Fault covering problems in reconfigurable VLSI systems:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Boston [u.a.]
Kluwer Acad. Publ.
1992
|
| Series: | The Kluwer international series in engineering and computer science
172: VLSI, computer architecture and digital signal processing |
| Subjects: | |
| Item Description: | Literaturverz. S. 119 - 127 |
| Physical Description: | XIII, 130 S. graph. Darst. |
| ISBN: | 0792392310 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV005584259 | ||
| 003 | DE-604 | ||
| 005 | 20141219 | ||
| 007 | t | ||
| 008 | 921006s1992 d||| |||| 00||| engod | ||
| 020 | |a 0792392310 |9 0-7923-9231-0 | ||
| 035 | |a (OCoLC)25316145 | ||
| 035 | |a (DE-599)BVBBV005584259 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-12 |a DE-739 |a DE-83 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.39/5 |2 20 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
| 084 | |a ELT 364f |2 stub | ||
| 084 | |a DAT 286f |2 stub | ||
| 245 | 1 | 0 | |a Fault covering problems in reconfigurable VLSI systems |c by Ran Libeskind-Hadas ... |
| 264 | 1 | |a Boston [u.a.] |b Kluwer Acad. Publ. |c 1992 | |
| 300 | |a XIII, 130 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a The Kluwer international series in engineering and computer science |v 172: VLSI, computer architecture and digital signal processing | |
| 500 | |a Literaturverz. S. 119 - 127 | ||
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Integrated circuits |x Fault tolerance | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Design and construction |x Data processing | |
| 650 | 4 | |a Integrated circuits |x Wafer-scale integration |x Design and construction |x Data processing | |
| 650 | 0 | 7 | |a Fehlertoleranz |0 (DE-588)4123192-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Überdeckung |g Mathematik |0 (DE-588)4186551-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 0 | 1 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 1 | 1 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 1 | 2 | |a Überdeckung |g Mathematik |0 (DE-588)4186551-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Libeskind-Hadas, Ran |e Sonstige |4 oth | |
| 830 | 0 | |a The Kluwer international series in engineering and computer science |v 172: VLSI, computer architecture and digital signal processing |w (DE-604)BV023545171 |9 172 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003496752 | ||
Record in the Search Index
| _version_ | 1804119795917914112 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV005584259 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 ZN 4952 |
| classification_tum | ELT 364f DAT 286f |
| ctrlnum | (OCoLC)25316145 (DE-599)BVBBV005584259 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02146nam a2200529 cb4500</leader><controlfield tag="001">BV005584259</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20141219 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">921006s1992 d||| |||| 00||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792392310</subfield><subfield code="9">0-7923-9231-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)25316145</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005584259</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-12</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 364f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">DAT 286f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fault covering problems in reconfigurable VLSI systems</subfield><subfield code="c">by Ran Libeskind-Hadas ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston [u.a.]</subfield><subfield code="b">Kluwer Acad. Publ.</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 130 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">The Kluwer international series in engineering and computer science</subfield><subfield code="v">172: VLSI, computer architecture and digital signal processing</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 119 - 127</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Fault tolerance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Wafer-scale integration</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Data processing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Überdeckung</subfield><subfield code="g">Mathematik</subfield><subfield code="0">(DE-588)4186551-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Überdeckung</subfield><subfield code="g">Mathematik</subfield><subfield code="0">(DE-588)4186551-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Libeskind-Hadas, Ran</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">The Kluwer international series in engineering and computer science</subfield><subfield code="v">172: VLSI, computer architecture and digital signal processing</subfield><subfield code="w">(DE-604)BV023545171</subfield><subfield code="9">172</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003496752</subfield></datafield></record></collection> |
| id | DE-604.BV005584259 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:31:53Z |
| institution | BVB |
| isbn | 0792392310 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003496752 |
| oclc_num | 25316145 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-12 DE-739 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-12 DE-739 DE-83 |
| physical | XIII, 130 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Kluwer Acad. Publ. |
| record_format | marc |
| series | The Kluwer international series in engineering and computer science |
| series2 | The Kluwer international series in engineering and computer science |
| spelling | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... Boston [u.a.] Kluwer Acad. Publ. 1992 XIII, 130 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science 172: VLSI, computer architecture and digital signal processing Literaturverz. S. 119 - 127 Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Überdeckung Mathematik (DE-588)4186551-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 s VLSI (DE-588)4117388-0 s DE-604 Überdeckung Mathematik (DE-588)4186551-0 s Libeskind-Hadas, Ran Sonstige oth The Kluwer international series in engineering and computer science 172: VLSI, computer architecture and digital signal processing (DE-604)BV023545171 172 |
| spellingShingle | Fault covering problems in reconfigurable VLSI systems The Kluwer international series in engineering and computer science Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd Überdeckung Mathematik (DE-588)4186551-0 gnd |
| subject_GND | (DE-588)4123192-2 (DE-588)4117388-0 (DE-588)4186551-0 |
| title | Fault covering problems in reconfigurable VLSI systems |
| title_auth | Fault covering problems in reconfigurable VLSI systems |
| title_exact_search | Fault covering problems in reconfigurable VLSI systems |
| title_full | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_fullStr | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_full_unstemmed | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_short | Fault covering problems in reconfigurable VLSI systems |
| title_sort | fault covering problems in reconfigurable vlsi systems |
| topic | Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd Überdeckung Mathematik (DE-588)4186551-0 gnd |
| topic_facet | Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz VLSI Überdeckung Mathematik |
| volume_link | (DE-604)BV023545171 |
| work_keys_str_mv | AT libeskindhadasran faultcoveringproblemsinreconfigurablevlsisystems |