Holdings: Scanning force microscopy

Scanning force microscopy: with applications to electric, magnetic, and atomic forces

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Bibliographic Details
Main Author:	Sarid, Dror 1938- (Author)
Format:	Book
Language:	English
Published:	New York, NY [u.a.] Oxford Univ. Press 1991
Series:	Oxford series on optical sciences 2
Subjects:	Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie Tunneleffekt Elektronenmikroskop Abtastsystem
Physical Description:	XI, 253 S. Ill., graph. Darst.
ISBN:	0195062701

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MARC


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Record in the Search Index

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dewey-full	502/.8/2
dewey-hundreds	500 - Natural sciences and mathematics
dewey-ones	502 - Miscellany
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dewey-tens	500 - Natural sciences and mathematics
discipline	Allgemeine Naturwissenschaft Physik
format	Book
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id	DE-604.BV004806971
illustrated	Illustrated
indexdate	2024-07-09T16:17:56Z
institution	BVB
isbn	0195062701
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-002956927
oclc_num	246734465
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owner_facet	DE-12 DE-384 DE-19 DE-BY-UBM DE-91G DE-BY-TUM DE-83 DE-188
physical	XI, 253 S. Ill., graph. Darst.
publishDate	1991
publishDateSearch	1991
publishDateSort	1991
publisher	Oxford Univ. Press
record_format	marc
series	Oxford series on optical sciences
series2	Oxford series on optical sciences
spelling	Sarid, Dror 1938- Verfasser (DE-588)132453215 aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid New York, NY [u.a.] Oxford Univ. Press 1991 XI, 253 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Oxford series on optical sciences 2 Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Abtastsystem (DE-588)4129844-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Tunneleffekt (DE-588)4136216-0 s 2\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 3\p DE-604 Abtastsystem (DE-588)4129844-5 s 4\p DE-604 Oxford series on optical sciences 2 (DE-604)BV008283319 2 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Sarid, Dror 1938- Scanning force microscopy with applications to electric, magnetic, and atomic forces Oxford series on optical sciences Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Abtastsystem (DE-588)4129844-5 gnd
subject_GND	(DE-588)4127823-9 (DE-588)4252995-5 (DE-588)4274473-8 (DE-588)4136216-0 (DE-588)4014326-0 (DE-588)4129844-5
title	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_auth	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_exact_search	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_full	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_fullStr	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_full_unstemmed	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_short	Scanning force microscopy
title_sort	scanning force microscopy with applications to electric magnetic and atomic forces
title_sub	with applications to electric, magnetic, and atomic forces
topic	Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Abtastsystem (DE-588)4129844-5 gnd
topic_facet	Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie Tunneleffekt Elektronenmikroskop Abtastsystem
volume_link	(DE-604)BV008283319
work_keys_str_mv	AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces

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