Testing and diagnosis of analog circuits and systems:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Van Nostrand Reinhold
1991
|
| Schlagworte: | |
| Beschreibung: | XIV, 284 S. graph. Darst. |
| ISBN: | 0442259328 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV005425088 | ||
| 003 | DE-604 | ||
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| 245 | 1 | 0 | |a Testing and diagnosis of analog circuits and systems |c ed. by Ruey-wen Liu |
| 264 | 1 | |a New York |b Van Nostrand Reinhold |c 1991 | |
| 300 | |a XIV, 284 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Circuitos analogicos |2 larpcal | |
| 650 | 4 | |a Analog electronic systems |x Testing | |
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Datensatz im Suchindex
| _version_ | 1804119632902094848 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV005425088 |
| callnumber-first | T - Technology |
| callnumber-label | TK7870 |
| callnumber-raw | TK7870 |
| callnumber-search | TK7870 |
| callnumber-sort | TK 47870 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4920 |
| classification_tum | ELT 238f ELT 443f |
| ctrlnum | (OCoLC)22305076 (DE-599)BVBBV005425088 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005425088 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:29:17Z |
| institution | BVB |
| isbn | 0442259328 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003392285 |
| oclc_num | 22305076 |
| open_access_boolean | |
| owner | DE-M49 DE-BY-TUM DE-29T DE-83 |
| owner_facet | DE-M49 DE-BY-TUM DE-29T DE-83 |
| physical | XIV, 284 S. graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Van Nostrand Reinhold |
| record_format | marc |
| spelling | Testing and diagnosis of analog circuits and systems ed. by Ruey-wen Liu New York Van Nostrand Reinhold 1991 XIV, 284 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Circuitos analogicos larpcal Analog electronic systems Testing Prüftechnik (DE-588)4047610-8 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Analogschaltung (DE-588)4122796-7 gnd rswk-swf Analoges System (DE-588)4122045-6 gnd rswk-swf Analogschaltung (DE-588)4122796-7 s Prüftechnik (DE-588)4047610-8 s DE-604 Analoges System (DE-588)4122045-6 s Test (DE-588)4059549-3 s Liu, Ruey-wen Sonstige oth |
| spellingShingle | Testing and diagnosis of analog circuits and systems Circuitos analogicos larpcal Analog electronic systems Testing Prüftechnik (DE-588)4047610-8 gnd Test (DE-588)4059549-3 gnd Analogschaltung (DE-588)4122796-7 gnd Analoges System (DE-588)4122045-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4059549-3 (DE-588)4122796-7 (DE-588)4122045-6 |
| title | Testing and diagnosis of analog circuits and systems |
| title_auth | Testing and diagnosis of analog circuits and systems |
| title_exact_search | Testing and diagnosis of analog circuits and systems |
| title_full | Testing and diagnosis of analog circuits and systems ed. by Ruey-wen Liu |
| title_fullStr | Testing and diagnosis of analog circuits and systems ed. by Ruey-wen Liu |
| title_full_unstemmed | Testing and diagnosis of analog circuits and systems ed. by Ruey-wen Liu |
| title_short | Testing and diagnosis of analog circuits and systems |
| title_sort | testing and diagnosis of analog circuits and systems |
| topic | Circuitos analogicos larpcal Analog electronic systems Testing Prüftechnik (DE-588)4047610-8 gnd Test (DE-588)4059549-3 gnd Analogschaltung (DE-588)4122796-7 gnd Analoges System (DE-588)4122045-6 gnd |
| topic_facet | Circuitos analogicos Analog electronic systems Testing Prüftechnik Test Analogschaltung Analoges System |
| work_keys_str_mv | AT liurueywen testinganddiagnosisofanalogcircuitsandsystems |