-2 |4 aut | |
| 245 | 1 | 0 | |a Proceedings 1988 |b San Diego, CA, USA, February 10 - 12, 1988 |c Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium |
| 264 | 1 | |a New York, NY |b Inst. of Electrical and Electronics Engineers |c 1988 | |
| 300 | |a 158 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 0 | 7 | |a Thermische Belastung |0 (DE-588)4059816-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1988 |z San Diego Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Thermische Belastung |0 (DE-588)4059816-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003896540 | ||
Datensatz im Suchindex
| _version_ | 1804120389148737536 |
|---|---|
| any_adam_object | |
| author_corporate | Semiconductor Thermal and Temperature Measurement Symposium San Diego, Calif |
| author_corporate_role | aut |
| author_facet | Semiconductor Thermal and Temperature Measurement Symposium San Diego, Calif |
| author_sort | Semiconductor Thermal and Temperature Measurement Symposium San Diego, Calif |
| building | Verbundindex |
| bvnumber | BV006159291 |
| classification_tum | ELT 249f |
| ctrlnum | (OCoLC)631456290 (DE-599)BVBBV006159291 |
| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01311nam a2200337 c 4500</leader><controlfield tag="001">BV006159291</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930204s1988 d||| |||| 10||| undod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)631456290</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006159291</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 249f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Semiconductor Thermal and Temperature Measurement Symposium</subfield><subfield code="n">4</subfield><subfield code="d">1988</subfield><subfield code="c">San Diego, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)812396-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings 1988</subfield><subfield code="b">San Diego, CA, USA, February 10 - 12, 1988</subfield><subfield code="c">Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">158 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Thermische Belastung</subfield><subfield code="0">(DE-588)4059816-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1988</subfield><subfield code="z">San Diego Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Thermische Belastung</subfield><subfield code="0">(DE-588)4059816-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003896540</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1988 San Diego Calif. gnd-content |
| genre_facet | Konferenzschrift 1988 San Diego Calif. |
| id | DE-604.BV006159291 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:41:18Z |
| institution | BVB |
| institution_GND | (DE-588)812396-2 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003896540 |
| oclc_num | 631456290 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 158 S. graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | Semiconductor Thermal and Temperature Measurement Symposium 4 1988 San Diego, Calif. Verfasser (DE-588)812396-2 aut Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium New York, NY Inst. of Electrical and Electronics Engineers 1988 158 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Thermische Belastung (DE-588)4059816-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 San Diego Calif. gnd-content Halbleiterbauelement (DE-588)4113826-0 s Thermische Belastung (DE-588)4059816-0 s DE-604 |
| spellingShingle | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 Thermische Belastung (DE-588)4059816-0 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4059816-0 (DE-588)4113826-0 (DE-588)1071861417 |
| title | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 |
| title_auth | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 |
| title_exact_search | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 |
| title_full | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium |
| title_fullStr | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium |
| title_full_unstemmed | Proceedings 1988 San Diego, CA, USA, February 10 - 12, 1988 Fourth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium |
| title_short | Proceedings 1988 |
| title_sort | proceedings 1988 san diego ca usa february 10 12 1988 |
| title_sub | San Diego, CA, USA, February 10 - 12, 1988 |
| topic | Thermische Belastung (DE-588)4059816-0 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Thermische Belastung Halbleiterbauelement Konferenzschrift 1988 San Diego Calif. |
| work_keys_str_mv | AT semiconductorthermalandtemperaturemeasurementsymposiumsandiegocalif proceedings1988sandiegocausafebruary10121988 |