Tutorial: VLSI testing & validation techniques:
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Washington, DC
IEEE Comp. Soc. Pr.
1985
|
| Subjects: | |
| Physical Description: | IX, 603 S. Ill., graph. Darst. |
| ISBN: | 0818606681 0818646683 |
Staff View
MARC
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| 245 | 1 | 0 | |a Tutorial: VLSI testing & validation techniques |c Hassan K. Reghbati. IEEE Computer Society |
| 246 | 1 | 3 | |a VLSI testing & validation techniques |
| 246 | 1 | 3 | |a Tutorial: VLSI testing and validation techniques |
| 264 | 1 | |a Washington, DC |b IEEE Comp. Soc. Pr. |c 1985 | |
| 300 | |a IX, 603 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
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Record in the Search Index
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| bvnumber | BV005557904 |
| callnumber-first | T - Technology |
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| ctrlnum | (OCoLC)636744838 (DE-599)BVBBV005557904 |
| dewey-full | 621.395/028/7 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.395/028/7 |
| dewey-search | 621.395/028/7 |
| dewey-sort | 3621.395 228 17 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005557904 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:31:35Z |
| institution | BVB |
| institution_GND | (DE-588)25694-8 |
| isbn | 0818606681 0818646683 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003484778 |
| oclc_num | 636744838 |
| open_access_boolean | |
| owner | DE-92 DE-29T DE-188 |
| owner_facet | DE-92 DE-29T DE-188 |
| physical | IX, 603 S. Ill., graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | IEEE Comp. Soc. Pr. |
| record_format | marc |
| spelling | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society VLSI testing & validation techniques Tutorial: VLSI testing and validation techniques Washington, DC IEEE Comp. Soc. Pr. 1985 IX, 603 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf CAD (DE-588)4069794-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 CAD (DE-588)4069794-0 s Reghbati, Hassan K. Sonstige oth IEEE Computer Society Sonstige (DE-588)25694-8 oth |
| spellingShingle | Tutorial: VLSI testing & validation techniques Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd CAD (DE-588)4069794-0 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 (DE-588)4069794-0 |
| title | Tutorial: VLSI testing & validation techniques |
| title_alt | VLSI testing & validation techniques Tutorial: VLSI testing and validation techniques |
| title_auth | Tutorial: VLSI testing & validation techniques |
| title_exact_search | Tutorial: VLSI testing & validation techniques |
| title_full | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_fullStr | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_full_unstemmed | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_short | Tutorial: VLSI testing & validation techniques |
| title_sort | tutorial vlsi testing validation techniques |
| topic | Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd CAD (DE-588)4069794-0 gnd |
| topic_facet | Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI Prüftechnik CAD |
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