Standards for electronic imaging systems: proceedings of a conference held 28 February - 1 March 1991 San Jose, California
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE Optical Engineering Pr.
1991
|
| Schriftenreihe: | Critical reviews of optical science and technology
37 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VII, 246 S. Ill. |
| ISBN: | 0819405663 0819405671 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV005490649 | ||
| 003 | DE-604 | ||
| 005 | 19920825 | ||
| 007 | t | ||
| 008 | 920825s1991 a||| |||| 10||| engod | ||
| 020 | |a 0819405663 |9 0-8194-0566-3 | ||
| 020 | |a 0819405671 |9 0-8194-0567-1 | ||
| 035 | |a (OCoLC)24247083 | ||
| 035 | |a (DE-599)BVBBV005490649 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 050 | 0 | |a TK8315 | |
| 082 | 0 | |a 621.36/7 |2 20 | |
| 084 | |a ELT 534f |2 stub | ||
| 245 | 1 | 0 | |a Standards for electronic imaging systems |b proceedings of a conference held 28 February - 1 March 1991 San Jose, California |c Michael Nier ... eds. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE Optical Engineering Pr. |c 1991 | |
| 300 | |a VII, 246 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Critical reviews of optical science and technology |v 37 | |
| 650 | 4 | |a Image processing |x Standards |v Congresses | |
| 650 | 4 | |a Imaging systems |x Standards |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Nier, Michael |e Sonstige |4 oth | |
| 830 | 0 | |a Critical reviews of optical science and technology |v 37 |w (DE-604)BV005490642 |9 37 | |
| 856 | 4 | 2 | |m Digitalisierung TU Muenchen |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003438639&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-003438639 | ||
Datensatz im Suchindex
| _version_ | 1804119705331433472 |
|---|---|
| adam_text | Contents
vii
Preface
3
Standards for image input devices: review and forecast
D. L. Gilblom, Sierra Scientific Inc.
20
Image acquisition: quality control for document image scanners
R. Gershbock, Information International, Inc.
40
Color standards for electronic imaging
D. Q. McDowell, Eastman Kodak Co.
54
Preliminary review of imaging standards
V. Ren, Ramtek Corp.; D. J. Hatfield, IBM/Technical Computing
Systems; M. Deacutis, Eastman Kodak Co.
68
Evolving JPEG color data compression standard
J. L. Mitchell, IBM/Applications Solutions
Div.;
W.
В.
Pennebaker,
IBM/Thomas
J. Watson
Research
Ctr.
98 Standards
for electronic imaging for graphic arts systems
S. T. Dunn, P. M. Dunn, Dunn Technology, Inc.
113
Standards for electronic imaging for facsimile systems
S. J.
Urban, Delta Information Systems
146
Standards for flat panel display systems
J.
С
Greeson, Jr., IBM Corp.
159
Standardization efforts for the preservation of electronic imagery
P. Z. Adelseein, Rochester
Institute
of Technology; W. D. Storm,
Syracuse Univ.
180
Standardization of image quality measurements of medical x-ray
image
intensifier
systems
J. M.
Sandrik,
General Electric Medical Systems
207
Multimedia courseware in an open-systems environment:
a DoD strategy
L. A. Welsch, National Institute of Standards and Technology
221
Imagery technology database
M. E. CourtDt, Association for Information and Image Management;
M. Nier,
Eastman Kodak Co.
247
Author Index
|
| any_adam_object | 1 |
| building | Verbundindex |
| bvnumber | BV005490649 |
| callnumber-first | T - Technology |
| callnumber-label | TK8315 |
| callnumber-raw | TK8315 |
| callnumber-search | TK8315 |
| callnumber-sort | TK 48315 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 534f |
| ctrlnum | (OCoLC)24247083 (DE-599)BVBBV005490649 |
| dewey-full | 621.36/7 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36/7 |
| dewey-search | 621.36/7 |
| dewey-sort | 3621.36 17 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01534nam a2200373 cb4500</leader><controlfield tag="001">BV005490649</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19920825 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">920825s1991 a||| |||| 10||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819405663</subfield><subfield code="9">0-8194-0566-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819405671</subfield><subfield code="9">0-8194-0567-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)24247083</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV005490649</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK8315</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36/7</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 534f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Standards for electronic imaging systems</subfield><subfield code="b">proceedings of a conference held 28 February - 1 March 1991 San Jose, California</subfield><subfield code="c">Michael Nier ... eds.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE Optical Engineering Pr.</subfield><subfield code="c">1991</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII, 246 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Critical reviews of optical science and technology</subfield><subfield code="v">37</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Image processing</subfield><subfield code="x">Standards</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Imaging systems</subfield><subfield code="x">Standards</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nier, Michael</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Critical reviews of optical science and technology</subfield><subfield code="v">37</subfield><subfield code="w">(DE-604)BV005490642</subfield><subfield code="9">37</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung TU Muenchen</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003438639&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-003438639</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV005490649 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:30:26Z |
| institution | BVB |
| isbn | 0819405663 0819405671 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003438639 |
| oclc_num | 24247083 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | VII, 246 S. Ill. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | SPIE Optical Engineering Pr. |
| record_format | marc |
| series | Critical reviews of optical science and technology |
| series2 | Critical reviews of optical science and technology |
| spelling | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California Michael Nier ... eds. Bellingham, Wash. SPIE Optical Engineering Pr. 1991 VII, 246 S. Ill. txt rdacontent n rdamedia nc rdacarrier Critical reviews of optical science and technology 37 Image processing Standards Congresses Imaging systems Standards Congresses (DE-588)1071861417 Konferenzschrift gnd-content Nier, Michael Sonstige oth Critical reviews of optical science and technology 37 (DE-604)BV005490642 37 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003438639&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California Critical reviews of optical science and technology Image processing Standards Congresses Imaging systems Standards Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California |
| title_auth | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California |
| title_exact_search | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California |
| title_full | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California Michael Nier ... eds. |
| title_fullStr | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California Michael Nier ... eds. |
| title_full_unstemmed | Standards for electronic imaging systems proceedings of a conference held 28 February - 1 March 1991 San Jose, California Michael Nier ... eds. |
| title_short | Standards for electronic imaging systems |
| title_sort | standards for electronic imaging systems proceedings of a conference held 28 february 1 march 1991 san jose california |
| title_sub | proceedings of a conference held 28 February - 1 March 1991 San Jose, California |
| topic | Image processing Standards Congresses Imaging systems Standards Congresses |
| topic_facet | Image processing Standards Congresses Imaging systems Standards Congresses Konferenzschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003438639&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV005490642 |
| work_keys_str_mv | AT niermichael standardsforelectronicimagingsystemsproceedingsofaconferenceheld28february1march1991sanjosecalifornia |