VLSI Testing:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
North-Holland
1988
|
| Ausgabe: | 2. print. |
| Schriftenreihe: | Advances in CAD for VLSI
5 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | IX, 275 S. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV004823488 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 920430s1988 d||| |||| 00||| eng d | ||
| 035 | |a (OCoLC)180415854 | ||
| 035 | |a (DE-599)BVBBV004823488 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-20 |a DE-83 | ||
| 084 | |a ZN 4950 |0 (DE-625)157424: |2 rvk | ||
| 084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
| 245 | 1 | 0 | |a VLSI Testing |c ed. by T. W. Williams |
| 250 | |a 2. print. | ||
| 264 | 1 | |a Amsterdam u.a. |b North-Holland |c 1988 | |
| 300 | |a IX, 275 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Advances in CAD for VLSI |v 5 | |
| 500 | |a Literaturangaben | ||
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Williams, T. W. |e Sonstige |4 oth | |
| 830 | 0 | |a Advances in CAD for VLSI |v 5 |w (DE-604)BV001897464 |9 5 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-002967038 | ||
Datensatz im Suchindex
| _version_ | 1804118933305819136 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV004823488 |
| classification_rvk | ZN 4950 ZN 4952 |
| ctrlnum | (OCoLC)180415854 (DE-599)BVBBV004823488 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2. print. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01157nam a2200373 cb4500</leader><controlfield tag="001">BV004823488</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">920430s1988 d||| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)180415854</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV004823488</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-20</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4950</subfield><subfield code="0">(DE-625)157424:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI Testing</subfield><subfield code="c">ed. by T. W. Williams</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2. print.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam u.a.</subfield><subfield code="b">North-Holland</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 275 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Advances in CAD for VLSI</subfield><subfield code="v">5</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Williams, T. W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Advances in CAD for VLSI</subfield><subfield code="v">5</subfield><subfield code="w">(DE-604)BV001897464</subfield><subfield code="9">5</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-002967038</subfield></datafield></record></collection> |
| id | DE-604.BV004823488 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:18:10Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002967038 |
| oclc_num | 180415854 |
| open_access_boolean | |
| owner | DE-20 DE-83 |
| owner_facet | DE-20 DE-83 |
| physical | IX, 275 S. graph. Darst. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | North-Holland |
| record_format | marc |
| series | Advances in CAD for VLSI |
| series2 | Advances in CAD for VLSI |
| spelling | VLSI Testing ed. by T. W. Williams 2. print. Amsterdam u.a. North-Holland 1988 IX, 275 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in CAD for VLSI 5 Literaturangaben VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s DE-604 Williams, T. W. Sonstige oth Advances in CAD for VLSI 5 (DE-604)BV001897464 5 |
| spellingShingle | VLSI Testing Advances in CAD for VLSI VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4047610-8 |
| title | VLSI Testing |
| title_auth | VLSI Testing |
| title_exact_search | VLSI Testing |
| title_full | VLSI Testing ed. by T. W. Williams |
| title_fullStr | VLSI Testing ed. by T. W. Williams |
| title_full_unstemmed | VLSI Testing ed. by T. W. Williams |
| title_short | VLSI Testing |
| title_sort | vlsi testing |
| topic | VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | VLSI Prüftechnik |
| volume_link | (DE-604)BV001897464 |
| work_keys_str_mv | AT williamstw vlsitesting |