Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures: ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Inst. of Electrical and Electronics Engineers
1986
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | V, 206 S. Ill., graph. Darst. |
Internformat
MARC
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| 111 | 2 | |a International Conference on Microelectronic Test Structures |n 1 |d 1988 |c Long Beach, Calif. |j Verfasser |0 (DE-588)5003264-1 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures |b ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
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Datensatz im Suchindex
| _version_ | 1804120080817061888 |
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| author_corporate | International Conference on Microelectronic Test Structures Long Beach, Calif |
| author_corporate_role | aut |
| author_facet | International Conference on Microelectronic Test Structures Long Beach, Calif |
| author_sort | International Conference on Microelectronic Test Structures Long Beach, Calif |
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| bvnumber | BV005892346 |
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| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift 1988 Long Beach Calif. |
| id | DE-604.BV005892346 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:36:24Z |
| institution | BVB |
| institution_GND | (DE-588)5003264-1 |
| language | English |
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| oclc_num | 630288291 |
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| physical | V, 206 S. Ill., graph. Darst. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
| publisher | Inst. of Electrical and Electronics Engineers |
| record_format | marc |
| spelling | International Conference on Microelectronic Test Structures 1 1988 Long Beach, Calif. Verfasser (DE-588)5003264-1 aut Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 New York, NY Inst. of Electrical and Electronics Engineers 1986 V, 206 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Long Beach Calif. gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 |
| spellingShingle | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 |
| title | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_auth | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_exact_search | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_full | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_fullStr | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_full_unstemmed | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| title_short | Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the 1988 ieee international conference on microelectronic test structures icmts long beach hyatt regency long beach california february 22 23 1988 |
| title_sub | ICMTS ; Long Beach Hyatt Regency, Long Beach, California, February 22 - 23, 1988 |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 1988 Long Beach Calif. |
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