Defect control in semiconductors: proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989
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| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Amsterdam u.a.
North-Holland
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Internformat
MARC
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Datensatz im Suchindex
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| spelling | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 ed. by K. Sumino Amsterdam u.a. North-Holland txt rdacontent n rdamedia nc rdacarrier Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1989 Yokohama gnd-content Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Sumino, K. Sonstige oth International Conference on the Science and Technology of Defect Control in Semiconductors 1989 Yokohama Sonstige (DE-588)5049482-X oth |
| spellingShingle | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4125030-8 (DE-588)1071861417 |
| title | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 |
| title_auth | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 |
| title_exact_search | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 |
| title_full | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 ed. by K. Sumino |
| title_fullStr | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 ed. by K. Sumino |
| title_full_unstemmed | Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 ed. by K. Sumino |
| title_short | Defect control in semiconductors |
| title_sort | defect control in semiconductors proceedings of the international conference on the science and technology of defect control in semiconductors the yokohama 21st century forum yokohama japan september 17 22 1989 |
| title_sub | proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors ; The Yokohama 21st Century Forum, Yokohama, Japan, September 17 - 22, 1989 |
| topic | Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Halbleiter Gitterbaufehler Konferenzschrift 1989 Yokohama |
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