Tutorial: VLSI testing & validation techniques:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Washington, DC
IEEE Comp. Soc. Pr.
1985
|
| Schlagworte: | |
| Beschreibung: | IX, 603 S. Ill., graph. Darst. |
| ISBN: | 0818606681 0818646683 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV005557904 | ||
| 003 | DE-604 | ||
| 005 | 20140711 | ||
| 007 | t | ||
| 008 | 920915s1985 ad|| |||| 00||| eng d | ||
| 020 | |a 0818606681 |9 0-8186-0668-1 | ||
| 020 | |a 0818646683 |9 0-8186-4668-3 | ||
| 035 | |a (OCoLC)636744838 | ||
| 035 | |a (DE-599)BVBBV005557904 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-92 |a DE-29T |a DE-188 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.395/028/7 |2 19 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
| 245 | 1 | 0 | |a Tutorial: VLSI testing & validation techniques |c Hassan K. Reghbati. IEEE Computer Society |
| 246 | 1 | 3 | |a VLSI testing & validation techniques |
| 246 | 1 | 3 | |a Tutorial: VLSI testing and validation techniques |
| 264 | 1 | |a Washington, DC |b IEEE Comp. Soc. Pr. |c 1985 | |
| 300 | |a IX, 603 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Circuits intégrés à très grande échelle - Essais | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CAD |0 (DE-588)4069794-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 1 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 1 | 2 | |a CAD |0 (DE-588)4069794-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Reghbati, Hassan K. |e Sonstige |4 oth | |
| 710 | 2 | |a IEEE Computer Society |e Sonstige |0 (DE-588)25694-8 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003484778 | ||
Datensatz im Suchindex
| _version_ | 1804119777072906240 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV005557904 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ST 190 ZN 4030 ZN 4952 |
| ctrlnum | (OCoLC)636744838 (DE-599)BVBBV005557904 |
| dewey-full | 621.395/028/7 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.395/028/7 |
| dewey-search | 621.395/028/7 |
| dewey-sort | 3621.395 228 17 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01797nam a2200505 c 4500</leader><controlfield tag="001">BV005557904</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140711 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">920915s1985 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818606681</subfield><subfield code="9">0-8186-0668-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818646683</subfield><subfield code="9">0-8186-4668-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)636744838</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005557904</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-92</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.395/028/7</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Tutorial: VLSI testing & validation techniques</subfield><subfield code="c">Hassan K. Reghbati. IEEE Computer Society</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">VLSI testing & validation techniques</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Tutorial: VLSI testing and validation techniques</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, DC</subfield><subfield code="b">IEEE Comp. Soc. Pr.</subfield><subfield code="c">1985</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 603 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits intégrés à très grande échelle - Essais</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CAD</subfield><subfield code="0">(DE-588)4069794-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">CAD</subfield><subfield code="0">(DE-588)4069794-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Reghbati, Hassan K.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">IEEE Computer Society</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)25694-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003484778</subfield></datafield></record></collection> |
| id | DE-604.BV005557904 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:31:35Z |
| institution | BVB |
| institution_GND | (DE-588)25694-8 |
| isbn | 0818606681 0818646683 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003484778 |
| oclc_num | 636744838 |
| open_access_boolean | |
| owner | DE-92 DE-29T DE-188 |
| owner_facet | DE-92 DE-29T DE-188 |
| physical | IX, 603 S. Ill., graph. Darst. |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| publisher | IEEE Comp. Soc. Pr. |
| record_format | marc |
| spelling | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society VLSI testing & validation techniques Tutorial: VLSI testing and validation techniques Washington, DC IEEE Comp. Soc. Pr. 1985 IX, 603 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf CAD (DE-588)4069794-0 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 CAD (DE-588)4069794-0 s Reghbati, Hassan K. Sonstige oth IEEE Computer Society Sonstige (DE-588)25694-8 oth |
| spellingShingle | Tutorial: VLSI testing & validation techniques Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd CAD (DE-588)4069794-0 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 (DE-588)4069794-0 |
| title | Tutorial: VLSI testing & validation techniques |
| title_alt | VLSI testing & validation techniques Tutorial: VLSI testing and validation techniques |
| title_auth | Tutorial: VLSI testing & validation techniques |
| title_exact_search | Tutorial: VLSI testing & validation techniques |
| title_full | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_fullStr | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_full_unstemmed | Tutorial: VLSI testing & validation techniques Hassan K. Reghbati. IEEE Computer Society |
| title_short | Tutorial: VLSI testing & validation techniques |
| title_sort | tutorial vlsi testing validation techniques |
| topic | Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd CAD (DE-588)4069794-0 gnd |
| topic_facet | Circuits intégrés à très grande échelle - Essais Integrated circuits Very large scale integration Testing VLSI Prüftechnik CAD |
| work_keys_str_mv | AT reghbatihassank tutorialvlsitestingvalidationtechniques AT ieeecomputersociety tutorialvlsitestingvalidationtechniques AT reghbatihassank vlsitestingvalidationtechniques AT ieeecomputersociety vlsitestingvalidationtechniques AT reghbatihassank tutorialvlsitestingandvalidationtechniques AT ieeecomputersociety tutorialvlsitestingandvalidationtechniques |