Designer's guide to testable asic devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York
Van Nostrand Reinhold
1991
|
| Schlagworte: | |
| Beschreibung: | XIV, 284 S. graph. Darst. |
| ISBN: | 0442002211 |
Internformat
MARC
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| 100 | 1 | |a Needham, Wayne M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Designer's guide to testable asic devices |c Wayne Maurice Needham |
| 264 | 1 | |a New York |b Van Nostrand Reinhold |c 1991 | |
| 300 | |a XIV, 284 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Circuits intégrés |2 ram | |
| 650 | 4 | |a Application specific integrated circuits |x Design and construction | |
| 650 | 4 | |a Application specific integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Testbarkeit |0 (DE-588)4271826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kundenspezifische Schaltung |0 (DE-588)4122250-7 |2 gnd |9 rswk-swf |
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| 689 | 1 | |5 DE-604 | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Needham, Wayne M. |
| author_facet | Needham, Wayne M. |
| author_role | aut |
| author_sort | Needham, Wayne M. |
| author_variant | w m n wm wmn |
| building | Verbundindex |
| bvnumber | BV005491187 |
| callnumber-first | T - Technology |
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| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 359f ELT 468f |
| ctrlnum | (OCoLC)21594177 (DE-599)BVBBV005491187 |
| dewey-full | 621.381/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/5 |
| dewey-search | 621.381/5 |
| dewey-sort | 3621.381 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005491187 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:30:27Z |
| institution | BVB |
| isbn | 0442002211 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003439048 |
| oclc_num | 21594177 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-29T |
| physical | XIV, 284 S. graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Van Nostrand Reinhold |
| record_format | marc |
| spelling | Needham, Wayne M. Verfasser aut Designer's guide to testable asic devices Wayne Maurice Needham New York Van Nostrand Reinhold 1991 XIV, 284 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuits intégrés ram Application specific integrated circuits Design and construction Application specific integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Kundenspezifische Schaltung (DE-588)4122250-7 gnd rswk-swf Kundenspezifische Schaltung (DE-588)4122250-7 s Testbarkeit (DE-588)4271826-0 s DE-604 Test (DE-588)4059549-3 s |
| spellingShingle | Needham, Wayne M. Designer's guide to testable asic devices Circuits intégrés ram Application specific integrated circuits Design and construction Application specific integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Test (DE-588)4059549-3 gnd Kundenspezifische Schaltung (DE-588)4122250-7 gnd |
| subject_GND | (DE-588)4271826-0 (DE-588)4059549-3 (DE-588)4122250-7 |
| title | Designer's guide to testable asic devices |
| title_auth | Designer's guide to testable asic devices |
| title_exact_search | Designer's guide to testable asic devices |
| title_full | Designer's guide to testable asic devices Wayne Maurice Needham |
| title_fullStr | Designer's guide to testable asic devices Wayne Maurice Needham |
| title_full_unstemmed | Designer's guide to testable asic devices Wayne Maurice Needham |
| title_short | Designer's guide to testable asic devices |
| title_sort | designer s guide to testable asic devices |
| topic | Circuits intégrés ram Application specific integrated circuits Design and construction Application specific integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Test (DE-588)4059549-3 gnd Kundenspezifische Schaltung (DE-588)4122250-7 gnd |
| topic_facet | Circuits intégrés Application specific integrated circuits Design and construction Application specific integrated circuits Testing Testbarkeit Test Kundenspezifische Schaltung |
| work_keys_str_mv | AT needhamwaynem designersguidetotestableasicdevices |