Particle characterization in technology:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Boca Raton, Fla.
CRC Pr.
|
| Ausgabe: | 4. print. |
| Schriftenreihe: | CRC series on fine particle science and technology.
|
| Schlagworte: | |
| ISBN: | 0849357845 0849357853 |
Internformat
MARC
| LEADER | 00000nam a2200000 ca4500 | ||
|---|---|---|---|
| 001 | BV005793766 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 921030nuuuuuuuu |||| 00||| und d | ||
| 020 | |a 0849357845 |9 0-8493-5784-5 | ||
| 020 | |a 0849357853 |9 0-8493-5785-3 | ||
| 035 | |a (DE-599)BVBBV005793766 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 084 | |a UQ 8050 |0 (DE-625)146587: |2 rvk | ||
| 245 | 1 | 0 | |a Particle characterization in technology |c ed.: John Keith Beddow |
| 250 | |a 4. print. | ||
| 264 | 1 | |a Boca Raton, Fla. |b CRC Pr. | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a CRC series on fine particle science and technology. | |
| 650 | 0 | 7 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Beddow, John Keith |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012323123 | ||
Datensatz im Suchindex
| _version_ | 1804132192306069504 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV005793766 |
| classification_rvk | UQ 8050 |
| ctrlnum | (DE-599)BVBBV005793766 |
| discipline | Physik |
| edition | 4. print. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00951nam a2200301 ca4500</leader><controlfield tag="001">BV005793766</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921030nuuuuuuuu |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0849357845</subfield><subfield code="9">0-8493-5784-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0849357853</subfield><subfield code="9">0-8493-5785-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005793766</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8050</subfield><subfield code="0">(DE-625)146587:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Particle characterization in technology</subfield><subfield code="c">ed.: John Keith Beddow</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">4. print.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton, Fla.</subfield><subfield code="b">CRC Pr.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">CRC series on fine particle science and technology.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Beddow, John Keith</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-012323123</subfield></datafield></record></collection> |
| id | DE-604.BV005793766 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:48:55Z |
| institution | BVB |
| isbn | 0849357845 0849357853 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012323123 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | CRC Pr. |
| record_format | marc |
| series2 | CRC series on fine particle science and technology. |
| spelling | Particle characterization in technology ed.: John Keith Beddow 4. print. Boca Raton, Fla. CRC Pr. txt rdacontent n rdamedia nc rdacarrier CRC series on fine particle science and technology. Teilchenmesstechnik (DE-588)4129617-5 gnd rswk-swf Teilchenmesstechnik (DE-588)4129617-5 s DE-604 Beddow, John Keith Sonstige oth |
| spellingShingle | Particle characterization in technology Teilchenmesstechnik (DE-588)4129617-5 gnd |
| subject_GND | (DE-588)4129617-5 |
| title | Particle characterization in technology |
| title_auth | Particle characterization in technology |
| title_exact_search | Particle characterization in technology |
| title_full | Particle characterization in technology ed.: John Keith Beddow |
| title_fullStr | Particle characterization in technology ed.: John Keith Beddow |
| title_full_unstemmed | Particle characterization in technology ed.: John Keith Beddow |
| title_short | Particle characterization in technology |
| title_sort | particle characterization in technology |
| topic | Teilchenmesstechnik (DE-588)4129617-5 gnd |
| topic_facet | Teilchenmesstechnik |
| work_keys_str_mv | AT beddowjohnkeith particlecharacterizationintechnology |