Microscopy of materials: Modern imaging methods using electron, x-ray and ion beams
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London
Macmillan
1975
|
| Schlagworte: | |
| Beschreibung: | IX, 304 S. graph. Darst. |
Internformat
MARC
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| 245 | 1 | 0 | |a Microscopy of materials |b Modern imaging methods using electron, x-ray and ion beams |c D. K. Bowen ; C. R. Hall* |
| 264 | 1 | |a London |b Macmillan |c 1975 | |
| 300 | |a IX, 304 S. |b graph. Darst. | ||
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Datensatz im Suchindex
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| any_adam_object | |
| author | Bowen, D. K. Hall, C. R. |
| author_facet | Bowen, D. K. Hall, C. R. |
| author_role | aut aut |
| author_sort | Bowen, D. K. |
| author_variant | d k b dk dkb c r h cr crh |
| building | Verbundindex |
| bvnumber | BV005760029 |
| callnumber-first | Q - Science |
| callnumber-label | QH207 |
| callnumber-raw | QH207 TA418.7 |
| callnumber-search | QH207 TA418.7 |
| callnumber-sort | QH 3207 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)2367963 (DE-599)BVBBV005760029 |
| dewey-full | 502.8 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.8 |
| dewey-search | 502.8 |
| dewey-sort | 3502.8 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV005760029 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:34:13Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003597312 |
| oclc_num | 2367963 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-83 |
| owner_facet | DE-355 DE-BY-UBR DE-83 |
| physical | IX, 304 S. graph. Darst. |
| psigel | TUB-nvmb |
| publishDate | 1975 |
| publishDateSearch | 1975 |
| publishDateSort | 1975 |
| publisher | Macmillan |
| record_format | marc |
| spelling | Bowen, D. K. Verfasser aut Microscopy of materials Modern imaging methods using electron, x-ray and ion beams D. K. Bowen ; C. R. Hall* London Macmillan 1975 IX, 304 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Malzemeler - Mikroskopi Materials Microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 s Mikroskopie (DE-588)4039238-7 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Elektronenoptik (DE-588)4151879-2 s Hall, C. R. Verfasser aut |
| spellingShingle | Bowen, D. K. Hall, C. R. Microscopy of materials Modern imaging methods using electron, x-ray and ion beams Malzemeler - Mikroskopi Materials Microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenoptik (DE-588)4151879-2 gnd Mikroskopie (DE-588)4039238-7 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4151879-2 (DE-588)4039238-7 (DE-588)4037934-6 |
| title | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams |
| title_auth | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams |
| title_exact_search | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams |
| title_full | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams D. K. Bowen ; C. R. Hall* |
| title_fullStr | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams D. K. Bowen ; C. R. Hall* |
| title_full_unstemmed | Microscopy of materials Modern imaging methods using electron, x-ray and ion beams D. K. Bowen ; C. R. Hall* |
| title_short | Microscopy of materials |
| title_sort | microscopy of materials modern imaging methods using electron x ray and ion beams |
| title_sub | Modern imaging methods using electron, x-ray and ion beams |
| topic | Malzemeler - Mikroskopi Materials Microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenoptik (DE-588)4151879-2 gnd Mikroskopie (DE-588)4039238-7 gnd Werkstoffprüfung (DE-588)4037934-6 gnd |
| topic_facet | Malzemeler - Mikroskopi Materials Microscopy Elektronenmikroskopie Elektronenoptik Mikroskopie Werkstoffprüfung |
| work_keys_str_mv | AT bowendk microscopyofmaterialsmodernimagingmethodsusingelectronxrayandionbeams AT hallcr microscopyofmaterialsmodernimagingmethodsusingelectronxrayandionbeams |