The role of microscopy in semiconductor failure analysis:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Oxford Univ. Press
1992
|
| Schriftenreihe: | Microscopy handbooks
25 |
| Schlagworte: | |
| Beschreibung: | VI, 108 S. zahlr. Ill. |
| ISBN: | 0198564325 |
Internformat
MARC
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| 100 | 1 | |a Richards, B. P. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a The role of microscopy in semiconductor failure analysis |c B. P. Richards and P. K. Footner |
| 264 | 1 | |a Oxford |b Oxford Univ. Press |c 1992 | |
| 300 | |a VI, 108 S. |b zahlr. Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Microscopy handbooks |v 25 | |
| 650 | 7 | |a Microscopie |2 ram | |
| 650 | 7 | |a Semiconducteurs - Défauts |2 ram | |
| 650 | 4 | |a Microscopes | |
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 4 | |a Semiconductors |x Testing | |
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| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehleranalyse |0 (DE-588)4016608-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
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| 689 | 0 | 2 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
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| 689 | 2 | 2 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 2 | |5 DE-604 | |
| 700 | 1 | |a Footner, P. K. |e Verfasser |4 aut | |
| 830 | 0 | |a Microscopy handbooks |v 25 |w (DE-604)BV002612606 |9 25 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003506145 | ||
Datensatz im Suchindex
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| any_adam_object | |
| author | Richards, B. P. Footner, P. K. |
| author_facet | Richards, B. P. Footner, P. K. |
| author_role | aut aut |
| author_sort | Richards, B. P. |
| author_variant | b p r bp bpr p k f pk pkf |
| building | Verbundindex |
| bvnumber | BV005596695 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UH 6300 UH 6700 ZN 4800 |
| classification_tum | ELT 364f |
| ctrlnum | (OCoLC)25316466 (DE-599)BVBBV005596695 |
| dewey-full | 621.3815/2/0287 621.381520287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2/0287 621.381520287 |
| dewey-search | 621.3815/2/0287 621.381520287 |
| dewey-sort | 3621.3815 12 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005596695 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:32:07Z |
| institution | BVB |
| isbn | 0198564325 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003506145 |
| oclc_num | 25316466 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-384 DE-11 |
| owner_facet | DE-91 DE-BY-TUM DE-384 DE-11 |
| physical | VI, 108 S. zahlr. Ill. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Microscopy handbooks |
| series2 | Microscopy handbooks |
| spelling | Richards, B. P. Verfasser aut The role of microscopy in semiconductor failure analysis B. P. Richards and P. K. Footner Oxford Oxford Univ. Press 1992 VI, 108 S. zahlr. Ill. txt rdacontent n rdamedia nc rdacarrier Microscopy handbooks 25 Microscopie ram Semiconducteurs - Défauts ram Microscopes Semiconductors Failures Semiconductors Testing Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Fehleranalyse (DE-588)4016608-9 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Fehleranalyse (DE-588)4016608-9 s Mikroskopie (DE-588)4039238-7 s DE-604 Fehlererkennung (DE-588)4133764-5 s Halbleiter (DE-588)4022993-2 s Footner, P. K. Verfasser aut Microscopy handbooks 25 (DE-604)BV002612606 25 |
| spellingShingle | Richards, B. P. Footner, P. K. The role of microscopy in semiconductor failure analysis Microscopy handbooks Microscopie ram Semiconducteurs - Défauts ram Microscopes Semiconductors Failures Semiconductors Testing Fehlererkennung (DE-588)4133764-5 gnd Halbleiter (DE-588)4022993-2 gnd Mikroskopie (DE-588)4039238-7 gnd Fehleranalyse (DE-588)4016608-9 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4133764-5 (DE-588)4022993-2 (DE-588)4039238-7 (DE-588)4016608-9 (DE-588)4113826-0 |
| title | The role of microscopy in semiconductor failure analysis |
| title_auth | The role of microscopy in semiconductor failure analysis |
| title_exact_search | The role of microscopy in semiconductor failure analysis |
| title_full | The role of microscopy in semiconductor failure analysis B. P. Richards and P. K. Footner |
| title_fullStr | The role of microscopy in semiconductor failure analysis B. P. Richards and P. K. Footner |
| title_full_unstemmed | The role of microscopy in semiconductor failure analysis B. P. Richards and P. K. Footner |
| title_short | The role of microscopy in semiconductor failure analysis |
| title_sort | the role of microscopy in semiconductor failure analysis |
| topic | Microscopie ram Semiconducteurs - Défauts ram Microscopes Semiconductors Failures Semiconductors Testing Fehlererkennung (DE-588)4133764-5 gnd Halbleiter (DE-588)4022993-2 gnd Mikroskopie (DE-588)4039238-7 gnd Fehleranalyse (DE-588)4016608-9 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Microscopie Semiconducteurs - Défauts Microscopes Semiconductors Failures Semiconductors Testing Fehlererkennung Halbleiter Mikroskopie Fehleranalyse Halbleiterbauelement |
| volume_link | (DE-604)BV002612606 |
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