Conference record: May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Inst. of Electrical and Electronics Engineers
1991
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XXI, 647 S. Ill., graph. Darst. |
| ISBN: | 0879425792 0879425806 0879425814 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV005924026 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 930114s1991 ad|| |||| 10||| engod | ||
| 020 | |a 0879425792 |9 0-87942-579-2 | ||
| 020 | |a 0879425806 |9 0-87942-580-6 | ||
| 020 | |a 0879425814 |9 0-87942-581-4 | ||
| 035 | |a (OCoLC)24160151 | ||
| 035 | |a (DE-599)BVBBV005924026 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 050 | 0 | |a T50 | |
| 084 | |a ZQ 1900 |0 (DE-625)157997: |2 rvk | ||
| 084 | |a MSR 001f |2 stub | ||
| 111 | 2 | |a Instrumentation and Measurement Technology Conference |n 8 |d 1991 |c Atlanta, Ga. |j Verfasser |0 (DE-588)5058882-5 |4 aut | |
| 245 | 1 | 0 | |a Conference record |b May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia |c IEEE Instrumentation and Measurement Technology Conference |
| 264 | 1 | |a New York, NY |b Inst. of Electrical and Electronics Engineers |c 1991 | |
| 300 | |a XXI, 647 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Electronic measurements |v Congresses | |
| 650 | 4 | |a Mensuration |v Congresses | |
| 650 | 0 | 7 | |a Messtechnik |0 (DE-588)4114575-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Nachrichtentechnik |0 (DE-588)4041066-3 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1991 |z Atlanta Ga. |2 gnd-content | |
| 689 | 0 | 0 | |a Messtechnik |0 (DE-588)4114575-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Nachrichtentechnik |0 (DE-588)4041066-3 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 856 | 4 | 2 | |m Digitalisierung TU Muenchen |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003709676&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003709676 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804120114901024768 |
|---|---|
| adam_text | Tuesday. May
14, 1991
SESSION 1A
-
Non-Destructive Testing
(8:30-10
am)
Chairman
-
Seppo Rantala,
Risto Suoranta,
Technical Research
Centre of Finland, Machine Automation Lab, Tampere,
Finland
Enhanced Vibration Monitoring Using Parametric Mod¬
elling Technique
Vairis Shtrauss, Academy of Sciences of Latvian
SSR,
Institute of Polymer Mechanics, Riga, Latvia
Multi-parametric Identification Technique for Nonde¬
structive Dielectric Spectrometry
SESSION 1B
--
VXI Bus
(8:30-10
am)
Chairman
-
Robert Goldberg, Allied-Signal, Inc.,
Teterboro, NJ
David Haworth, Tektronix, Inc., Beaverton, Ore
Introductton to VXIbus
Malcolm Levy, Racal-Dana Instruments, Irvine, Calif
Using VXIBus-Based Products for RF Test Systems
Harmohan
Singh, Allied Signal, Inc.,
Bendix
Test Sys¬
tems
Div.,
Teterboro, NJ
VXI Bus
-
A Military ATE Application
Douglas M. Lyons, James M. Grajera, Dennis A.
Dingmann,
Lockheed Missiles
&
Space Co., Sunny¬
vale, Calif
VXI Evaluation Test Bed
SESSION
1С -
Automated Microwave Measurements
(8:30-10
am)
Chairman
-
James D. Huff, Scientific-Atlanta, Inc.,
Atlanta, Ga
Alien Domlnek, J.
Munk,
Ohio State University,
EtectroSctence Lab, Columbus, Ohio, J. Cusick, NASA
Lewis Research Carter, Cleveland, Ohio
A Tkne
Domain Analysis of a Calibration Error Model
O.M. CaidweJI, J.D. Huff, Scientific Atlanta, Atlanta, Ga
High-Speed, Error Corrected, Vector S-Parameter
Measurements
Dirk
li.
Hoekstra,
Ferretee,
Fremont,
CA,
Allen
E.
Rosenzwełg,
Microwave
Technology
Inc., Fremont,
CA
Extending the Dynamic Range of Scalar Network Ana¬
lyzer Measurements
Andrzej W. Kraszewski,
Stuart
O. Nelson,
U.S.
Dept.
of AgriciAure, Athens, Ga
Sorting Biological Objects with Mforowave Resonant
Cavities
SESSION 2A
-
Analog/Digital Conversions
(10:30
am-noon)
Chairman
-
Gabriele
D Antona,
Alessandro Gandelli, Politecnico
di Milano, Milano,
Italy
Expert System Performing Automatic Testing in Digital
Oscilloscopes
Konrad
Hejn,
Warsaw University of Technology, War¬
saw, Poland, Dick Morling, Polytechnic of Central
London, London, England
A Semifixed-Frequency Method For Evaluating the
Effective Resolution ofA/D Converters
Konrad
Hejn,
Warsaw University of Technology, War¬
saw, Poland, Izzet Kale, Polytechnic of Central Lon¬
don, London, England
Some Theorems on Walsh Transforms of Quantizer
Differential and Integral Non-Linearity
Minoru Kohata,
Tasuku Takagi, Tohoku University,
Sendai, Japan
A New Frequency Control Method in Oscillator and its
Application to Sensor
Makoto
Imamura,
Naoya Kusayanagi, Akira Toyama,
Toru
Choi, Yokogawa Electric Corp., Tokyo, Japan
A 100-MSPS 10-bit Analog-to-Digital Converter Chip
Set
SESSION 2B
-
Conductive Polymers
(10:30
am-noon)
Chairman
--
Ronald L. Elsenbaumer, Allied-Signal,
Inc., Morristown, NJ
L.W. Shacklette, N.F. Colaneri, Allied-Signal, Inc.,
Morristown, NJ
EMI Shielding Measurements of Conductive Polymer
Blends
Z.H.
Wang, H.H.S. Javadi, A.J. Epstein, Ohio State
University, Columbus, Ohio
Application of Microwave Cavity Perturbation
Techniques in Conducting Polymers
Ajay
Nahatá,
Chengjiu Wu, James T. Yardley, Allied-
Signal, Inc., Morristown, NJ
An Electro-Optic Measurement Apparatus for Organic
Media
SESSION 2C ~ Microwave Instrumentation I
(10:30
am-noon)
Chairman
-
Marc G. Cote, Rome Air Laboratory, Hanscom, AFB,
Mass
Automated Swept-Angle Bistatic Scattering Measure¬
ments Using Continuous Wave Radar
Vili
R.B. Dybdal,
Т.Т.
Mori, A.M.
Castañeda,
The Aero¬
space Corp,
El Segundo,
Calif
A Low Cost HPM Receiver
Donald W. Griffin, University of Adelaide, Australia
A New Instrument and Technique for Diagnosing Elec¬
tromagnetic Design Problems in Microwave Module
Housing and Component Packages
Deng Shaofan, Wu Qun, Harbin Institute of Technolo¬
gy, Harbin China
A Novel Microwave Instrument for Measuring
Multi-Phase Saturations in Cores
SESSION
3 -
Plenary Session
(1-2:30
pm)
Welcome to
IMTC/ÊH
-
Conference Chairman A. Ray
Howland, The Howland Company, Inc., Atlanta, Ga
Presentation
-
Michael S.P. Lucas, Kansas State
University, Manhattan, Kan, President of the IEEE In¬
strumentation and Measurement Society
Algie
Lance Keynote Presentation
--
High Tech
Weapons Systems and Warfare
Lt. Col. Richard
Hochberg,
U.S.
Dept.
of Defense,
Washington DC; Bruce Malm,
Sandia
National Labora¬
tories, Albuquerque, NM
This session features a technical examination of the
effectiveness of offensive missile capabilities and the
necessity for missile defense systems, with lessons
learned from the Gulf war.
SESSION 4A
-
Process Control
(3-5
pm)
Chairman
-
J.E. Amadi-Echendu, Hengjun Zhu, University of
Sussex, Brighton, England
On Monitoring the Condition of Turbine Flowmeters
C.
Vermeulen,
Gerhard P. Hancke, University of
Pretoria, Pretoria, South Africa
The On-Line Measurement of the Water Content of
Coat on a Conveyor
Bett:
George Vachtsevanos, Georgia Institute of Technolo¬
gy, Atlanta, Ga
Fuzzy Logic Control Applications in
Textile
Manufactur¬
ing
SESSION 4B
-
Laser Optics
(3-5
pm)
Chairman ~
K. Ikezaws, K.
łsozakl,
E.
Oglta,
T.
Ueda, Yokogawa
Electric Corp, Tokyo, Japan
Measurement of Absolute Distance Employing a Tun-
аШ
GW Dye Laser
Shigenobu Shinohara, Hirofumi Yoshida, Hiroaki
ikeda, Ken-ichi Nishide, Tokyo Aircraft Instrument Co,
Komae, Japan, Masao
Sumi,
Chiba
Institute of Tech¬
nology, Narashino, Japan
Compact and High-Precision Range Finder with Wide
Dynamic Range Using One Sensor Head
Yasuyuki Suzuki, Naomichi Chida, Makoto Komi-
yama, Yokogawa Electric Corp, Tokyo, Japan
A Calorimeter for uW Level Optical Power Transfer
Standard
Masanari Taniguchi, Meijo University, Nagoya, Japan,
Masato
Oki,
Ashikaga Institute of
Technology, Ashi-
kaga, Japan, Tasuku Takagi, Tohoku University, Sen-
dai, Japan
Basic Study on Possiblity for Application of Optical
Fiber to the
Interferometry
SESSION 4C
-
Microwave Instrumentation II
(3-5
pm)
Chairman
-
Leopoldine Kaliouby,
Renato
G. Bosisio,
Philippe
Ailard,
Ecole Polytechnique
of Montreal, Canada
Precise Design of Multilayer Circuit Using Spectral
Domain and Finite Differences Techniques
Pei-hwa
Lo,
Allied-Signal Aerospace, Teterboro, NJ
An Innovative Swept Frequency Measurement Method
Using Counting and Digital Signal Processing Tech¬
niques
Tom Newman, Univ. of Virginia, Charlottesville, Kwong
T. Ng, New Mexico State Univ.,
Las Cruces
Instrumentation and Measurements for a Submillimeter-
-Wave Planar Diode Mixer
Eric J. Vanzura, Janet E. Rogers, National Institute of
Standards and Technology, Boulder, Colo
Resonant Circuit Model Evaluation Using Reflected S-
Parameter Data
SESSION
5 -
Special Poster Forum
(5-7
pm)
Wojtek
J.
Bock, Mario Beaulieu,
Andrzej W.
Doman-
ski,
University
du
Quebec a Hull, Hull, Canada
GaAs-Based Fiber Optic Pressure Sensor
G. Boelfa, G.
Marnilo
Reedtz, I.E.N. Galileo Ferraris,
Torino, Italy
A Room Temperature Set-Up to Compare the Quan¬
tized Hall Resistance with
ΙΩ
Standards
A, Boscoio,
Zeitron: Zanussi
Institute for Research,
Udine,
Italy, C. Mangiavacchi, University of Trieste,
Trieste, Italy, F. Drius,
LASA
Laboratory, Trieste, Italy
AñMicial
Intelligence Tools in Complex Monitoring Sys¬
tems
DC
Franco
Castelli,
Polytechnic of
Milano, Milano,
Italy
Both Active and Reactive Power and Energy Transfer
Standard
B. DJoklc, University of Belgrade,
Belgradem
Yugosla¬
via, P. Bosnjakovlc,
Mihajlo Pupin
Institute, Belgrade,
Yugoslavia, M. Bergovic, Georgia Institute of Technol¬
ogy, Atlanta, Ga
New Method for Reactive Power and Energy Meas-
aurement
Fadhel M. Ghaannouchi,
Renato
G. Boslsio, Ecole
Polytechnique de
Montreal, Montreal, Canada
A Six-Port Relectometerwith a Variable Test Port Im¬
pedance Suitable for Non-Linear Microwave Device
Characterization
Nobuml Hagiwara, Yoshlhisa Suzuki, Hideaki
Murase,
National Defense Academy, Yokosuka, Japan
A Method of improving the Resolution and Accuracy of
Rotary Encoders Using the Code Compensation Tech¬
nique
Jagannathan Kanniah, Sudhir Jhajhara, Singapore
Polytechnic, Wong
Так
Wing, Pipetronics Inc., Canada
Novei
Detector and Difference Clock Circuits for Gen¬
erator Frequency Error Monitors
Haiqing Li, Zequi Zhou, Chiying Hu, Zhejiang Univer¬
sity, Hangzhou, China
Measurement and Evaluation of Two-Phase Flow Pa¬
rameters
D.
Marioli, E.
Sardini, A. Taroni,
Universita
di
Brescia,
Brescia, Italy, C.
Nard
uzzi,
С.
Offelli,
D.
Petri,
Univer¬
sita
di Padova, Padova
Italy
Digital
Time of Flight Measurement for Ultrasonic Sen¬
sors
Roman
Z. Morawski,
Louis
Lem
ire,
Mohamed
Ben
Slima,
Andrez Barwicz,
Universite du
Quebec
a Trois-
RMeres, Trois-Rivieres, Canada
The Use of
Spßnes
for Static Calibration of Electronic
Measuring Systems
-
A Comparative Study
Andrzej Muciek,
Technical University of Wroclaw,
Wroclaw, Poland
On Idenfficatfon of Dimensional Function of Many
Variables
Hiroshl
Nakane,
Tuneo Watanabe,
Science University
of Tokyo, Japan, Chohjyu
Negata,
Satoshi Fujiwara,
ShuJI Yoshlzawa, Dowa Mining Corp., Tokyo, Japan
Measuring the Temperature Dependence of Resistivity
of High Putty Copper Using a Solenoid Coil (SRPM
method)
Claudio Narduzzi, Università di Padova, Padova,
Italy
Digital
Time of Flight Measurement for Ultrasonic Sen¬
sors
Carlo Offelli, D.
Petri,
Universita
di Padova,
Italy
Effect of Noise on Real-Time Parameter Estimation on
Multifrequency Signals
H.G. Rotithor, Worcester Polytechnic Inst., Mass
Embedded Instrumentation for Evaluating Task Sharing
Performance in a Distributed Computing System
Thomas R. Scott, National Institute of Standards and
Technology, Boulder, Colo
Megawatt Laser Calorimeter Design
Otis M. Solomon,
Sandia
National Laboratories, Albu¬
querque, NM
Tests for FFT Algorithms
J.F. Villemazet, M. Chatard-Moulin, P. Guillon, H.
Jallageas, University
de
Limoges, Limoges, France
Nondestructive Complex Permittivity Measurements of
Absorbing Materials
S.P. Yeo, W.L. Wong, Nat! University of Singapore
Using the Symmertrical Six-Port Waveguide Junction
as a Six-Port Reflectometer
Wednesday, May
15, 1991
SESSION 6A
-
Waveform
(8:30-10
am)
Chairman
--
J.M. Googe,
P.D.
Ewing, R.A. Hess, Oak Ridge Na¬
tional Laboratory, Oak Ridge,
Tenn
Parameter Correlation of Impulse Shapes Using Two-
Pod Synthesis
Alessandro Ferrerò,
University of Catania, Italy, Ro¬
berto Ottoboni,
Politecnico di Milano,
Italy
A Low Cost Frequency
МиШрІіег
for Synchronous
Sampling of Periodic Signals
Akiharu Machida, Masayuki Hasegawa,
Izumi Koga,
Yokogawa Electric Corp., Tokyo, Japan
Arbitrary Waveform Generator
SESSION 6B
-
System Identification I
(8:30-10
am)
Chairman
-
Michael S.P. Lucas, Kansas State Univer¬
sity, Manhattan, Kan
A. van den Bos, Delft University of Technology, Delft,
The Netherlands
Measurement
-
The Parametric Approach
Patrick
Guillaume,
Rik Pintelon,
Johan Schoukens,
Vrije Universiteit Brussel, Brussels,
Belgium
Parametric
Identification
of Two-Port Models in
the
Frequency Domain
A. Bernieri,
University of
Cassino,
Dept.
of Industrial
Engineering
Measurement Problems Arising From the Use of a
Recursive Algorithm for Model Identification of Electri¬
cal Systems
SESSION 6C
-
Farfield Performance and Wavefield
Projection from Nearfield Measurements
(8:30-10
am)
Chairman
-
A.L. Van
Buren, Naval
Research Labora¬
tory, Orlando,
Fla
Ronald C.
Wittmann, Carl F. Stubenrauch,
Andrew
G. Repjar, National Institute of Standards and Technol¬
ogy, Boulder, Colo
A Review of Near-Field Antenna Measurements at NIST
Ear! G. Williams, Naval Research Lab, Washington DC
Measurement and Projection of Acoustic Fields
Â.L.
Van
Buren,
Naval Research
Lab, Orlando, Fla
Nearfield Calibration Arrays for Acoustic Wavefield
Determination
Ronald C.
Wittmann,
Nati
Institute of Standards
&
Technology, Boulder, Colo
Probe-Corrected Sperhical Near-Field Scanning Theory
in Acoustics
SESSION 7A
--
instrumentation Techniques
і
(10:30
am-noon)
Chairman
-
Paul B. Criliy, University of Tennessee,
Knoxwille,
Tenn
T.C.
Chen, J.S. Chen, C.C. Tsai, Cheng
Kung
Univer¬
sity, Tainan, Taiwan, China
Measurement of Induction Motor Parameter Indentifi-
catmn
Paul I-Hai Lin, Edward
E. Messa!,
Indiana University-
Purdue University, Ft. Wayne,
Ind
Design of A Real-Time Rotor Inertia
Estimatton
System
for DC Motors with a Personal Computer
István
Novak, Design Automation, Inc., Lexington, MA
Coarse and Fine Search Methods to Identify and Mea¬
sure Noisy Sinusoidal Signals in a Spectrum-Monitor¬
ing System
Rodney B. Whitted, Paul B. Criliy, University of Ten¬
nessee, Knoxville,
Tenn
A Digital Signal Processing Chip for Iterative Deconvol-
ution Restoration Algorithms
SESSION 7B
--
System Identification II
(10:30
am-noon)
Chairman
-
Johan
Schoukens,
Vrije Universiteit
Brussel,
Brussels, Belgium
Martti Valisuo, Imatran
Voima Oy, Vantaa, Finland
Obtaining Simple Dynamic Models
Risto Suoranta,
Seppo Rantala, Technical Research
Center of Finland, Tampere, Finland
Using Multivariate
Autoregressive
Model to Reveal
Internal Dependencies in Multichannel Measurement
Data
G. Daubaris, S. Kausinis, A. Ragauskas, Kaunas
Technical University, Kaunas, Lithuania
Simultaneous Measurements of Dynamic Values Using
Transit Time Method
Mikhail Brikman, Riga Technical University, Latvia
The ¡dentifiability Concept in CAD of Measuring Equip¬
ment
Abdelhak
Bennia,
University
de Constantine, Constan¬
tine, Algeria,
Sedki Riad, Virginia
Polytechnic
Institute,
Blacksburg,
Va
Filtering Capabilities and Convergence of the Van-
Cittert Deconvolution Technique
SESSION 7C
··
Fields Applications
(10:30
am-noon)
Chairman
-
A. Lee Van
Buren,
Naval Research Labo¬
ratory, Orlando,
Fla
D.S.
Cordova, H.X. Nguyen, Allied-Signal, Inc., Peters¬
burg,
Va
A Review of Ultra High Modulus Polyethylene Fiber
Reinforced Composites for Underwater Acoustic and
Electromagnetic Window Applications
Joseph Acoraci, Steven Guarino, George Miller,
Allied-Signal,
Inc,
Baltimore, Md
Performance Measurement of an Electronically
Scanned Circular Phased Array Antenna by Monitoring
Total System Performance
Hideo
Saito,
Kouji Taniguchi, Masato Nakajima, Keio
University, Yokohama, Japan
Dynamic Imaging Method of
Tuve
Fluctuating Magnetic
Field Distribution Using CT Technique
Steven Tietsworth, Naval Oceans Systems Center,
San Diego, Calif
A New System for Measurement of Low Frequency
Radio Transmitting Antenna Parameters in Near Real
Time
xi
SESSION 8A -- Instrumentation
Techniques II
(1-3
pm)
Chairman
-
Syed Masud Mahmud, Devang
G.
Sheth, Harpreet
Singh, Wayne
State
University,
Detroit, Mich
Analysis of
a
Multiplex-Bus
System
Susumu Matsukura, Takao Asaka, Yoshinobu Sugi-
hara, Naoki Tonosaka, Yokogawa Electric Corp,
Tokyo, Japan
Fast Up-Date
Technique for
Digital Osciliiscope
Mart
Min, Thomas
Parve,
Ants
Ronk,
Tallinn Techni¬
cal
University,
Tallinn,
Estonia
Design
Concepts of
Instruments
for Vector Parameter
Identification
SESSION 8B
-
System Identification III
(1-3
pm)
Chairman
-
A. van
den Bos, Vrije Universiteit Brussel,
Brussels, Belgium
Ferene
Nagy,
Technical Univ. of Budapest, Hungary
Measurement of Signal Parameters by Using Nonlinear
Observers
Johan
Schoukens, R, Pintelon, H. Van Hamme,
Vrije
Universitie
Brussel,
Brussels, Belgium
The Interpolated Fast Fourier Transform: a Compara¬
tive Study
istvan
Kollar,
Technical Univ. of Budapest, Hungary
Signal Enhancement Using Non-Synchronized Mea¬
surements
M. Bertocco, C. Narduzzi, C. Offefli, D.
Petri,
Univer¬
sita
di Padova, Padova,
Italy
An improved Method for Iterative Identification of
Bandlimited Linear Systems
SESSION 8C
-
Magnetics and Magneto-Optics I
(1-3
pm)
Chairmen
- Т.Е. Karts, IBM,
San Jose, Calif., M.S.
Jhon, Carnegie Melton University, Pittsburgh, Pa
T.M. Kwon, M.S. Jhon, Carnegie Melton University,
Pittsburgh, Pa
A Device for Measuring Concentration and Dispersbn
Quality of Rod and Plate-Like Magnetic Particle Sus¬
pensions
M.Ł
Shah,
Т.Е. Karls,
G.M.
Cuka, IBM, San
Jose, CA
Control of Paniculate Magnetic Coating Properties
Using Dispersion Quality Measurement
X. He, C. Alexander, Jr., M.R. Parker, University of
Alabama,
luscałoosa, Ala
Interaction Field Measurements in the Evaluation of
Particufate Media
Stephan
Howe, Hewlett-Packard Co, Boise, Ida
Experimental Determination of Stress in Magnetic Re¬
cording Thin Film Disks
Thursday. May
16, 1991
SESSION 9A
-
Sensors/Transducers
(8:30-10
am)
Chairman
-
Franco
Castelli,
Polytechnic of
Milano, Milano,
Italy
New
Capacitive
Linear and Rotary Displacement Trans¬
ducers Having High Both Linearity and Sensitivity
Robert Ting, U.S. Naval Research Lab, Orlando,
Fla
A Review on the Development of Piezoelectric Com¬
posites for Underwater Acoustic Transducer Applica¬
tions
Wojtek
J.
Bock,
R.
Wisinłewski, T.R.
Wolinski,
Uni¬
versity of Quebec at Hull, Hull, Canada
Fiber-Optic Strain Gauge Manometer Up to
100
M
Pa
SESSION 9B
«
System Identification IV
(8:30-10
am)
Chairman
-
Istvan Koilar, Technical University of
Budapest, Budapest, Hungary
Andrzej
Hachol,
Henryk
M.
Juniewicz,
Zbigniew
M.
Kedryna, Wroclaw Technical University, Poland
Metrological Aspects of the Multiparameter Measure¬
ment Processing Function Identification
Giovanni
Martines,
Mario Sannino,
Universita
di
Palermo, Palermo, Italy
An automated Measuring System for the Simultaneous
Determination of Noise, Gain and Scattering Parame¬
ters of HEMTs
James A. Kuiubi,
Moi
University, Eldoret, Kenya, Leo
P. Van
Biesen,
Vrije Universiteit,
Brussels, Belgium
Development of a Rule Based Expert System for Multi¬
channel Spectral Estimation
M.R. Azimi-Sadjadi, S. Sheedvash, Colorado State
University, Fort Collins, Colo,
D.E.
Poole, K.D. Sher-
bondy, Befvoir RD&E Center,
Fort Belvoir, Va
Detection and Classification of Buried Dielectric Anom¬
alies Using a Separated Aperture Sensor and a Neural
Network Discriminator
SESSION 9C
-
Magnetics and Magneto-Optics II
(8:30-10
am)
Chairman
- Т.Е.
Karis, IBM, San Jose, Calif, M.S.
Jhon, Carnegie Mellon University, Pittsburgh, Pa
W.C. Leung, H. Rosen, T. Strand, IBM, San Jose,
Calif
Surface Roughness Characterization of Thin Film Disks
Using Integrating Sphere Analyzer
xn
R.M. Pisipati, Mobay Corporation,
Pittsburgh,
Pa, H.
Schmid,
G.
Kampf, Bayer
AF, Uerdingen,
Germany
Optimization of the Birefringence Properties of Injection
Modled Substrates for MO Media
Antonio
Ü.
Méndez,
Patricia Bergthold, University of
Southern California, Los Angeles, Calif
Identifying the Effects of Extinction Ratio and Substrate
Birefringence on Magneto-Optic Kerr Effect Measure¬
ments
James Wong, Leonard
Fortunati,
Benny Hong, Alan
Kluska,
Linda
Nebenzahl, Mark
Mercado, Yolanda
Rodriguez, Yu-Sze Yen, IBM, San Jose, Calif
Testing of Commercial Optical Media
SESSION 10A
-
Sensors/Transducers II
(10:30
am-noon)
Chairman
-
John
С
Fidler,
James P.
Bobis,
Northern Illinois
University,
DeKalb,
III, William R. Penrose, Transducer
Research
Inc, Naperville,
111
A Potentiost Based on a Voltage-Controlled Current
Source for Use with Amperometric Gas Sensors
Sen-Jung Wei, Hung Chang Lin, University of Mary¬
land, College Park, Md
CMOS Chopper Amplifier for Chemical Sensor
EM. Petriu, M.A. Greenspan, University of Ottawa,
Ottawa, Canada, W.S. McMath, S.K. Yeung, Canadian
Space Agency, Ottawa, Canada
Active Tactile Perception of
30
Surface Geometric
Profiles
Mitsuhiro Yamada,
Kenzo Watanabe,
Shizuoka
Uni¬
versity, Hamamatsu, Japan, Takashl Takebayashl,
Shun-ichi Notoyama, SMC Corporation,
Soka,
Japan
A Switched-Capacitor Interface for
Capac áb/e
Pressure
Sensors
SESSION
1
0B
-
Software
Chairman
-
Edoardo Carminati, Politecnico di Milano, Milano,
Italy
Adaptive
Software
for Wattmeters Calibration
Alessandro Gandelli, Vincenzo Piurl, Pilitecnico di
Milano, Milano,
Italy
A User-Friendly
Measurement
System: Design and
implementation of a Flexible High-Level
Interface
for a
РагаМ
Architecture
Zoltán
Papp,
Delft University of Technology, Delft, The
Netherlands
A Framework for Cooperative Numeric and Symbolic
Signat
Processing in Real-Time
Fabrizio
Russo,
Paolo
Russo,
Sandro
Broili,
Univer¬
sita
di Trieste, Trieste,
Italy
A
Graphical Prototyping
System
for Computer-Aided
Development of Expert Instrumentation Software
SESSION 10C
--
Materials Characterization
1
(agricul¬
tural)
(10:30
am-noon)
Chairman
-
Devendrá
K. Misra,
University of Wisconsin, Milwau¬
kee, Wise
Electrical Characterization of the Materials by a Short
Electric Probe
H.B.
Sequeira, D.
Nagle,
G. G
r
off,
M.
Zimmerman,
Martin
Marietta
Laboratories, Baltimore,
Md
High Temperature Measurement of Elements of Ce¬
ramics
R.J. King, K.V. King, KDC Technology Corp, Liver-
more, Calif
Microwave Moisture Measurement of Grains
SESSION
11
A
--
Computational Methods I
(1:30-3
pm)
Chairman
-
James A. Starzyk, Ohio University, Athens, Ohio,
Hong Dai, Lafayette College, Easton, Pa
Automated Testing Using Circuit Decomposition
Hugo
Calleja
Gjumlich, Jorge
Lem
us Armas,
Instituto
de Investigaciones Eléctricas, Cuernavaca,
Mexico
Digital Power
Measurement wkh Non-Simultaneous
Sample Pairs
Jonathan W.
Lee, Sandia National Laboratories,
Albu¬
querque,
NM
Signal Parameter Algorithms for Trend Analysis of
Digital Data Acquisition Systems
Bruce E. Stuckman, CD. Perttunen, J.S. Usher, B.A.
McLaughlin, University of Louisville, Louisville, Ky
Stochastic Modeling of Calibration Drift in Electrical
Meters
SESSION 11B
-
Biomedicai
(1:30-3
pm)
Chairman
-
John R. LaCourse, University of New Hampshire,
Durham, NH
Measuring Functional Mobility
Gerard T. Jankauskas, GTE Government Systems
Corp, Needham, Mass, John R. LaCourse, David E.
Limbert, University of New Hampshire, Durham, NH
Optimization and Analysis of
a Capacitive
Contactless
Angular Transducer
XIII
Yansheng Xu,
Beijing
Institute of Radio Measurements,
Beijing, China
On the Measurement of Microwave Permittivity of Bio¬
logical Samples Using Needle Type Coaxial Probes
O.C. Deale, B.B. Lerman, Cornell University Medical
College, New York, NY, S.
Gao, K.T.
Ng, New Mexico
State University,
Las Cruces, NM
Measurement of Cardiac Electric Field and Current
Density During Defibrillation
Hisao Oka, Takashi trie, Yong Hao Sun, Tatsuma
Yamamoto, Okayama University, Okayama, Japan
Portable System for Measuring
Biomechanica/
Proper¬
ties
SESSION 11C
--
Materials Characterization II (d¡electri¬
cal)
1:30-3
pm)
Chairman
-
Arthur J.
Estin, CyberLink
Corp, Boulder,
Colo
Brad Anders, Intel Corp, Santa Clara, Calif
С
-V
Advisor Knowledge Base (CVA-KB): A High Fre¬
quency
С
-V
Plot Analysis Tool
William A. Davis, C.F. Bunting, S.E.
Bucea,
Virginia
Polytechnic Institute,
Blacksburg,
Va
Measurement and Analysis for
Stripline
Material Param¬
eters Using Network Analyzers
Arthur J.
Estin,
CyberLink Corp, Boulder, Colo, Mi¬
chael D. Janezic, National Institute of Standards and
Technology, Boulder, Colo
improvements in Dielectric Measurements with a Reso¬
nant Cavity
Michael D. Janezic, John H. Grosvenor, National
Institute of Standards and Technology, Boulder, Colo
improved Technique for Measuring Permittivity of Thin
Dielectrics with a Cylindrbal Resonant Cavity
R, Salettl,
Metodi
e Dispositivi
per
Radiotrasmissioni,
Ptea,
Haly, B,
Neri,
Universita
di Pisa, Pisą
Italy
Low Noise Automated Measurement System for Low
Frequency
Curren
Fluctuations in Thin-Oxide Silicon
Structures
SESSION 12A
--
Computational Methods
(3:30-5
pm)
Chairman-
Andrzej
Barwìcz,
Roman
Z. Morawski,
Louis Lemire,
Unwersite
du
Quebec a Trois-Rwieres, Canada, Wotjek
J. Bock, University of Quebec at Hull, Canada
Calibration of an Electronic
МиЛ/ѕепѕог
System for
Measuring High Pressures
Girgis A. Girgis
-
University of Nebraska, Omaha
Reactive Power Calculations Using Quadratic Phase
Coupling Estimation
C. Andria,
M. Savino, A. Trotta,
University of
Bari,
Bari,
Italy
Optimized Windows for Fir Filter Design to Perform
Maximally Flat Decimation Stages in Signal Condition¬
ing
M.J.
Piovoso, K.A.
Kosanovich, J.P. Yuk, E.I.
Du
Pont de
Nemours
&
Company, Newark, Del
Process Data Chemometrics
SESSION 12B
-
New Developments
(3:30-5
pm)
Chairman, J. Robert Ashley, Tampa,
Fla
Darren Sapashe, University of South Florida, Tampa,
Fla,
J.
Robert Ashley, Tampa,
Fla
Potential Errors in VDT Fringing Field Measurements
Yuji Yamaguchi, Nobuo Koyanagi, Kazuya, Yoko-
gawa Electric Corp., Tokyo, Japan
A High Resolution Time Measurement System
Hisao
Agawa,
Mitsuo Nagata, Muneki Araragi, Yoko-
gawa Electric Corp, Tokyo, Japan
A High Performance Optical Power Meter
SESSION 12C
-
Materials Characterization III
(dieléc¬
trica!)
(3:30-5
pm)
Chairman
--
Sedki M.
Riad,
Virginia Polytechnic Insti¬
tute,
Blacksburg,
Va
Claude
M.
Weil, William
A. Kissiek, National
Institute
of Standards and Technology, Boulder, Colo
The Electromagnetic Properties of Materials Program
at NIST
F.T. Uiaby, M.C.
Dobson,
University of Michigan, Ann
Arbor, Mich, D. Brunfeidt, Applied Microwave Corp,
Lawrence,
Kans
Microwave Probe for In Situ Observations of Vegeta¬
tion Dielectric
Stuart O. Nelson, U.S. Department of Agriculture,
Athens, Ga
Measurement and Use of Dielectric Properties of Agri¬
cultural Products
K.M.
Rdanboylu, S.M.
Riad,
A. Alshabini-Riad, Vir¬
ginia Polytechnic Institute,
Blacksburg,
Va
An Enhanced Time Domain Approach for Dielectric
Characterization Using
Stripline
Geometry
xiv
Author s Index
Author
Session
Page
Author
Session
Page
Acoraci, Joseph
7C
late
paper
Deale, O.C.
ÜB
551
Agawa,
Hisao
I2B
622
Dingmann, Dennis
1B
17
Alexander,
С
8C
late
paper
Djokic,
В.
5
175
Algereia,
Constantine
7B
319
Dobson,
M.C.
12C
631
Allard,
Philippe
4C
140
Domanski,
Andrzej
5
158
Amadi-Echendu, J.E.
4A
112
Dominek,
Allen
1С
22
Anders, Brad
IIC
564
Druis, F.
5
165
Andria,
С
12A
602
Dybdal, R.B.
2C
97
Araragi, Muneki
I2B
622
Elshabini-Riad, A.
12C
641
Armas, Jorge Lemus
HA
520
Epstein, A.J.
2B
79
Asaka, Takao
8A
341
Estin, Arthur
IIC
573
Ashley, Robert
I2B
614
Ewing, P.D.
6A
242
Azimi-Sadjadi, M.R.
9B
432
Farraris, Galileo
5
161
Barwicz,
Andrzej
I2A,
5
592, 202
Ferrerò, Alessandro
6A
247
Beaulieu, Mario
5
158
Fidanboylu, K.M.
I2C
641
Begovic, M.
5
175
Fidler, John
10A
456
Ben Slima,
Mohamed
5
202
Fortunati, Leonard
9C
444
Bennia,
Abdelhak
7B
319
Fujiwara, Satoshi
5
213
Bergthold, Patricia
9C
442
Gandelli,
Alessandro
10B, 2A
483, 46
Bernieri,
Α.
6B
late
paper
Gao,
S.
IIB
551
Bertocco,
M.
8B
368
Ghaannouchi, Fadhel
5
180
Bobis,
James
IOA
456
Girgis, Girgis
I2A
598
Bock,
Wojtek
9A,
5,
12A
414,158,592
Gjumlich, Hugo
Calleja
11A
520
Boella, G.
5
I6I
Googe, J.M.
6A
242
Bontncontro, A.
IIB
546
Grajera, James
IB
17
Boscolo, A.
5
165
Greenspan, M.A.
I0A
464
Bostsio, Renato
5,
11B, 4C
180, 546,140
Griffin, Donald
2C
101
Bosnjakovic, P.
5
175
Graff, G.
IOC
late paper
Brikman, Mikhail
7B
late
paper
Grosvenor, John
IIC
580
Broili,
Sandro
IOB
495
Guarino, Steven
7C
late paper
Brunfeldt,
D.
12C
631
Guillaume,
Patrick
6B
263
Bucea,
S.E.
IIC
568
Guillon, P.
5
232
Bunting,
C.F.
II
568
Hachol,
Andrzej
9B
420
Caldwell, O.M.
1С
27
Hagiwara, Nobumi
5
I83
Carminati, Edoardo
IOB
476
Hancke, Gerhard
4A
1I7
Castañeda, A.M.
2C
97
Hasegawa, Masayuki
6A
251
Castelli, Franco
5,
9A
170,406
Haworth, David
1B
late paper
Chatard-Moulin, M.
5
232
He,
X.
8C
late paper
Chen, J.S.
7A
288
Hejn, Konrád
2A
51,55
Chen,
T.C.
7A
288
Hess, R.A
6A
242
Chida, Naomiehi
4B
131
Hoekstra,
Dirk
1С
35
Choi,
Toru
2A
68
Hong,
Benny
9C
444
Colaneri,
N.F.
2B
72
Howe,
Stephan
8C
398
Cordova,
D.S.
7C
late
paper
Hu, Chiying
5
I85
Cote,
Marc
2C
88
Huff, J.D.
1С
27
Crilìy, Paul
7A
304
Ikeda, Hiroaki
4B
126
Ćuka,
G.M.
8C
391
Ikezawa, K.
4B
122
Cusick,
J.
1С
22
Imamura, Makoto
2A
68
D Antona,
Gabriele
2A
46
Irie, Takashi
IIB
556
Dai, HOng
IIA
514
Isozaki, K.
4B
122
Daubaris, G.
7B
late
paper
Jallageas, H.
5
232
Davis.
William
ІЮ
568
Janezic, Michael
IIC
573, 580
Author
Session Page
Author
Session Page
Jankauskas, Gerard
HB
541
Morawski,
Roman
I2A,
5
592, 202
Javadi, H.H.S.
2В
79
Mori,
Т.Т.
2C
97
Jhajhara, Sudhir
5
І92
Morling, Dick
2A
51
Jhon, M.S.
ас
374
Muciek, Andrezej
5
209
Juniewicz,
Henryk
9В
420
Munk, J.
1С
22
Kale,
Isset
2А
55
Murase, Hideaki
5
I83
Kaiiouby, Leopoldine
4С
140
Nagata, Chohjyu
5
213
Kampf,
G.
9С
448
Nagata, Mitsuo
I2B
622
Kanniah, Jagannathan
5
І92
Nagle, D.
IOC
late paper
Karis,
Т.Е.
8С
391
Nagy, Ferene
8B
354
Kataano, Kazuya
12В
618
Nahatá, Ajay
2B
83
Kausinis, S.
7В
late paper
Nakajima, Masato
7C
326
Kedryna,
Zbigniew
9В
420
Nakane,
Hiroshi
5
213
King, K.V.
ЮС
506
Narduzzi,
С
8B,
5
368, 198
King, R.J.
ЮС
506
Nebenzahl, Linda
9C
444
Kissiek,
William
І2С
626
Nelson, Stuart
I2C,
1С
636, 40
Kluska,
Alan
9С
444
Neri,
В.
IIC
585
Koga, Izumi
6А
251
Newman, Tom
4C
147
Kohata, Minoru
2А
62
Ng,
KT.
11B
551
Kollar,
István
8В
365
Ng, Kwong
4C
147
Komiyarna, Makoto
4В
131
Nguyen, H.X.
7C
late paper
Kosanovich, K.A.
12А
608
Nishide, Ken-ichi
4B
126
Koyanagi, Nobuo
І2В
618
Notoyama, Shun-ichi
I0A
468
Kraszewski, Andrezej
1С
40
Novak, István
7A
297
Kulubi, James
9В
425
Offelli,
С.
5,
8B
I98,
368
Kusayanagi, Naoya
2А
68
Ogita, E.
4B
122
Kwon, T.M.
8С
374
Oka, Hisao
IIB
556
LaCourse, John
ІІВ
538, 541
Oki,
Masato
4B
135
Lee,
Jonathan
11А
525
Ottoboni,
Roberto
6A
247
Lemire,
Louts
5,
12А
202, 592
Papp,
Zoltán
I0B
489
Lerman, B.B.
ІІВ
551
Parker, M.R.
8C
late paper
Leung,
W.C.
9С
late paper
Parve,
Thomas
8A
347
Levy, Malcolm
1В
8
Pedone,
F.
IIB
546
Li, Haiqing
5
I85
Penrose, William
I0A
456
Limbert, David
«В
541
Perttunen, CD.
ИА
530
Lin, Hung Chang
10А
460
Petri, D.
5,
8B
198,217,368
Lin, Pauł
I-Hai
7А
292
PetruL
E.M.
I0A
464
Lo,
Pei-wa
4С
144
Pintelon, Rik
6B, 8B
263, 358
Lyons, Douglas
1В
17
Piovoso,
M.J.
12A
608
Machida, Akiharu
6А
251
Pisipati, R.M.
9C
448
Mahrftud, Syed Masud
8А
336
Piuri,
Vincenzo
І0В
483
Mangiavaccr»,
С.
5
165
Poote,
D.E.
9B
432
Marioli, D.
5
I98
Gun, Wu
2C
105
Marknä,
Θ.
ІІВ
546
Ragauskas, A.
7B
late paper
Martines,
Giovanni
9В
late paper
Rantala, Seppo
IA, 7B
2,315
Matsukura, Susumu
8А
341
Reedtz, G. MaruHo
5
161
McLaughfti»
BA
11А
530
Repjar,
Andrew
6C
274
McMath, W.S.
ЮА
464
Riad, Sedki M.
7B, 12C
319, 641
Méndez, Antonio
9С
442
Rodriquez,
Yolanda
9C
444
Mercado,
Mark
9С
444
Rogers,
Janet
4C
150
Messasi,
Edward
7А
292
Ronk,
Ants
8A
347
Mier,
George
7С
late paper
Rosen,
H,
9C
late paper
Mii,
Mart
8А
347
Rosenweig, Allen
1С
35
Misra,
Devendrá
ЮС
502
Rotithor, H.G.
5
222
XX
Author
Session Page
Author
Session Page
Russo,
Fabrizio
ΙΟΒ
495
Vermuelen, C.
4A
117
Russo,
Paolo
ΙΟΒ
495
Villemazet,
J.F.
5
232
Saito,
Hideo
7С
326
Wang,
Z.H.
2В
79
Salełti, R.
не
585
Watanabe, Kenzo
ІОА
468
Sannino,
Mario
9В
late paper
Watanabe,
Tuneo
5
213
Sapashe, Darren
12В
614
Wei, Sen-
J
ung
10А
460
Sardini,
E.
5
І98
Weil, Claude
І2С
626
Savino,
M.
І2А
602
Whitted,
Rodney
7А
304
Schmid,
H.
9С
448
Williams,
Earl
6С
275
Schoukens,
Johan
6В, 8В
263, 358
Wing, Wong
Так
5
І92
Scott,
Thomas
5
227
Wiśniewski, R.
9А
414
Sequeira,
H.B.
ЮС
late paper
Wittmann, Ronald
6С
274, 283
Shacklette,
L.
W.
2В
72
Wolinski, T.R.
9А
414
Shah, M.J.
8С
391
Wong,
James
9С
444
Shaofan, Deng
2С
I05
Wong, W.L
5
236
Sheedvash,
S.
9В
432
Wu, Chengjiu
2В
83
Sherbondy,
K. D.
9В
432
Xu, Yansheng
ІІВ
546
Sheth, Devang
8А
336
Yamada, Mitshuiro
ІОА
468
Shinohara, Shigenobu
4В
126
Yamaguci, Yuji
І2В
618
Shtrauss, Valris
ІА
late paper
Yamamoto, Tatsuma
ІІВ
556
Singh,
Harmohan
IB
ІЗ
Yardley, James
2В
83
Singh, Harpreet
8А
336
Yen, Yu-Sze
9С
444
Solomon, Otis
5
late paper
Yeo, S.P.
5
236
Starzyk, James
11А
514
Yeung, S.K.
ІОА
464
Strand,
T.
9С
late
paper
Yoshida, Hirofumi
4В
126
Stubenrauch, Carl
6С
274
Yoshizawa, Shuji
5
213
Stuckman, Bruce
ІІА
530
Yuk, J.P.
І2А
608
Sugihara, Yoshinobu
8А
341
Zhou, Zequi
5
І85
Sumi, Masao
4В
126
Zhu, Hengjun
4А
112
Sun, Yong Hao
ІІВ
556
Zimmerman,
M.
ЮС
late paper
Suoranta,
Risto
ІА
2
Suzuki, Yasuyuki
4В
131
Suzuki, Yoshihisa
5
I83
Takagi, Tasuku
2А, 4В
62, 135
Takebayashi, Takashi
ІОА
468
Tanigucht, Kouji
7С
326
Taniguchi, Masanari
4В
135
Taroni, A.
5
I98
Teitsworth, Steven
7С
330
Ting,
Robert
9А
410
Tonosaka, Naoki
8А
341
Toyama, Akira
2А
68
Trotta, A.
12А
602
Tsai, C.C.
7А
288
Ueda,
T.
4В
122
Ulaby, F.T.
І2С
631
Usher, J.S.
ІІА
530
Vachtsevanos, George
4А
late
paper
Valisuo,
Martti
7В
310
Van
Biesen,
Leo
9В
425
Van Buren, A.L.
6С
279
van den
Bos, A.
6В
259
Van hamme,
Η.
8В
358
Vanzura,
Eric
4С
150
XXI
|
| any_adam_object | 1 |
| author_corporate | Instrumentation and Measurement Technology Conference Atlanta, Ga |
| author_corporate_role | aut |
| author_facet | Instrumentation and Measurement Technology Conference Atlanta, Ga |
| author_sort | Instrumentation and Measurement Technology Conference Atlanta, Ga |
| building | Verbundindex |
| bvnumber | BV005924026 |
| callnumber-first | T - Technology |
| callnumber-label | T50 |
| callnumber-raw | T50 |
| callnumber-search | T50 |
| callnumber-sort | T 250 |
| callnumber-subject | T - General Technology |
| classification_rvk | ZQ 1900 |
| classification_tum | MSR 001f |
| ctrlnum | (OCoLC)24160151 (DE-599)BVBBV005924026 |
| discipline | Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01943nam a2200457 c 4500</leader><controlfield tag="001">BV005924026</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930114s1991 ad|| |||| 10||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0879425792</subfield><subfield code="9">0-87942-579-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0879425806</subfield><subfield code="9">0-87942-580-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0879425814</subfield><subfield code="9">0-87942-581-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)24160151</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005924026</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">T50</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 1900</subfield><subfield code="0">(DE-625)157997:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MSR 001f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Instrumentation and Measurement Technology Conference</subfield><subfield code="n">8</subfield><subfield code="d">1991</subfield><subfield code="c">Atlanta, Ga.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5058882-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Conference record</subfield><subfield code="b">May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia</subfield><subfield code="c">IEEE Instrumentation and Measurement Technology Conference</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Inst. of Electrical and Electronics Engineers</subfield><subfield code="c">1991</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXI, 647 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic measurements</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mensuration</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nachrichtentechnik</subfield><subfield code="0">(DE-588)4041066-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1991</subfield><subfield code="z">Atlanta Ga.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Nachrichtentechnik</subfield><subfield code="0">(DE-588)4041066-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung TU Muenchen</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003709676&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003709676</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1991 Atlanta Ga. gnd-content |
| genre_facet | Konferenzschrift 1991 Atlanta Ga. |
| id | DE-604.BV005924026 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:36:57Z |
| institution | BVB |
| institution_GND | (DE-588)5058882-5 |
| isbn | 0879425792 0879425806 0879425814 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003709676 |
| oclc_num | 24160151 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | XXI, 647 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | Instrumentation and Measurement Technology Conference 8 1991 Atlanta, Ga. Verfasser (DE-588)5058882-5 aut Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia IEEE Instrumentation and Measurement Technology Conference New York, NY Inst. of Electrical and Electronics Engineers 1991 XXI, 647 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Electronic measurements Congresses Mensuration Congresses Messtechnik (DE-588)4114575-6 gnd rswk-swf Nachrichtentechnik (DE-588)4041066-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Atlanta Ga. gnd-content Messtechnik (DE-588)4114575-6 s DE-604 Nachrichtentechnik (DE-588)4041066-3 s 1\p DE-604 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003709676&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia Electronic measurements Congresses Mensuration Congresses Messtechnik (DE-588)4114575-6 gnd Nachrichtentechnik (DE-588)4041066-3 gnd |
| subject_GND | (DE-588)4114575-6 (DE-588)4041066-3 (DE-588)1071861417 |
| title | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia |
| title_auth | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia |
| title_exact_search | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia |
| title_full | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia IEEE Instrumentation and Measurement Technology Conference |
| title_fullStr | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia IEEE Instrumentation and Measurement Technology Conference |
| title_full_unstemmed | Conference record May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia IEEE Instrumentation and Measurement Technology Conference |
| title_short | Conference record |
| title_sort | conference record may 14 16 1991 omni hotel at cnn center atlanta georgia |
| title_sub | May 14 - 16, 1991, Omni Hotel at CNN Center, Atlanta, Georgia |
| topic | Electronic measurements Congresses Mensuration Congresses Messtechnik (DE-588)4114575-6 gnd Nachrichtentechnik (DE-588)4041066-3 gnd |
| topic_facet | Electronic measurements Congresses Mensuration Congresses Messtechnik Nachrichtentechnik Konferenzschrift 1991 Atlanta Ga. |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003709676&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT instrumentationandmeasurementtechnologyconferenceatlantaga conferencerecordmay14161991omnihotelatcnncenteratlantageorgia |