A vision system for automated dopant waver inspection: VISION '89, April 24 - 27, 1989, Chicago,Illinois
Gespeichert in:
Format: | Buch |
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Sprache: | Undetermined |
Veröffentlicht: |
Dearborn, Mich.
Soc. of Manufacturing Engineers
1989
|
Schriftenreihe: | Society of Manufacturing Engineers: Technical paper / MS
1989,202 |
Schlagworte: | |
Beschreibung: | S. 5,25 - 5,41 Ill., graph. Darst. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV006157808 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 930203s1989 ad|| |||| 10||| undod | ||
035 | |a (OCoLC)631451224 | ||
035 | |a (DE-599)BVBBV006157808 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-91 | ||
245 | 1 | 0 | |a A vision system for automated dopant waver inspection |b VISION '89, April 24 - 27, 1989, Chicago,Illinois |c authors Jack C. H. Chung ... |
264 | 1 | |a Dearborn, Mich. |b Soc. of Manufacturing Engineers |c 1989 | |
300 | |a S. 5,25 - 5,41 |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Society of Manufacturing Engineers: Technical paper / MS |v 1989,202 | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Chung, Jack C. |e Sonstige |4 oth | |
810 | 2 | |a MS |t Society of Manufacturing Engineers: Technical paper |v 1989,202 |w (DE-604)BV001897764 |9 1989,202 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-003895296 |
Datensatz im Suchindex
_version_ | 1804120387195240448 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV006157808 |
ctrlnum | (OCoLC)631451224 (DE-599)BVBBV006157808 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01045nam a2200277 cb4500</leader><controlfield tag="001">BV006157808</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930203s1989 ad|| |||| 10||| undod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)631451224</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006157808</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A vision system for automated dopant waver inspection</subfield><subfield code="b">VISION '89, April 24 - 27, 1989, Chicago,Illinois</subfield><subfield code="c">authors Jack C. H. Chung ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dearborn, Mich.</subfield><subfield code="b">Soc. of Manufacturing Engineers</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">S. 5,25 - 5,41</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Society of Manufacturing Engineers: Technical paper / MS</subfield><subfield code="v">1989,202</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chung, Jack C.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">MS</subfield><subfield code="t">Society of Manufacturing Engineers: Technical paper</subfield><subfield code="v">1989,202</subfield><subfield code="w">(DE-604)BV001897764</subfield><subfield code="9">1989,202</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003895296</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV006157808 |
illustrated | Illustrated |
indexdate | 2024-07-09T16:41:16Z |
institution | BVB |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003895296 |
oclc_num | 631451224 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | S. 5,25 - 5,41 Ill., graph. Darst. |
publishDate | 1989 |
publishDateSearch | 1989 |
publishDateSort | 1989 |
publisher | Soc. of Manufacturing Engineers |
record_format | marc |
series2 | Society of Manufacturing Engineers: Technical paper / MS |
spelling | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois authors Jack C. H. Chung ... Dearborn, Mich. Soc. of Manufacturing Engineers 1989 S. 5,25 - 5,41 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Manufacturing Engineers: Technical paper / MS 1989,202 (DE-588)1071861417 Konferenzschrift gnd-content Chung, Jack C. Sonstige oth MS Society of Manufacturing Engineers: Technical paper 1989,202 (DE-604)BV001897764 1989,202 |
spellingShingle | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois |
subject_GND | (DE-588)1071861417 |
title | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois |
title_auth | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois |
title_exact_search | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois |
title_full | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois authors Jack C. H. Chung ... |
title_fullStr | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois authors Jack C. H. Chung ... |
title_full_unstemmed | A vision system for automated dopant waver inspection VISION '89, April 24 - 27, 1989, Chicago,Illinois authors Jack C. H. Chung ... |
title_short | A vision system for automated dopant waver inspection |
title_sort | a vision system for automated dopant waver inspection vision 89 april 24 27 1989 chicago illinois |
title_sub | VISION '89, April 24 - 27, 1989, Chicago,Illinois |
topic_facet | Konferenzschrift |
volume_link | (DE-604)BV001897764 |
work_keys_str_mv | AT chungjackc avisionsystemforautomateddopantwaverinspectionvision89april24271989chicagoillinois |