Fault covering problems in reconfigurable VLSI systems:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston [u.a.]
Kluwer Acad. Publ.
1992
|
| Schriftenreihe: | The Kluwer international series in engineering and computer science
172: VLSI, computer architecture and digital signal processing |
| Schlagworte: | |
| Beschreibung: | Literaturverz. S. 119 - 127 |
| Beschreibung: | XIII, 130 S. graph. Darst. |
| ISBN: | 0792392310 |
Internformat
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| id | DE-604.BV005584259 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:31:53Z |
| institution | BVB |
| isbn | 0792392310 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003496752 |
| oclc_num | 25316145 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-12 DE-739 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-12 DE-739 DE-83 |
| physical | XIII, 130 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Kluwer Acad. Publ. |
| record_format | marc |
| series | The Kluwer international series in engineering and computer science |
| series2 | The Kluwer international series in engineering and computer science |
| spelling | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... Boston [u.a.] Kluwer Acad. Publ. 1992 XIII, 130 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science 172: VLSI, computer architecture and digital signal processing Literaturverz. S. 119 - 127 Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Überdeckung Mathematik (DE-588)4186551-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 s VLSI (DE-588)4117388-0 s DE-604 Überdeckung Mathematik (DE-588)4186551-0 s Libeskind-Hadas, Ran Sonstige oth The Kluwer international series in engineering and computer science 172: VLSI, computer architecture and digital signal processing (DE-604)BV023545171 172 |
| spellingShingle | Fault covering problems in reconfigurable VLSI systems The Kluwer international series in engineering and computer science Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd Überdeckung Mathematik (DE-588)4186551-0 gnd |
| subject_GND | (DE-588)4123192-2 (DE-588)4117388-0 (DE-588)4186551-0 |
| title | Fault covering problems in reconfigurable VLSI systems |
| title_auth | Fault covering problems in reconfigurable VLSI systems |
| title_exact_search | Fault covering problems in reconfigurable VLSI systems |
| title_full | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_fullStr | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_full_unstemmed | Fault covering problems in reconfigurable VLSI systems by Ran Libeskind-Hadas ... |
| title_short | Fault covering problems in reconfigurable VLSI systems |
| title_sort | fault covering problems in reconfigurable vlsi systems |
| topic | Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd Überdeckung Mathematik (DE-588)4186551-0 gnd |
| topic_facet | Datenverarbeitung Integrated circuits Fault tolerance Integrated circuits Very large scale integration Design and construction Data processing Integrated circuits Wafer-scale integration Design and construction Data processing Fehlertoleranz VLSI Überdeckung Mathematik |
| volume_link | (DE-604)BV023545171 |
| work_keys_str_mv | AT libeskindhadasran faultcoveringproblemsinreconfigurablevlsisystems |