Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques: papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Oxford u.a.
Pergamon Press
1991
|
| Schriftenreihe: | Vacuum
42,13 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben. - Einzelaufnahme eines Zs.-Heftes |
| Beschreibung: | S. 783 - 863 Ill., graph. Darst. |
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Datensatz im Suchindex
| _version_ | 1804119645764976640 |
|---|---|
| adam_text | VACUUM
TECHNOLOGY APPLICATIONS
AND ION PHYSICS
Volume 42/number
13/1991
Contents
ANALYSIS BY A COMBINATION OF ION-BEAM
(ACCELERATOR-BASED) AND SURFACE-SPECIFIC
TECHNIQUES
Papers from the IB-SA90 Conference
5 7
September
1990,
Namur, Belgium
AUTHORS
J P
Coad
R G
Dworschak,
T Laursen
and
J L Whitton
WVanderpoorten. P
De Moor,
P Schuurmans. R
Siebelink,
G Vancraeyest, J Vanhaverbeke,
L
Vermeeren,
L Vanneste, J
Wouters,
N Severijns, J
Vervier,
G
Goldring
and
R
Silverans
A Climent-Font, U Wätjen, H
Bax and
L Palmetshofer
F
Sommer,
P
Chevallier. H
Tapiero,
P Massiot, P Galie, L Silvestro, P Arizti
and D Piccot
S Reinke, D Rahmann and R Hippler
Y De Puydt, D
Leonard,
P
Bertrand,
Y
Novis,
M Chtaïb
and P Lutgen
P Courel, P Trocellier, M Mosbah,
N Toulhoat, J
Gösset.
P Massiot and
D Piccot
P Courel, N Toulhoat and M Cuney
J Paridaens, D
Segers.
M Dorikens
and L Dorikens-Vanpraet
S
Deckers,
F H P M Habraken and
J
W
Geus
D Decroupet. S
Mathot,
G Demortier
and G
Blaise
REGULAR PAPERS
U
S Tandon
and
B D
Pant
Sun Da-Ming
J L
Sullivan.
S O
Saied and
N
S Xu
BOOK REVIEW
NEW PATENTS
SOFTWARE SURVEY SECTION
ARTICLES
783
Introduction
785
Oxygen depth profiling in thin films using the 1( 0( He,
г)1ьО
nuclear reaction
789
In-beam nuclear polarization by ion beam surface interaction
795
Characterization of high-dose implants of Co and Cr in Si by
RBS
801
Comparison of PIXE and SXRF analysis for kinetic studies in
cell pharmacology of platinum and gold compounds
807
Light emission from sputtered atoms following ion
bombardment of polycrystalline
Al
and Cu targets
811 IVIultitechnique
approach of the surface analysis of fluorinated
polyethylene terephthalate
819
Combined use of electron
microprobe
analysis and nuclear
microanalysis for
Mg, AI
and Si determination in minerals and
glasses
821
Lithium distribution in minerals by nuclear microanalysis
823
Surface analysis with slow positrons
827
Oxidation of clean and Pt covered Ni(1
11 )
831
SIMS and NRA studies of surface contaminants in gold-rich
alloys
837
The characteristics of reactive ion etching of polysilicon using
ЅРб/Ог
and their interdependence
845
The effect of ion exchange on adsorption properties of a
1
3X
molecular sieve
849
Fast atom and ion surface studies leading to the development
of a time of flight fast atom scattering spectrometer
863
865
Published by
PERGAMON PRESS
ISSN 0042-207X
VACUAV
42(13) 781-870 (1991)
|
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| genre_facet | Konferenzschrift 1990 Namur |
| id | DE-604.BV005436784 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:29:29Z |
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| spelling | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium guest ed. J. P. Coad Oxford u.a. Pergamon Press 1991 S. 783 - 863 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Vacuum 42,13 Literaturangaben. - Einzelaufnahme eines Zs.-Heftes Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Namur gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Oberflächenphysik (DE-588)4134881-3 s 1\p DE-604 Ionenstrahl (DE-588)4162347-2 s 2\p DE-604 Coad, J. P. Sonstige oth Vacuum 42,13 (DE-604)BV002571861 42,13 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=003400704&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium Vacuum Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Ionenstrahl (DE-588)4162347-2 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4162347-2 (DE-588)4134881-3 (DE-588)1071861417 |
| title | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium |
| title_auth | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium |
| title_exact_search | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium |
| title_full | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium guest ed. J. P. Coad |
| title_fullStr | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium guest ed. J. P. Coad |
| title_full_unstemmed | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium guest ed. J. P. Coad |
| title_short | Analysis by a combination of ion-beam (accelerator-based) and surface-specific techniques |
| title_sort | analysis by a combination of ion beam accelerator based and surface specific techniques papers from the ib sa 90 conference 5 7 september 1990 namur belgium |
| title_sub | papers from the IB-SA 90 Conference, 5 - 7 September 1990, Namur, Belgium |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Ionenstrahl (DE-588)4162347-2 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Ionenstrahl Oberflächenphysik Konferenzschrift 1990 Namur |
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