Frontiers of electron microscopy in materials science: proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
North-Holland
1991
|
| Schriftenreihe: | Ultramicroscopy
37,1/4 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zs.-Heftes |
| Beschreibung: | 378 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV005596147 | ||
| 003 | DE-604 | ||
| 005 | 19921021 | ||
| 007 | t | ||
| 008 | 921019s1991 ad|| |||| 10||| engod | ||
| 035 | |a (OCoLC)25610242 | ||
| 035 | |a (DE-599)BVBBV005596147 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 | ||
| 245 | 1 | 0 | |a Frontiers of electron microscopy in materials science |b proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |c guest ed.: S. A. Bradley |
| 264 | 1 | |a Amsterdam u.a. |b North-Holland |c 1991 | |
| 300 | |a 378 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Ultramicroscopy |v 37,1/4 | |
| 500 | |a Einzelaufnahme eines Zs.-Heftes | ||
| 650 | 4 | |a Electron microscopy |v Congresses | |
| 650 | 4 | |a Materials Testing |v Congresses | |
| 650 | 4 | |a Materials science |v Congresses | |
| 650 | 4 | |a Materials |x Analysis |v Congresses | |
| 650 | 4 | |a Microscopy, Electron |x methods |v Congresses | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoffkunde |0 (DE-588)4079184-1 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1990 |z Oak Brook Ill. |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a Werkstoffkunde |0 (DE-588)4079184-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Bradley, Steven A. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003505722 | ||
Datensatz im Suchindex
| _version_ | 1804119810121924608 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV005596147 |
| ctrlnum | (OCoLC)25610242 (DE-599)BVBBV005596147 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01527nam a2200397 cb4500</leader><controlfield tag="001">BV005596147</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19921021 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921019s1991 ad|| |||| 10||| engod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)25610242</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005596147</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Frontiers of electron microscopy in materials science</subfield><subfield code="b">proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990</subfield><subfield code="c">guest ed.: S. A. Bradley</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam u.a.</subfield><subfield code="b">North-Holland</subfield><subfield code="c">1991</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">378 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Ultramicroscopy</subfield><subfield code="v">37,1/4</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zs.-Heftes</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Analysis</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron</subfield><subfield code="x">methods</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffkunde</subfield><subfield code="0">(DE-588)4079184-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1990</subfield><subfield code="z">Oak Brook Ill.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Werkstoffkunde</subfield><subfield code="0">(DE-588)4079184-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bradley, Steven A.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003505722</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1990 Oak Brook Ill. gnd-content |
| genre_facet | Konferenzschrift 1990 Oak Brook Ill. |
| id | DE-604.BV005596147 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:32:06Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003505722 |
| oclc_num | 25610242 |
| open_access_boolean | |
| owner | DE-12 |
| owner_facet | DE-12 |
| physical | 378 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | North-Holland |
| record_format | marc |
| series2 | Ultramicroscopy |
| spelling | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley Amsterdam u.a. North-Holland 1991 378 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 37,1/4 Einzelaufnahme eines Zs.-Heftes Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Oak Brook Ill. gnd-content Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Bradley, Steven A. Sonstige oth |
| spellingShingle | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4079184-1 (DE-588)1071861417 |
| title | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_auth | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_exact_search | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| title_full | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_fullStr | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_full_unstemmed | Frontiers of electron microscopy in materials science proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 guest ed.: S. A. Bradley |
| title_short | Frontiers of electron microscopy in materials science |
| title_sort | frontiers of electron microscopy in materials science proceedings of the third conference on frontiers of electron microscopy in materials science oak brook il usa 20 24 may 1990 |
| title_sub | proceedings of the Third Conference on Frontiers of Electron Microscopy in Materials Science, Oak Brook, Il, USA, 20 - 24 May 1990 |
| topic | Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Electron microscopy Congresses Materials Testing Congresses Materials science Congresses Materials Analysis Congresses Microscopy, Electron methods Congresses Elektronenmikroskopie Werkstoffkunde Konferenzschrift 1990 Oak Brook Ill. |
| work_keys_str_mv | AT bradleystevena frontiersofelectronmicroscopyinmaterialsscienceproceedingsofthethirdconferenceonfrontiersofelectronmicroscopyinmaterialsscienceoakbrookilusa2024may1990 |