The electrical characterization of semiconductors: measurement of minority carrier properties
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
London u.a.
Acad. Press
1990
|
Schriftenreihe: | Techniques of physics
13 |
Schlagworte: | |
Beschreibung: | XVII, 291 S. zahlr. graph. Darst. |
ISBN: | 0125286252 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV005619817 | ||
003 | DE-604 | ||
005 | 19950302 | ||
007 | t | ||
008 | 921026s1990 d||| |||| 00||| engod | ||
020 | |a 0125286252 |9 0-12-528625-2 | ||
035 | |a (OCoLC)22832127 | ||
035 | |a (DE-599)BVBBV005619817 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-29T |a DE-20 |a DE-384 |a DE-11 | ||
050 | 0 | |a TK7871.85 | |
082 | 0 | |a 537.622 | |
084 | |a UP 2800 |0 (DE-625)146366: |2 rvk | ||
084 | |a UP 3600 |0 (DE-625)146385: |2 rvk | ||
084 | |a PHY 685f |2 stub | ||
100 | 1 | |a Orton, John W. |d 1932- |e Verfasser |0 (DE-588)108187365 |4 aut | |
245 | 1 | 0 | |a The electrical characterization of semiconductors |b measurement of minority carrier properties |c J. W. Orton and P. Blood |
264 | 1 | |a London u.a. |b Acad. Press |c 1990 | |
300 | |a XVII, 291 S. |b zahlr. graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Techniques of physics |v 13 | |
650 | 4 | |a Lignes électriques - Transmission par courants porteurs | |
650 | 4 | |a Semiconducteurs | |
650 | 4 | |a Semiconductors |x Defects | |
650 | 4 | |a Semiconductors |x Diffusion | |
650 | 4 | |a Semiconductors |x Impurity distribution | |
650 | 4 | |a Semiconductors |x Materials |x Measurement | |
650 | 4 | |a Semiconductors |x Recombination | |
650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektrische Eigenschaft |0 (DE-588)4193812-4 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
689 | 0 | 1 | |a Elektrische Eigenschaft |0 (DE-588)4193812-4 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Blood, Peter |e Verfasser |4 aut | |
830 | 0 | |a Techniques of physics |v 13 |w (DE-604)BV001890126 |9 13 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-003517408 |
Datensatz im Suchindex
_version_ | 1804119826186108928 |
---|---|
any_adam_object | |
author | Orton, John W. 1932- Blood, Peter |
author_GND | (DE-588)108187365 |
author_facet | Orton, John W. 1932- Blood, Peter |
author_role | aut aut |
author_sort | Orton, John W. 1932- |
author_variant | j w o jw jwo p b pb |
building | Verbundindex |
bvnumber | BV005619817 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.85 |
callnumber-search | TK7871.85 |
callnumber-sort | TK 47871.85 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | UP 2800 UP 3600 |
classification_tum | PHY 685f |
ctrlnum | (OCoLC)22832127 (DE-599)BVBBV005619817 |
dewey-full | 537.622 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 537 - Electricity and electronics |
dewey-raw | 537.622 |
dewey-search | 537.622 |
dewey-sort | 3537.622 |
dewey-tens | 530 - Physics |
discipline | Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01772nam a2200493 cb4500</leader><controlfield tag="001">BV005619817</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19950302 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921026s1990 d||| |||| 00||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0125286252</subfield><subfield code="9">0-12-528625-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)22832127</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005619817</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.622</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2800</subfield><subfield code="0">(DE-625)146366:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3600</subfield><subfield code="0">(DE-625)146385:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 685f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Orton, John W.</subfield><subfield code="d">1932-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)108187365</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The electrical characterization of semiconductors</subfield><subfield code="b">measurement of minority carrier properties</subfield><subfield code="c">J. W. Orton and P. Blood</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London u.a.</subfield><subfield code="b">Acad. Press</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 291 S.</subfield><subfield code="b">zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Techniques of physics</subfield><subfield code="v">13</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Lignes électriques - Transmission par courants porteurs</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconducteurs</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Diffusion</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Impurity distribution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Materials</subfield><subfield code="x">Measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Recombination</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrische Eigenschaft</subfield><subfield code="0">(DE-588)4193812-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektrische Eigenschaft</subfield><subfield code="0">(DE-588)4193812-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Blood, Peter</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Techniques of physics</subfield><subfield code="v">13</subfield><subfield code="w">(DE-604)BV001890126</subfield><subfield code="9">13</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003517408</subfield></datafield></record></collection> |
id | DE-604.BV005619817 |
illustrated | Illustrated |
indexdate | 2024-07-09T16:32:21Z |
institution | BVB |
isbn | 0125286252 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003517408 |
oclc_num | 22832127 |
open_access_boolean | |
owner | DE-29T DE-20 DE-384 DE-11 |
owner_facet | DE-29T DE-20 DE-384 DE-11 |
physical | XVII, 291 S. zahlr. graph. Darst. |
publishDate | 1990 |
publishDateSearch | 1990 |
publishDateSort | 1990 |
publisher | Acad. Press |
record_format | marc |
series | Techniques of physics |
series2 | Techniques of physics |
spelling | Orton, John W. 1932- Verfasser (DE-588)108187365 aut The electrical characterization of semiconductors measurement of minority carrier properties J. W. Orton and P. Blood London u.a. Acad. Press 1990 XVII, 291 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Techniques of physics 13 Lignes électriques - Transmission par courants porteurs Semiconducteurs Semiconductors Defects Semiconductors Diffusion Semiconductors Impurity distribution Semiconductors Materials Measurement Semiconductors Recombination Halbleiter (DE-588)4022993-2 gnd rswk-swf Elektrische Eigenschaft (DE-588)4193812-4 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Elektrische Eigenschaft (DE-588)4193812-4 s DE-604 Blood, Peter Verfasser aut Techniques of physics 13 (DE-604)BV001890126 13 |
spellingShingle | Orton, John W. 1932- Blood, Peter The electrical characterization of semiconductors measurement of minority carrier properties Techniques of physics Lignes électriques - Transmission par courants porteurs Semiconducteurs Semiconductors Defects Semiconductors Diffusion Semiconductors Impurity distribution Semiconductors Materials Measurement Semiconductors Recombination Halbleiter (DE-588)4022993-2 gnd Elektrische Eigenschaft (DE-588)4193812-4 gnd |
subject_GND | (DE-588)4022993-2 (DE-588)4193812-4 |
title | The electrical characterization of semiconductors measurement of minority carrier properties |
title_auth | The electrical characterization of semiconductors measurement of minority carrier properties |
title_exact_search | The electrical characterization of semiconductors measurement of minority carrier properties |
title_full | The electrical characterization of semiconductors measurement of minority carrier properties J. W. Orton and P. Blood |
title_fullStr | The electrical characterization of semiconductors measurement of minority carrier properties J. W. Orton and P. Blood |
title_full_unstemmed | The electrical characterization of semiconductors measurement of minority carrier properties J. W. Orton and P. Blood |
title_short | The electrical characterization of semiconductors |
title_sort | the electrical characterization of semiconductors measurement of minority carrier properties |
title_sub | measurement of minority carrier properties |
topic | Lignes électriques - Transmission par courants porteurs Semiconducteurs Semiconductors Defects Semiconductors Diffusion Semiconductors Impurity distribution Semiconductors Materials Measurement Semiconductors Recombination Halbleiter (DE-588)4022993-2 gnd Elektrische Eigenschaft (DE-588)4193812-4 gnd |
topic_facet | Lignes électriques - Transmission par courants porteurs Semiconducteurs Semiconductors Defects Semiconductors Diffusion Semiconductors Impurity distribution Semiconductors Materials Measurement Semiconductors Recombination Halbleiter Elektrische Eigenschaft |
volume_link | (DE-604)BV001890126 |
work_keys_str_mv | AT ortonjohnw theelectricalcharacterizationofsemiconductorsmeasurementofminoritycarrierproperties AT bloodpeter theelectricalcharacterizationofsemiconductorsmeasurementofminoritycarrierproperties |