Digital circuit testing: a guide to DFT and other techniques
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
San Diego u.a.
Acad. Press
1991
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XI, 233 S. graph. Darst. |
| ISBN: | 0127345809 |
Internformat
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| 100 | 1 | |a Wang, Francis C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Digital circuit testing |b a guide to DFT and other techniques |c Francis C. Wang |
| 264 | 1 | |a San Diego u.a. |b Acad. Press |c 1991 | |
| 300 | |a XI, 233 S. |b graph. Darst. | ||
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Datensatz im Suchindex
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| author | Wang, Francis C. |
| author_facet | Wang, Francis C. |
| author_role | aut |
| author_sort | Wang, Francis C. |
| author_variant | f c w fc fcw |
| building | Verbundindex |
| bvnumber | BV005099016 |
| callnumber-first | T - Technology |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 468f |
| ctrlnum | (OCoLC)22984341 (DE-599)BVBBV005099016 |
| dewey-full | 621.381/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/5 |
| dewey-search | 621.381/5 |
| dewey-sort | 3621.381 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV005099016 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:22:43Z |
| institution | BVB |
| isbn | 0127345809 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-003128786 |
| oclc_num | 22984341 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | XI, 233 S. graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Acad. Press |
| record_format | marc |
| spelling | Wang, Francis C. Verfasser aut Digital circuit testing a guide to DFT and other techniques Francis C. Wang San Diego u.a. Acad. Press 1991 XI, 233 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Circuits intégrés numériques ram Test circuit intégré Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Digitalschaltung (DE-588)4012295-5 s Testen (DE-588)4367264-4 s DE-604 |
| spellingShingle | Wang, Francis C. Digital circuit testing a guide to DFT and other techniques Circuits intégrés numériques ram Test circuit intégré Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4012295-5 (DE-588)4367264-4 |
| title | Digital circuit testing a guide to DFT and other techniques |
| title_auth | Digital circuit testing a guide to DFT and other techniques |
| title_exact_search | Digital circuit testing a guide to DFT and other techniques |
| title_full | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_fullStr | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_full_unstemmed | Digital circuit testing a guide to DFT and other techniques Francis C. Wang |
| title_short | Digital circuit testing |
| title_sort | digital circuit testing a guide to dft and other techniques |
| title_sub | a guide to DFT and other techniques |
| topic | Circuits intégrés numériques ram Test circuit intégré Digital integrated circuits Testing Digitalschaltung (DE-588)4012295-5 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Circuits intégrés numériques Test circuit intégré Digital integrated circuits Testing Digitalschaltung Testen |
| work_keys_str_mv | AT wangfrancisc digitalcircuittestingaguidetodftandothertechniques |