Degradation of thin silicon dioxide films and eeprom cells:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
1990
|
| Schlagworte: | |
| Beschreibung: | Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. 185 S. : graph. Darst. |
| Beschreibung: | 2 Mikrofiches; 24x |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV006157857 | ||
| 003 | DE-604 | ||
| 005 | 20060316 | ||
| 007 | he|uuuuuuuuuu | ||
| 008 | 930203s1990 bm||| 00||| undod | ||
| 035 | |a (OCoLC)631451542 | ||
| 035 | |a (DE-599)BVBBV006157857 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-91 | ||
| 084 | |a PHY 700d |2 stub | ||
| 084 | |a DAT 173d |2 stub | ||
| 084 | |a ELT 358d |2 stub | ||
| 084 | |a ELT 240d |2 stub | ||
| 100 | 1 | |a Manthey, Jacek T. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Degradation of thin silicon dioxide films and eeprom cells |c par Jacek Tadeusz Manthey |
| 264 | 1 | |c 1990 | |
| 300 | |a 2 Mikrofiches; 24x | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. 185 S. : graph. Darst. | ||
| 650 | 0 | 7 | |a Floating-Gate-Struktur |0 (DE-588)4325978-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroform |0 (DE-588)4039216-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronischer Transport |0 (DE-588)4210733-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a EEPROM |0 (DE-588)4151060-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Degradation |g Technik |0 (DE-588)4206992-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Siliciumdioxid |0 (DE-588)4077447-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Siliciumdioxid |0 (DE-588)4077447-8 |D s |
| 689 | 0 | 1 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 0 | 2 | |a Elektronischer Transport |0 (DE-588)4210733-7 |D s |
| 689 | 0 | 3 | |a Degradation |g Technik |0 (DE-588)4206992-0 |D s |
| 689 | 0 | 4 | |a EEPROM |0 (DE-588)4151060-4 |D s |
| 689 | 0 | 5 | |a Mikroform |0 (DE-588)4039216-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a EEPROM |0 (DE-588)4151060-4 |D s |
| 689 | 1 | 1 | |a Floating-Gate-Struktur |0 (DE-588)4325978-9 |D s |
| 689 | 1 | 2 | |a Degradation |g Technik |0 (DE-588)4206992-0 |D s |
| 689 | 1 | 3 | |a Mikroform |0 (DE-588)4039216-8 |D s |
| 689 | 1 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003895334 | ||
Datensatz im Suchindex
| _version_ | 1804120387262349312 |
|---|---|
| any_adam_object | |
| author | Manthey, Jacek T. |
| author_facet | Manthey, Jacek T. |
| author_role | aut |
| author_sort | Manthey, Jacek T. |
| author_variant | j t m jt jtm |
| building | Verbundindex |
| bvnumber | BV006157857 |
| classification_tum | PHY 700d DAT 173d ELT 358d ELT 240d |
| ctrlnum | (OCoLC)631451542 (DE-599)BVBBV006157857 |
| discipline | Physik Informatik Elektrotechnik |
| format | Microfilm Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02028nam a2200541 c 4500</leader><controlfield tag="001">BV006157857</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20060316 </controlfield><controlfield tag="007">he|uuuuuuuuuu</controlfield><controlfield tag="008">930203s1990 bm||| 00||| undod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)631451542</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006157857</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 700d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">DAT 173d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 358d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Manthey, Jacek T.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Degradation of thin silicon dioxide films and eeprom cells</subfield><subfield code="c">par Jacek Tadeusz Manthey</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">2 Mikrofiches; 24x</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">h</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">he</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. 185 S. : graph. Darst.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Floating-Gate-Struktur</subfield><subfield code="0">(DE-588)4325978-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroform</subfield><subfield code="0">(DE-588)4039216-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronischer Transport</subfield><subfield code="0">(DE-588)4210733-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">EEPROM</subfield><subfield code="0">(DE-588)4151060-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Degradation</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4206992-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Siliciumdioxid</subfield><subfield code="0">(DE-588)4077447-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Siliciumdioxid</subfield><subfield code="0">(DE-588)4077447-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Elektronischer Transport</subfield><subfield code="0">(DE-588)4210733-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Degradation</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4206992-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">EEPROM</subfield><subfield code="0">(DE-588)4151060-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">Mikroform</subfield><subfield code="0">(DE-588)4039216-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">EEPROM</subfield><subfield code="0">(DE-588)4151060-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Floating-Gate-Struktur</subfield><subfield code="0">(DE-588)4325978-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Degradation</subfield><subfield code="g">Technik</subfield><subfield code="0">(DE-588)4206992-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="3"><subfield code="a">Mikroform</subfield><subfield code="0">(DE-588)4039216-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003895334</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV006157857 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T16:41:17Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003895334 |
| oclc_num | 631451542 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 2 Mikrofiches; 24x |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| record_format | marc |
| spelling | Manthey, Jacek T. Verfasser aut Degradation of thin silicon dioxide films and eeprom cells par Jacek Tadeusz Manthey 1990 2 Mikrofiches; 24x txt rdacontent h rdamedia he rdacarrier Lausanne, Ecole Polytechnique Federale, Diss., 1990. - Mikroreprod. e. Ms. 185 S. : graph. Darst. Floating-Gate-Struktur (DE-588)4325978-9 gnd rswk-swf Mikroform (DE-588)4039216-8 gnd rswk-swf Elektronischer Transport (DE-588)4210733-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf EEPROM (DE-588)4151060-4 gnd rswk-swf Degradation Technik (DE-588)4206992-0 gnd rswk-swf Siliciumdioxid (DE-588)4077447-8 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Siliciumdioxid (DE-588)4077447-8 s Dünne Schicht (DE-588)4136925-7 s Elektronischer Transport (DE-588)4210733-7 s Degradation Technik (DE-588)4206992-0 s EEPROM (DE-588)4151060-4 s Mikroform (DE-588)4039216-8 s DE-604 Floating-Gate-Struktur (DE-588)4325978-9 s |
| spellingShingle | Manthey, Jacek T. Degradation of thin silicon dioxide films and eeprom cells Floating-Gate-Struktur (DE-588)4325978-9 gnd Mikroform (DE-588)4039216-8 gnd Elektronischer Transport (DE-588)4210733-7 gnd Dünne Schicht (DE-588)4136925-7 gnd EEPROM (DE-588)4151060-4 gnd Degradation Technik (DE-588)4206992-0 gnd Siliciumdioxid (DE-588)4077447-8 gnd |
| subject_GND | (DE-588)4325978-9 (DE-588)4039216-8 (DE-588)4210733-7 (DE-588)4136925-7 (DE-588)4151060-4 (DE-588)4206992-0 (DE-588)4077447-8 (DE-588)4113937-9 |
| title | Degradation of thin silicon dioxide films and eeprom cells |
| title_auth | Degradation of thin silicon dioxide films and eeprom cells |
| title_exact_search | Degradation of thin silicon dioxide films and eeprom cells |
| title_full | Degradation of thin silicon dioxide films and eeprom cells par Jacek Tadeusz Manthey |
| title_fullStr | Degradation of thin silicon dioxide films and eeprom cells par Jacek Tadeusz Manthey |
| title_full_unstemmed | Degradation of thin silicon dioxide films and eeprom cells par Jacek Tadeusz Manthey |
| title_short | Degradation of thin silicon dioxide films and eeprom cells |
| title_sort | degradation of thin silicon dioxide films and eeprom cells |
| topic | Floating-Gate-Struktur (DE-588)4325978-9 gnd Mikroform (DE-588)4039216-8 gnd Elektronischer Transport (DE-588)4210733-7 gnd Dünne Schicht (DE-588)4136925-7 gnd EEPROM (DE-588)4151060-4 gnd Degradation Technik (DE-588)4206992-0 gnd Siliciumdioxid (DE-588)4077447-8 gnd |
| topic_facet | Floating-Gate-Struktur Mikroform Elektronischer Transport Dünne Schicht EEPROM Degradation Technik Siliciumdioxid Hochschulschrift |
| work_keys_str_mv | AT mantheyjacekt degradationofthinsilicondioxidefilmsandeepromcells |