Neural models and algorithms for digital testing:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Kluwer
1991
|
| Schriftenreihe: | The Kluwer international series in engineering and computer science
140 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XII, 184 S. graph. Darst. |
| ISBN: | 0792391659 |
Internformat
MARC
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| 100 | 1 | |a Chakradhar, Srimat T. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Neural models and algorithms for digital testing |c by Srimat T. Chakradhar ; Vishwani D. Agrawal ; Michael L. Bushnell |
| 264 | 1 | |a Boston u.a. |b Kluwer |c 1991 | |
| 300 | |a XII, 184 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
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| 500 | |a Literaturangaben | ||
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| 650 | 4 | |a Datenverarbeitung | |
| 650 | 4 | |a Automatic test equipment | |
| 650 | 4 | |a Digital integrated circuits |x Testing |x Data processing | |
| 650 | 4 | |a Logic circuits |x Testing | |
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Datensatz im Suchindex
| _version_ | 1804119633071964160 |
|---|---|
| any_adam_object | |
| author | Chakradhar, Srimat T. Agrawal, Vishwani D. Bushnell, Michael Lee |
| author_facet | Chakradhar, Srimat T. Agrawal, Vishwani D. Bushnell, Michael Lee |
| author_role | aut aut aut |
| author_sort | Chakradhar, Srimat T. |
| author_variant | s t c st stc v d a vd vda m l b ml mlb |
| building | Verbundindex |
| bvnumber | BV005425223 |
| callnumber-first | T - Technology |
| callnumber-label | TK7868 |
| callnumber-raw | TK7868.L6 |
| callnumber-search | TK7868.L6 |
| callnumber-sort | TK 47868 L6 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | DAT 717f ELT 468f |
| ctrlnum | (OCoLC)23582755 (DE-599)BVBBV005425223 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005425223 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:29:17Z |
| institution | BVB |
| isbn | 0792391659 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003392395 |
| oclc_num | 23582755 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-29T |
| physical | XII, 184 S. graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Kluwer |
| record_format | marc |
| series | The Kluwer international series in engineering and computer science |
| series2 | The Kluwer international series in engineering and computer science |
| spelling | Chakradhar, Srimat T. Verfasser aut Neural models and algorithms for digital testing by Srimat T. Chakradhar ; Vishwani D. Agrawal ; Michael L. Bushnell Boston u.a. Kluwer 1991 XII, 184 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science 140 Literaturangaben Circuitos integrados digitales - Pruebas - Procesamiento electrónico de datos Datenverarbeitung Automatic test equipment Digital integrated circuits Testing Data processing Logic circuits Testing Logische Schaltung (DE-588)4131023-8 gnd rswk-swf Digitales Messgerät (DE-588)4123064-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Algorithmus (DE-588)4001183-5 gnd rswk-swf Neuronales Netz (DE-588)4226127-2 gnd rswk-swf Digitaltechnik (DE-588)4012303-0 gnd rswk-swf Digitaltechnik (DE-588)4012303-0 s Prüftechnik (DE-588)4047610-8 s Neuronales Netz (DE-588)4226127-2 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Digitales Messgerät (DE-588)4123064-4 s Logische Schaltung (DE-588)4131023-8 s Algorithmus (DE-588)4001183-5 s Agrawal, Vishwani D. Verfasser aut Bushnell, Michael Lee Verfasser aut The Kluwer international series in engineering and computer science 140 (DE-604)BV023545171 140 |
| spellingShingle | Chakradhar, Srimat T. Agrawal, Vishwani D. Bushnell, Michael Lee Neural models and algorithms for digital testing The Kluwer international series in engineering and computer science Circuitos integrados digitales - Pruebas - Procesamiento electrónico de datos Datenverarbeitung Automatic test equipment Digital integrated circuits Testing Data processing Logic circuits Testing Logische Schaltung (DE-588)4131023-8 gnd Digitales Messgerät (DE-588)4123064-4 gnd Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Algorithmus (DE-588)4001183-5 gnd Neuronales Netz (DE-588)4226127-2 gnd Digitaltechnik (DE-588)4012303-0 gnd |
| subject_GND | (DE-588)4131023-8 (DE-588)4123064-4 (DE-588)4047610-8 (DE-588)4027242-4 (DE-588)4001183-5 (DE-588)4226127-2 (DE-588)4012303-0 |
| title | Neural models and algorithms for digital testing |
| title_auth | Neural models and algorithms for digital testing |
| title_exact_search | Neural models and algorithms for digital testing |
| title_full | Neural models and algorithms for digital testing by Srimat T. Chakradhar ; Vishwani D. Agrawal ; Michael L. Bushnell |
| title_fullStr | Neural models and algorithms for digital testing by Srimat T. Chakradhar ; Vishwani D. Agrawal ; Michael L. Bushnell |
| title_full_unstemmed | Neural models and algorithms for digital testing by Srimat T. Chakradhar ; Vishwani D. Agrawal ; Michael L. Bushnell |
| title_short | Neural models and algorithms for digital testing |
| title_sort | neural models and algorithms for digital testing |
| topic | Circuitos integrados digitales - Pruebas - Procesamiento electrónico de datos Datenverarbeitung Automatic test equipment Digital integrated circuits Testing Data processing Logic circuits Testing Logische Schaltung (DE-588)4131023-8 gnd Digitales Messgerät (DE-588)4123064-4 gnd Prüftechnik (DE-588)4047610-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Algorithmus (DE-588)4001183-5 gnd Neuronales Netz (DE-588)4226127-2 gnd Digitaltechnik (DE-588)4012303-0 gnd |
| topic_facet | Circuitos integrados digitales - Pruebas - Procesamiento electrónico de datos Datenverarbeitung Automatic test equipment Digital integrated circuits Testing Data processing Logic circuits Testing Logische Schaltung Digitales Messgerät Prüftechnik Integrierte Schaltung Algorithmus Neuronales Netz Digitaltechnik |
| volume_link | (DE-604)BV023545171 |
| work_keys_str_mv | AT chakradharsrimatt neuralmodelsandalgorithmsfordigitaltesting AT agrawalvishwanid neuralmodelsandalgorithmsfordigitaltesting AT bushnellmichaellee neuralmodelsandalgorithmsfordigitaltesting |