Frontiers of electron microscopy in materials science: proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Amsterdam u.a.
North-Holland
1991
|
| Series: | Ultramicroscopy
37,1/4 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zs.-Heftes |
| Physical Description: | 378 S. Ill., graph. Darst. |
Staff View
MARC
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| 245 | 1 | 0 | |a Frontiers of electron microscopy in materials science |b proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |c guest ed.: S. A. Bradley |
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| genre_facet | Konferenzschrift 1990 Oak Brook Ill. |
| id | DE-604.BV005596147 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:32:06Z |
| institution | BVB |
| language | English |
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| physical | 378 S. Ill., graph. Darst. |
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| series2 | Ultramicroscopy |
| spelling | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley Amsterdam u.a. North-Holland 1991 378 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 37,1/4 Einzelaufnahme eines Zs.-Heftes Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Oak Brook Ill. gnd-content Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Bradley, Steven A. Sonstige oth |
| spellingShingle | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4079184-1 (DE-588)1071861417 |
| title | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_auth | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_exact_search | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_full | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_fullStr | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_full_unstemmed | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_short | Frontiers of electron microscopy in materials science |
| title_sort | frontiers of electron microscopy in materials science proceedings of the third conference on frontiers of electron microscopy in materials science oak brook il usa 20 24 may 1990 |
| title_sub | proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| topic | Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie Werkstoffkunde Konferenzschrift 1990 Oak Brook Ill. |
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