Scanning force microscopy: with applications to electric, magnetic, and atomic forces
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY [u.a.]
Oxford Univ. Press
1991
|
| Schriftenreihe: | Oxford series on optical sciences
2 |
| Schlagworte: | |
| Beschreibung: | XI, 253 S. Ill., graph. Darst. |
| ISBN: | 0195062701 |
Internformat
MARC
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| 245 | 1 | 0 | |a Scanning force microscopy |b with applications to electric, magnetic, and atomic forces |c Dror Sarid |
| 264 | 1 | |a New York, NY [u.a.] |b Oxford Univ. Press |c 1991 | |
| 300 | |a XI, 253 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Oxford series on optical sciences |v 2 | |
| 650 | 4 | |a Microscopie à balayage à effet tunnel | |
| 650 | 4 | |a Surfaces (Physique) | |
| 650 | 4 | |a Scanning force microscopy | |
| 650 | 4 | |a Surfaces (Physics) | |
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Datensatz im Suchindex
| _version_ | 1804118918639386624 |
|---|---|
| any_adam_object | |
| author | Sarid, Dror 1938- |
| author_GND | (DE-588)132453215 |
| author_facet | Sarid, Dror 1938- |
| author_role | aut |
| author_sort | Sarid, Dror 1938- |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV004806971 |
| callnumber-first | Q - Science |
| callnumber-label | QC173 |
| callnumber-raw | QC173.4.S94 QH212.S32 |
| callnumber-search | QC173.4.S94 QH212.S32 |
| callnumber-sort | QC 3173.4 S94 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 6310 |
| classification_tum | PHY 136f |
| ctrlnum | (OCoLC)246734465 (DE-599)BVBBV004806971 |
| dewey-full | 502/.8/2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/2 |
| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV004806971 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:17:56Z |
| institution | BVB |
| isbn | 0195062701 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002956927 |
| oclc_num | 246734465 |
| open_access_boolean | |
| owner | DE-12 DE-384 DE-19 DE-BY-UBM DE-91G DE-BY-TUM DE-83 DE-188 |
| owner_facet | DE-12 DE-384 DE-19 DE-BY-UBM DE-91G DE-BY-TUM DE-83 DE-188 |
| physical | XI, 253 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Oxford series on optical sciences |
| series2 | Oxford series on optical sciences |
| spelling | Sarid, Dror 1938- Verfasser (DE-588)132453215 aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid New York, NY [u.a.] Oxford Univ. Press 1991 XI, 253 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Oxford series on optical sciences 2 Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Abtastsystem (DE-588)4129844-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Tunneleffekt (DE-588)4136216-0 s 2\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 3\p DE-604 Abtastsystem (DE-588)4129844-5 s 4\p DE-604 Oxford series on optical sciences 2 (DE-604)BV008283319 2 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sarid, Dror 1938- Scanning force microscopy with applications to electric, magnetic, and atomic forces Oxford series on optical sciences Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Abtastsystem (DE-588)4129844-5 gnd |
| subject_GND | (DE-588)4127823-9 (DE-588)4252995-5 (DE-588)4274473-8 (DE-588)4136216-0 (DE-588)4014326-0 (DE-588)4129844-5 |
| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd Tunneleffekt (DE-588)4136216-0 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Abtastsystem (DE-588)4129844-5 gnd |
| topic_facet | Microscopie à balayage à effet tunnel Surfaces (Physique) Scanning force microscopy Surfaces (Physics) Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie Tunneleffekt Elektronenmikroskop Abtastsystem |
| volume_link | (DE-604)BV008283319 |
| work_keys_str_mv | AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces |