Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures: ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988
Saved in:
Bibliographic Details
Corporate Author: International Conference on Microelectronic Test Structures Long Beach, Calif (Author)
Format: Conference Proceeding Book
Language:English
Published: New York, NY Inst. of Electrical and Electronics Engineers 1986
Subjects:
Item Description:Literaturangaben
Physical Description:V, 206 S. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!