Ion spectroscopies for surface analysis:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York [u.a.]
Plenum Press
1991
|
| Series: | Methods of surface characterization
2 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XVII, 469 S. Ill., graph. Darst. |
| ISBN: | 0306437929 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV005915012 | ||
| 003 | DE-604 | ||
| 005 | 20020627 | ||
| 007 | t | ||
| 008 | 930111s1991 ad|| |||| 00||| eng d | ||
| 020 | |a 0306437929 |9 0-306-43792-9 | ||
| 035 | |a (OCoLC)23868969 | ||
| 035 | |a (DE-599)BVBBV005915012 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-703 | ||
| 050 | 0 | |a QC176.8.S8 | |
| 082 | 0 | |a 541.3/3 |2 20 | |
| 084 | |a UP 9000 |0 (DE-625)146451: |2 rvk | ||
| 245 | 1 | 0 | |a Ion spectroscopies for surface analysis |c ed. by A. W. Czanderna ... |
| 264 | 1 | |a New York [u.a.] |b Plenum Press |c 1991 | |
| 300 | |a XVII, 469 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Methods of surface characterization |v 2 | |
| 650 | 4 | |a Secondary ion mass spectrometry | |
| 650 | 4 | |a Solids |x Surfaces |x Analysis | |
| 650 | 4 | |a Surface chemistry | |
| 650 | 0 | 7 | |a Oberflächenchemie |0 (DE-588)4126166-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ionenspektroskopie |0 (DE-588)4455365-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Ionenspektroskopie |0 (DE-588)4455365-1 |D s |
| 689 | 0 | 1 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Ionenspektroskopie |0 (DE-588)4455365-1 |D s |
| 689 | 1 | 1 | |a Oberflächenchemie |0 (DE-588)4126166-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Czanderna, Alvin W. |e Sonstige |4 oth | |
| 830 | 0 | |a Methods of surface characterization |v 2 |w (DE-604)BV000728018 |9 2 | |
| 856 | 4 | 2 | |m GBV Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003703839&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003703839 | ||
Record in the Search Index
| _version_ | 1804120105566601216 |
|---|---|
| adam_text | ION SPECTROSCOPIES FOR SURFACE ANALYSIS EDITED BY A. W. CZANDERNA SOLAR
ENERGY RESEARCH INSTITUTE GOLDEN, COLORADO AND DAVID M. HERCULES
UNIVERSITY OF PITTSBURGH PITTSBURGH, PENNSYLVANIA PLENUM PRESS * NEW
YORK AND LONDON CONTENTS 1. OVERVIEW OF ION SPECTROSCOPIES FOR SURFACE
COMPOSITIONAL ANALYSIS 1 A. W. CZANDERNA GLOSSARY OF ACRONYMS 1 1.
PURPOSES 3 2. INTRODUCTION 4 2.1. ROLE OF SURFACE ANALYSIS IN SURFACE
CHARACTERIZATION .. 4 2.1.1. SURFACE AREA 6 2.1.2. REAL AND CLEAN
SURFACES; SOLID FORMS 7 2.1.3. STRUCTURE AND TOPOGRAPHY 8 2.1.4. SURFACE
THERMODYNAMICS, EQUILIBRIUM SHAPE, AND DIFFUSION 8 2.1.5. AMOUNT
ADSORBED AND NATURE OF ADSORBATE/ SOLID INTERACTIONS 9 2.1.6. SURFACE
COMPOSITION OR PURITY 10 2.2. SURFACE ATOM DENSITY AND ULTRAHIGH VACUUM
10 2.3. COMPOSITIONAL DEPTH PROFILING 11 2.3.1. SPUTTERING MECHANISM,
YIELD, AND RATE 13 2.3.2. INSTRUMENTATION 15 2.3.3. DATA OBTAINED AND
TYPICAL RESULTS 16 3. OVERVIEW OF COMPOSITIONAL SURFACE ANALYSIS BY ION
SPEC- TROSCOPIES 18 3.1. EFFECTS OF ENERGETIC ION IMPACT ON SURFACES 18
3.2. STIMULATION AND DETECTION IN ION SPECTROSCOPIES 19 4. ION
SPECTROSCOPIES USING ION STIMULATION 20 4.1. ION DETECTION: SIMS, ISS,
RBS, NRA, HFS 22 4.1.1. SECONDARY ION MASS SPECTROMETRY (SIMS) 22 4.1.2.
ION SCATTERING SPECTROMETRY (ISS) 25 XI TU CONTENTS 4.1.3. RUTHERFORD
BACKSCATTERING SPECTROMETRY (RBS), NUCLEAR REACTION ANALYSIS (NRA), AND
HYDRO- GEN FORWARD SCATTERING SPECTROMETRY (HFS) ... 27 4.1.4.
COMPARISIONS OF SIMS, SNMS, ISS, RBS, AES, AND XPS 29 4.2. PHOTON
DETECTION OF ION-INDUCED RADIATION 29 4.2.1. PARTICLE-INDUCED X-RAY
EMISSION (PIXE) 29 4.2.2. BOMBARDMENT-INDUCED LIGHT EMISSION (BLE).. 30
4.3. ELECTRON DETECTION; ION NEUTRALIZATION SPECTROSCOPY (INS) 32 4.4.
NEUTRAL (POSTIONIZED) DETECTION: SNMS, SALI, SARISA 34 5. ION
SPECTROSCOPIES USING ION DETECTION 35 5.1. ELECTRON STIMULATION: ESD,
ESDIAD, EPMA 35 5.1.1. ELECTRON STIMULATED DESORPTION (ESD) 35 5.1.2.
ELECTRON STIMULATED DESORPTION ION ANGULAR DISTRIBUTION (ESDIAD) 36 5.2.
PHOTON STIMULATION: LAMMA, LIMS 37 5.3. NEUTRAL STIMULATION: FAB-SIMS,
NSS 38 5.4. ELECTRIC FIELD STIMULATION: APFIM, FIMS 39 REFERENCES 40 2.
SURFACE STRUCTURE AND REACTION STUDIES BY ION-SOLID COUISIONS 45
NICHOLAS WINOGRAD AND BARBARA J. GARRISON 1. INTRODUCTION 45 2. THE
EXPERIMENTAL APPROACH 48 3. HOW TO VIEW THE PROCESS 55 3.1. TRANSPORT
THEORIES 57 3.2. MOLECULAR DYNAMICS CALCULATIONS 64 3.2.1. YIELDS 67
3.2.2. ENERGY AND ANGULAR DISTRIBUTIONS 69 3.2.3. CLUSTERS 71 3.2.4.
DAMAGE TO THE SUBSTRATE 76 3.3. INTERACTION POTENTIALS 78 3.3.1.
REPULSIVE PAIR POTENTIALS AND THE BCA 78 3.3.2. ATTRACTIVE PAIR
POTENTIALS 81 3.3.3. MANY-BODY POTENTIALS*METALS AND THE EM- BEDDED ATOM
METHOD 82 3.3.4. MANY-BODY POTENTIALS*SILICON AND COVALENT SOLIDS
....:.. 85 3.3.5. MANY-BODY POTENTIALS*REACTIONS ON SURFACES 89 CONTENTS
3.3.6. MANY-BODY POTENTIALS*MOLECULAR SOLIDS 89 3.3.7. THE FUTURE 90
4. ELECTRONIC EFFECTS 90 4.1. TUNNELING MODEL 93 4.2. BOND-BREAKING
MODEL 97 4.3. DEEXCITATION MODEL FOR SPUTTERED EXCITED NEUTRAL ATOMS 100
5. SURFACE CHARACTERIZATION WITH ION BOMBARDMENT 101 5.1. SURFACE
STRUCTURE STUDIES 102 5.1.1. TRAJECTORIES OF SUBSTRATE SPECIES 102
5.1.2. TRAJECTORIES OF OVERLAYER SPECIES 107 5.1.3. SHADOW-CONE ENHANCED
DESORPTION 116 5.2. MOLECULAR COMPOSITION STUDIES 120 5.2.1. INTACT
MOLECULAR EJECTION 121 5.2.2. MOLECULAR RECOMBINATION DURING EJECTION
.... 129 5.2.3. PROSPECTS FOR DETECTION OF DESORBED NEUTRAL MOLECULES
132 6. CONCLUSIONS AND PROSPECTS 132 REFERENCES 135 3. PARTICIE-INDUCED
DESORPTION LONIZATION TECHNIQUES FOR ORGANIC MASS SPECTROMETRY 143
KENNETH L. BUSCH 1. INTRODUCTION 143 1.1. LONIZATION OVERVIEW 145 1.1.1.
DESORPTION LONIZATION 145 1.1.2. NEBULIZATION LONIZATION 148 1.2.
HISTORIAL PERSPECTIVE 150 1.3. INSTRUMENTATION 154 1.3.1. SOURCE DESIGNS
155 1.3.2. MASS ANALYZERS 166 1.3.3. DETECTION OF IONS 172 2. SPECTRAL
EFFECTS OF PRIMARY BEAM PARAMETERS 174 2.1. OBSERVE OR REVERSE
IRRADIATION 174 2.2. ANGLE OF INCIDENCE OF PRIMARY BEAM 176 2.3. CHARGE
STATE DEPENDENCE 179 2.4. ENERGY DEPENDENCE 181 2.4.1. WAVELENGTH
DEPENDENCE IN LASER DESORPTION .. 181 2.4.2. PARTICLE MASS AND VELOCITY
DEPENDENCES 183 2.5. PRIMARY PARTICLE FLUX AND DOSE 186 3. PROPERTIES OF
SECONDARY IONS 189 XIV CONTENTS 3.1. ENERGY DISTRIBUTION 189 3.2.
ANGULAR DISTRIBUTION 192 3.3. TIME DISTRIBUTION 192 3.4. CHARGE
DISTRIBUTION 194 4. SAMPLE PREPARATION 196 4.1. NEAT SAMPLES 196 4.2.
MATRICES FOR SAMPLE PREPARATION 200 4.2.1. SOLID SAMPLE MATRICES 200
4.2.2. LIQUID SAMPLE MATRICES 202 4.3. DERIVATIZATION TECHNIQUES 211
4.3.1. CREATION OF PREFORMED IONS 211 4.3.2. ION MANAGEMENT 218 5.
SPECIAL TECHNIQUES 222 5.1. CHROMATOGRAPHIE INTERFACES 222 5.1.1.
DYNAMIC CHROMATOGRAPHY 222 5.1.2. STATIC CHROMATOGRAPHY 225 5.2. REAL
TIME ANALYSIS 235 5.2.1. SIMPLE KINETIC STUDIES , 235 5.2.2. CATALYZED
REACTIONS 236 5.3. HIGH-MASS ANALYSIS 238 5.3.1. SPECTRAL APPEARANCE 238
5.3.2. SPECTRAL INTERPRETATION 240 5.3.3. STRATEGIES FOR INCREASED MASS
RANGE 243 5.4. MASS SPECTROMETRY/MASS SPECTROMETRY 244 5.4.1. NOVEL ION
STRUCTURES 245 5.4.2. MIXTURE ANALYSIS 248 6. FUTURE PROSPECTS 250
REFERENCES 252 4. LASER RESONANT AND NONRESONANT PHOTOIONIZATION OF
SPUTTERED NEUTRAIS 273 CHRISTOPHER H. BECKER GLOSSARY OF SYMBOLS AND
ACRONYMS 273 1. INTRODUCTION 274 2. PHOTOIONIZATION 276 3. EXPERIMENTAL
DETAILS 282 3.1. LASERS 282 3.2. ION BEAM SYSTEMS AND MASS SPECTROMETERS
283 3.3. DETECTION ELECTRONICS 286 4. ARTIFACTS, QUANTITATION,
CAPABILITIES, AND LIMITATIONS 287 4.1. RESONANTLY ENHANCED MULTIPHOTON
LONIZATION (REMPI) 287 CONTENTS XV 4.1.1. INORGANIC ANALYSES 287 4.1.2.
ORGANIC ANALYSES 291 4.2. NONRESONANT MULTIPHOTON IONIZATION (NRMPI) 292
4.3. SINGLE-PHOTON IONIZATION (SPI) 296 5. APPLICATIONS 296 5.1. DEPTH
PROFILING OF BULK MATERIAL USING REMPI 296 5.2. MULTIELEMENT ANALYSIS BY
NRMPI 297 5.3. DEPTH PROFILING OF BULK MATERIAL USING NRMPI 298 5.4.
INTERFACE ANALYSIS WITH NRMPI 299 5.5. ANALYSIS OF ORGANIC COMPOUNDS
USING SPI AND ION BEAM DESORPTION 302 5.6. BULK POLYMER ANALYSIS USING
SPI AND ION BEAM DESORPTION 304 6. FUTURE DIRECTIONS 306 7. SUMMARY 307
REFERENCES 308 5. RUTHERFORD BACKSCATTERING AND NUCLEAR REACTION
ANALYSIS 311 L. C. FELDMAN 1. INTRODUCTION 311 2. PRINCIPLES OF THE
METHODS 312 2.1. RUTHERFORD BACKSCATTERING 312 2.1.1. IMPACT PARAMETERS
312 2.1.2. KINEMATICS 313 2.1.3. CROSS SECTIONS 315 2.1.4. SCATTERING
FROM THE BULK: STOPPING POWER 315 2.1.5. THE ENERGY SPECTRUM 318 2.2.
NUCLEAR REACTION ANALYSIS 319 2.2.1. KINEMATICS 319 2.2.2. CROSS SECTION
321 2.2.3. TABLES OF NUCLEAR REACTIONS 321 2.3. HYDROGEN DETECTION 323
2.3.1. FORWARD RECOIL SCATTERING 323 2.3.2. NUCLEAR REACTIONS 325 2.
APPARATUS 327 3.1. GENERAL SETUP 327 3.2. A UHV ION SCATTERING CHAMBER
329 3.3. CHARGED PARTICLE SPECTROMETERS 330 4. QUANTITATIVE ANALYSIS AND
SENSITIVITY 331 4.1. MASS RESOLUTION 331 4.2. DEPTH RESOLUTION 332 4.3.
QUANTITATIVE ANALYSIS 337 XVI CONTENTS 4.4. LATERAL RESOLUTION 341 4.5.
BEAM DAMAGE AND DESORPTION 341 5. ION SCATTERING AS A STRUCTURAL TOOL
342 5.1. SHADOWING 342 5.2. CHANNELING 344 5.3. THE SURFACE PEAK 345
5.4. DOUBLE ALIGNMENT AND TRANSMISSION 351 6. APPLICATIONS 354 7.
OUTSTANDING STRENGTHS OF RBS IN RELATION TO AES, XPS, AND SIMS 357
REFERENCES 358 6. ION SCATTERING SPECTROSCOPY 363 E. TAGLAUER 1.
INTRODUCTION 363 2. BASIC PRINCIPLES 364 2.1. PARAMETER RANGE 364 2.2.
BINARY COLLISIONS 365 2.2.1. ENERGY SPECTRUM 365 2.2.2. INTERACTION
POTENTIALS AND CROSS SECTIONS 371 2.3. MULTIPLE SCATTERING 375 2.4.
NEUTRALIZATION 377 3. EXPERIMENTAL TECHNIQUES 380 3.1. APPARATUS 386
3.2. SHADOW CONES AND BACKSCATTERING (ICISS) 386 3.3. DIRECT RECOIL
DETECTION 387 4. CALCULATIONS 389 4.1. GENERAL CONSIDERATONS 389 4.2.
NUMERICAL CODES 389 4.3. SHADOW CONES 391 4.4. HITTING PROBABILITY
MODEL 392 5. ANALYSIS OF SURFACE COMPOSITION 393 5.1. COMPOUNDS AND
ALLOYS 393 5.2. ADSORPTION LAYERS 394 5.3. CATALYSTS 395 5.4. SURFACE
ROUGHNESS 400 5.5. ISOTOPIC LABELING 400 6. STRUCTURE OF CRYSTALLINE
SURFACES 402 6.1. RECONSTRUCTED SURFACES, ICISS 402 6.2. ADSORPTION
LAYERS, RECOIL DETECTION 404 6.3. DEFECTS, THERMAL DISPLACEMENTS 406
REFERENCES 412 CONTENTS XVUE 7. COMPARISON OF SIMS, SNMS, ISS, RBS, AES,
AND XPS METHODS FOR SURFACE COMPOSITIONAL ANALYSIS 417 C. /. POWELL, D.
M. HERCULES, AND A. W. CZANDERNA 1. PURPOSE 417 2. INTRODUCTION 418 3.
COMPARISON CATEGORIES OR CRITERIA 418 3.1. INPUT/OUTPUT PARTICLES,
SAMPLE DAMAGE, MEASURED QUANTITY, PRINCIPAL INFORMATION OUTPUT, AND
SAMPLED DEPTH 418 3.2. DATA COLLECTION 421 3.3. FEATURES OF THE
ANALYTICAL METHODS 423 3.4. VERSATILITY, EASE OF USE, AND SUPPORTING
DATA 428 3.5. SPECIMEN AND VACUUM REQUIREMENTS 428 3.6. SUMMARY OF
ADVANTAGES AND LIMITATIONS 430 3.7. SELECTION OF A TECHNIQUE 433 4. THE
SURFACE ANALYSIS COMMUNITY 435 REFERENCES 436 APPENDIX 439 STANDARD
TERMINOLOGY RELATING TO SURFACE ANALYSIS 439 STANDARD PRACTICE FOR
APPROXIMATE DETERMINATION OF CURRENT DENSITY OF LARGE-DIAMETER ION BEAMS
FOR SPUTTER DEPTH PROFILING OF SOLID SURFACES 449 STANDARD GUIDE FOR
SPECIMEN HANDLING IN AUGER ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON
SPECTROSCOPY, AND SECON- DARY ION MASS SPECTROMETRY 451 STANDARD
PRACTICE FOR REPORTING SPUTTER DEPTH PROFILE DATA IN SECONDARY ION MASS
SPECTROMETRY (SIMS) 459 INDEX 463
|
| any_adam_object | 1 |
| building | Verbundindex |
| bvnumber | BV005915012 |
| callnumber-first | Q - Science |
| callnumber-label | QC176 |
| callnumber-raw | QC176.8.S8 |
| callnumber-search | QC176.8.S8 |
| callnumber-sort | QC 3176.8 S8 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 9000 |
| ctrlnum | (OCoLC)23868969 (DE-599)BVBBV005915012 |
| dewey-full | 541.3/3 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 541 - Physical chemistry |
| dewey-raw | 541.3/3 |
| dewey-search | 541.3/3 |
| dewey-sort | 3541.3 13 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01902nam a2200481 cb4500</leader><controlfield tag="001">BV005915012</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020627 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930111s1991 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0306437929</subfield><subfield code="9">0-306-43792-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)23868969</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005915012</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC176.8.S8</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">541.3/3</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9000</subfield><subfield code="0">(DE-625)146451:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Ion spectroscopies for surface analysis</subfield><subfield code="c">ed. by A. W. Czanderna ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Plenum Press</subfield><subfield code="c">1991</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 469 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Methods of surface characterization</subfield><subfield code="v">2</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Secondary ion mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solids</subfield><subfield code="x">Surfaces</subfield><subfield code="x">Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface chemistry</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenchemie</subfield><subfield code="0">(DE-588)4126166-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Ionenspektroskopie</subfield><subfield code="0">(DE-588)4455365-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Ionenspektroskopie</subfield><subfield code="0">(DE-588)4455365-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Ionenspektroskopie</subfield><subfield code="0">(DE-588)4455365-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Oberflächenchemie</subfield><subfield code="0">(DE-588)4126166-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Czanderna, Alvin W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Methods of surface characterization</subfield><subfield code="v">2</subfield><subfield code="w">(DE-604)BV000728018</subfield><subfield code="9">2</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">GBV Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003703839&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003703839</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV005915012 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:36:48Z |
| institution | BVB |
| isbn | 0306437929 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003703839 |
| oclc_num | 23868969 |
| open_access_boolean | |
| owner | DE-12 DE-703 |
| owner_facet | DE-12 DE-703 |
| physical | XVII, 469 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Plenum Press |
| record_format | marc |
| series | Methods of surface characterization |
| series2 | Methods of surface characterization |
| spelling | Ion spectroscopies for surface analysis ed. by A. W. Czanderna ... New York [u.a.] Plenum Press 1991 XVII, 469 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Methods of surface characterization 2 Secondary ion mass spectrometry Solids Surfaces Analysis Surface chemistry Oberflächenchemie (DE-588)4126166-5 gnd rswk-swf Ionenspektroskopie (DE-588)4455365-1 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Ionenspektroskopie (DE-588)4455365-1 s Festkörperoberfläche (DE-588)4127823-9 s DE-604 Oberflächenchemie (DE-588)4126166-5 s Czanderna, Alvin W. Sonstige oth Methods of surface characterization 2 (DE-604)BV000728018 2 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003703839&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Ion spectroscopies for surface analysis Methods of surface characterization Secondary ion mass spectrometry Solids Surfaces Analysis Surface chemistry Oberflächenchemie (DE-588)4126166-5 gnd Ionenspektroskopie (DE-588)4455365-1 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
| subject_GND | (DE-588)4126166-5 (DE-588)4455365-1 (DE-588)4127823-9 (DE-588)4143413-4 |
| title | Ion spectroscopies for surface analysis |
| title_auth | Ion spectroscopies for surface analysis |
| title_exact_search | Ion spectroscopies for surface analysis |
| title_full | Ion spectroscopies for surface analysis ed. by A. W. Czanderna ... |
| title_fullStr | Ion spectroscopies for surface analysis ed. by A. W. Czanderna ... |
| title_full_unstemmed | Ion spectroscopies for surface analysis ed. by A. W. Czanderna ... |
| title_short | Ion spectroscopies for surface analysis |
| title_sort | ion spectroscopies for surface analysis |
| topic | Secondary ion mass spectrometry Solids Surfaces Analysis Surface chemistry Oberflächenchemie (DE-588)4126166-5 gnd Ionenspektroskopie (DE-588)4455365-1 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
| topic_facet | Secondary ion mass spectrometry Solids Surfaces Analysis Surface chemistry Oberflächenchemie Ionenspektroskopie Festkörperoberfläche Aufsatzsammlung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003703839&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000728018 |
| work_keys_str_mv | AT czandernaalvinw ionspectroscopiesforsurfaceanalysis |