Proceedings: 1991, January 29 - 31
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York, NY
IEEE
1991
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XX, 623, 75 S. zahlr. Ill. u. graph. Darst. |
| ISSN: | 0149-144X |
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| 111 | 2 | |a Reliability and Maintainability Symposium |d 1991 |c Orlando, Fla. |j Verfasser |0 (DE-588)5059513-1 |4 aut | |
| 245 | 1 | 0 | |a Proceedings |b 1991, January 29 - 31 |c Annual Reliability and Maintainability Symposium |
| 264 | 1 | |a New York, NY |b IEEE |c 1991 | |
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Datensatz im Suchindex
| _version_ | 1804118912546111488 |
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| adam_text | Table
of Contents
Past Symposia
.........................................................
cover
2
Management Committee, Board of Directors, Advisory Board
.............................
iii
ГЛе
Ρ
.
JC
-
JtfcrJ&J
хто у
Atns&ix-cl
The P. K.
McElroy Award
for
1990
Best Paper
...................................
v
Activities Not Otherwise Listed In This Proceedings
............................... xvii
Author Index For This Proceedings
............................................ xix
ЗА
-
Panel: Reliability
&
Maintainability During Tight Times
Moderator: John Ingram-Cotton
-
TRW
Written discussion
......................................................... 1
■
William
С
Kleinhofer, Charles C. Packard, Robert W. Thomas, Edmund J. Westcott
3B
-
Supportability: The Key to System Effectiveness
Moderator: Clarence
N.
Meese Jr.
-
Army Belvoir RD&E Center
Evaluating production readiness: Improving returns on research
&
development investment
........ 4
•
Robert W.
Benzin,
Steven R. Cohen, Francisco Munoz-Rovira
Analyzing the effect of installing diagnostic equipment in a manufacturing cell
............... 10
•
Anil Lahoti, William J. Kennedy
Space-shuttle airframe inspection trend-analysis report
............................... 15
•
Bonnie K. Stone, Harold S.
Issen
Analysis of launch-site processing effectiveness for the space-shuttle 26R payload
............ 20
■
Carlos
A. Flores,
Robert E.
Heuser,
Richard E. Pepper Jr., Anthony M. (Mac) Smith
3C
-
Will It Work When You Push the Button? Availability in the Commercial World
Moderator: Daniel D. Bell
-
Martin Marietta Strategic Systems Company
Reliability demonstration of a high-reliability disk drive
.............................. 30
■
U. Daya Pereia
Telecommunication-network dependability. A baseline on local-exchange network availability
....... 39
•
Clinton M. Hamilton
Maintenance scheduling for critical parts of aircraft
................................. 44
■
Nasser Sanatgar
Fard,
Emanuel Melachrinoudis
High-reliability fault-tolerant 16-Mbit memory chip
................................... 48
•
Charles H.
Stapper,
John A. Fifield, Howard L.
Kalter
Analytic
&
operational considerations of electric-system reliability
....................... 57
■
Robert A. Kramer
4A
-
Management for Reliability
&
Maintainability
-
I
Moderator: Richard
F. Hahn -
Unisys
A model for managing the cost of reliability
....................................... 64
■
Raymond W. Sears Jr.
Investing in product assurance to ensure that: BETTER is not the enemy of GOOD
............... 70
•
Douglas P.
Eberhard,
Mark Visbisky, Kenneth
С
Syracuse
Four decades of reliability experience
........................................... 76
■
Ralph E. Kuehn
Weapon-system reliability
&
maintainability: Increasing their visibility with decision makers
...... 82
•
Richard W. Price
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
xi
4В
-
Keeping Systems Up
&
Running: Maintainability
Moderator: Marvin
A. Pinard
-
Lockheed
Missiles
&
Space Co.
Trend analysis of repair times
................................................. 85
•
Karen E. Ellis, Gregory J. Gibson
Graphical analysis of ill-collected interval data for a repairable system in vehicles
........... 93
•
Cheng Julius Wang
Keep the lamps down low
..................................................... 93
•
Glen E.
Benz
Using reliability-centered maintenance to support corporate TQM objectives
.................. 101
»
Anthony M. (Mac) Smith, Glenn E. Hinchcliffe, Joseph E. Wojtisek, Frank W. Voehl
4C
-
Reliability
&
Maintainability Simulation
Moderator: Jerrell T. Stracener
-
LTV Aerospace and Defense Co.
A simulation model for risk assessment of turbine wheels
.............................. 108
•
Fays sal M. Safie,
Richard T. Hage
Simulation of commercial-aircraft reliability
....................................... 112
•
Weimin Yang, Yuan Zhu, Qingci
Tu, Yixing
Sneng
Dependability modeling for computer systems
....................................... 120
•
David I.
Heimann,
Nitin Mittal, Kishor S. Trivedi
Reliability
&
availability modeling of coupled communication networks: A simplified approach
...... 129
•
Martin L. Snooman,
Eladio R.
Cortes
5A
-
Management for Reliability
&
Maintainability
-
II
Moderator: Anthony M. (Mac) Smith
-
AMS
Associates
Reliability, maintainability, supportability initiatives: Contributing to the competitive edge
....... 137
•
Jerrell T. Stracener, James E. Breneman
Evaluation of spacecraft product-assurance requirements and flight-performance history
......... 149
■
Charles C. Gonzalez, Valerie
С
Thomas, Jonathan M. Stone
Four decades of reliability progress
............................................. 156
•
C. Raymond Knight
R&M task requirements for research
&
development programs
............................. 161
•
John A.
Hartman,
James H. Whitt
How we put reliability tools into the hands of designers
............................... 168
•
Tyrone Jackson
5B
-
Air
&
Space Systems
Moderator: Deborah Hall
-
The Aerospace Corporation
Improved techniques for cost-effective electronics
................................... 174
■
Charles T· Leonard, Michael G. Pecnt
Lower bound on reliability for Weibull distribution when shape parameter is not estimated accurately
183
•
Zhaofeng Huang, Albert A. Porter
Space structures: Design criteria for meteriod-damage tolerance
.......................... 190
•
Hiroshi Otani
Cause-consequence analysis of a generic space-station computer system
.................... 196
•
John Pauperas
5C
-
Reliability Tools: How Important Are They?
Moderator: Dennis R. Hoffman
-
Texas Instruments Inc.
R&H
&
supportability analysis integration into conceptual
&
preliminary weapon-system design phases
202
•
Bruce
A. Bordelon
Predicting the reliability of new products at IBM
.................................... 208
■
John S. Usher, Suraj M. Alexander, John D. Thompson
Computer-aided reliability using finite-element methods
............................... 214
•
David A. Followell, William J.
Bocchi
Jr.,
Salvator
L.
Liguore,
Rigo
Perez, Wilson D.
Yates
III
An alternative method for preparing FMECAs
........................................ 222
•
Ronald D. Sexton
The mixed-exponential failure process
........................................... 226
•
Frank McNolty, William E. Sherwood,
Jean Mirra
xii 1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
6А
-
Failure Modes, Effects, and Critlcality Analysis (FMECA)
Moderator: Alfred M. Stevens
-
Lockheed Space Operations Company
FMECA: An integrated approach
................................................. 235
•
Puran
Luthra
Conditional expectations in the evaluation of fault-tolerant systems
...................... 242
•
Barry W. Johnson, Julia Pet-Edwards, Andrew J. Schwab
An improved FMEA methodology
................................................. 248
•
Chakib Kara-Zaitri, Alfred Zelma Keller,
Imre
Barody, Paulo V. Fleming
FMECA: The right way
....................................................... 253
•
Barry Thomas McKinney
A unified approach to failure mode, effects
&
criticality analysis (FMECA)
................... 260
•
Benjamin
С
Wei
6B
-
Panel: The Impact of Product Reliability on Return-on-Investment
Moderator: Tilak C. Sharma
-
Boeing Commercial Airplane Group
Written discussion
......................................................... 272
•
A. A. (Sandy) Aitken, Richard L.
Bonis,
Barry C. Latter, Louis J.
Mancini,
Tilak
С
Sharma
6C
-
Return-on-Investment from Safe Products
Moderator: Bert F. Kremp
-
Martin Marietta Missile Systems Company
Zonal analysis: The final step in system-safety assessment
............................. 277
•
Richard E. Caldwell, David B. Merdgen
A technique for proper design and impact analysis of event-sequencing for safety
&
availability
. . . 280
•
Ajay
Ξ.
Agarwala
Investment return on improved product safety
...................................... 285
•
James H. Wiggins
Software-safety analysis in heterogeneous multiprocessor control systems
................... 290
•
Timothy J. Shimeall, Richard J. McGraw, Janet A. Gill
8A
-
Reliability Growth
&
Testing
Moderator: James E. Breneman
-
Pratt
&
Whitney Aircraft
On the notion of activation energy in reliability: Arrhenius, Eyring, and thermodynamics
......... 295
•
David J. Klin
ger
Dynamic reliability prediction: How to adjust modeling and reliability growth?
................ 301
•
Gerard
Collas
Reliability testing of semiconductor devices in a humid environment
....................... 307
•
Marius
Bazu,
Mihai Tazlauanu
Modeling
&
monitoring the decay of equipment reliability
................................ 312
•
Paul Ritchie
Reliability-growth test-management for product assurance within the automotive-component industry
. 317
•
John
Bieda
A Bayes
attribute reliability-growth model
......................................... 322
•
Thomas A. Mazzuchi, Refik Soyer
8B
-
Warranties: Is Your Product As Good As You Claim?
Moderator: James R. Brennan
-
Texas Instruments Inc.
Warranties: What are they? What do they really cost?
................................. 326
•
Toby M.
Berke,
Nicholas
A. Zaino
Jr.
Warranty cost-risk analysis
................................................... 332
•
Donald
N.
Isaacson, Selina Reid, James R. Brennan
Statistical analysis of field data for aircraft warranties
.............................. 340
•
Mary J. Lakey
Methodology for assessing the economics of a reliability-assurance warranty program (EAWP)
...... 345
•
Richard H. Shupe, John Driessnack
A new methodology for instrumentation of performance vis-a-vis warranty requirements
.......... 352
•
Jamés K.
Story
Improved reliability-predictions for commercial computers
.............................. 357
·* N.
Keith Hergatt
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
xiii
8C
-
Software
Tools for Reliability
&
Maintainability
Moderator: Donna K. Cover
-
Computer Sciences Corp.
An automated environment for optimizing the design of fault-tolerant systems
................ 360
■
Philip S. Babcock IV, Gene Rosen, Jeffrey J. Zinchuk
Micro
Omnivore:
The ultimate R&M evaluation tool
.................................... 368
-
Neal F. Chamblee, Walter F. Huebner, Philip J. Szydlowski
Survivability analysis of complex computer-networks with heterogeneous link-capacities
......... 374
•
Suresh
Rai, Sieteng
Soh
Integrated software-tool set for design
&
analysis of electronic hardware
................... 380
■ ·
Donald R.
Nilson
Automating reliability-prediction and derating-analysis: An example of simultaneous engineering
. . . 384
•
Loretta
Arellano, Irving Doshay
An engineering-information-system for computer-aided acquistion
&
logistic support
(CALS)
phase I
. . 391
•
Leszek
M.
Dacko, Andrew P. Skorupski, Randall J. Kapuscinski
9A
-
Advances in Logistics Engineering
Moderator: Robert A. Butler
-
Systems Exchange
Two-level maintenanace: How do you get there?
...................................... 397
•
George Lee Daugherty Jr.
Reliability allocation with partial redundancy
...................................... 400
•
David R. Nowicki
Field reliability vs predicted reliability: An analysis of root causes for the difference
......... 405
•
Phillip E. Miller, Richard I. Moore
The effect of redundancy on the requirements for logistic support
........................ 411
•
Thomas E. Wing, Larry H. Crow, G. Thomas Dreckman
9B
-
Reduce Costs: Improve the Reliability
&
Maintainability of Software
Moderator: Wayne T. Reiersen
-
Princeton University
Reliability prediction, in the conceptual phase, of a processor system with its embedded software
... 416
■
Halsey
Đ.
Chenoweth
The cost of testing software
.................................................. 423
•
Robert L. Vienneau
Reliability-demonstration testing for discrete-type software products
...................... 428
•
Hiroaki Sandoh, Kiyoshi Sawada
Cost-effective software-quality
................................................ 433
•
Samuel J. Keene Jr.
10A
-
Mechanical Reliability
Moderator: Joseph J. Pucilowski
-
Army Communications
&
Electronics Command
Analysis of reliability data for mechanical systems
.................................. 438
•
William B. Clark
An abrasive-wear model for undersea iightguide cable
................................. 442
•
Percy S. Wu
Mechanical-strength reliability evaluation using an iterative approach
..................... 446
•
Thien-My
Dao,
Zhaoheng Liu, Mounir Massoud
Printed-wiring-board solder-joint fatigue-life calcuations under thermal
&
vibration loading
...... 451
•
Donald B. Barker, Abhijit Dasgupta, Michael G. Pecht
10B
-
International Standards
Moderator: Joseph W, Foster III
-
Texas A&M University
Statistical methods for standards in the 21-st century
................................ 460
•
H. Claudio Benslcl
IEC
300î
The dependability counterpart of ISO
9000 ................................... 463
•
Kjell Strandberg
Progress in international standardization of verification
&
evaluation procedures
............. 468
•
Jan L. Rise
New international standards on reliability growth
.................................... 478
■
Larry H. Crow
Xiv 1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
IOC -
Experience and Lessons-Learned from Implemented Reliability Programs
Moderator: Halsey B. Chenoweth
-
Westinghouse
Electric Corp.
A successful program for missile reliability
....................................... 481
■
Gerald P. Mettler, Paul D. Towner III
An R&M
2000
success story: The ALR-56M
.......................................... 489
•
Louis M.
Nevoia
Jr.
Cost effectiveness of environmental stress screening (ESS): A case history
.................. 494
•
Amber
Lanier Nagle
Reliability growth for Expendable Mobile ASW Training Target (EMATT): A 1-shot device
........... 497
•
Philip E. Higgins, Augustus Constantinides
Verifying reliability of solid rocket motors at minimum cost
............................. 502
•
James
Ekström, Alan
Allred
HA
-
Methodologies for Reliability Screening
Moderator: Thomas L. Landers
-
University of Arkansas
A high-reliability undersea lightwave repeater
..................................... 509
•
Armando Cabrera, Shirish
N.
Kher,
Elin C. Upperco
Design-for-reliabllity through durability analysis
................................... 516
■
Wilbur W. Bhagat, Bruce
A. Tagg
Random-vibration testing for commercial computers
................................... 521
■
Robert A.
Frey
Case study: Application of contemporary reliability tools to the development of retrofit electronics
. 525
•
Dennis L. Duncan
Latent-failure risk estimates for computer control
................................... 531
•
William R. Dunn,
Rolfe
A. Folsom, Owen R. Green
Statistical modeling for particle impact noise detection testing
.......................... 536
•
Richard R. Prairie, William J.
Zimmer
Development
&
product integration of a reliable optoelectronic system using Taguchi methods
...... 541
•
Richard B.
Dingwall
UB
-
Reliability
&
Maintainability and Total Quality Management (TQM)
Moderator: Jack V. Lavery
-
Litton Laser Systems
Implementing total quality management (TQM) in reliability
&
maintainability
.................. 547
•
James
N.
Yoo, George Smith II
R&M in the integrated product-development process
................................... 551
■
Kenneth P. LaSala
Maximizing return-on-investment (ROD by minimizing process variability
.................... 559
•
Maliik Arjunan
The key to gaining the competitive edge: Process management
............................ 565
•
George J. Hudak
Total quality management (TQM) in US DoD electronics acquisition
......................... 571
•
Wilson D.
Yates
III, Robert R. Johnson
Product-assurance integration in the microwave tube business
........................... 578
•
Daniel J. O Leary
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
xv
ИС
-
Modeling for Reliability Assurance
&
Estimation
Moderator: John L. Stevenson
-
INTELSAT
Bayes
reliability modeling of a multi-state consecutive-k-out-of-niF system
.................. 582
•
Meir Haim, Ze ev Porat
An error bound for instantaneous coverage
........................................ 587
■
Allan L. White
On the design of component-test plans based on system-reliability objectives
................ 592
•
Robert G. Easterling,
Mainak
Mazumdar, Floyd W. Spencer
Reliability analysis of artificial neural networks
.................................... 598
■
Joanne Bechta Dugan, James W. Watterson
Analysis of contaminated field-failure data for repairable systems
........................ 604
•
Christian Kornerup
Hansen,
Poul Thyregod
Fault-tree models for fault-tolerant hypercube multiprocessors
.......................... 610
•
Mark A. Boyd, Jesus O. Tuazon
The influence of maintenance-system reliability
&
maintainability on plant availability
.......... 615
•
Blynn E. Prince, M. Jonathan Haire
CUMULATIVE INDEXES
(1980 - 1991)
Cumulative Indexes (Explanations)
............................................
ex
- 1
Proceedings Price List for
1991 .............................................
ex
- 1
Cumulative Author Index
.................................................
ex
- 2
Cumulative Institution Index
..............................................
ex
- 10
Cumulative Key Word Index
...............................................
ex
- 15
Previous Tables of Contents
...............................................
ex
- 33
ADDITIONAL INFORMATION
1991
Exhibitors
........................................................
ex
- 70
1992
Exhibition
........................................................
ex
- 72
1992
Call for Papers
....................................................
ex
- 73
Cosponsors
...........................................................
ex
- 76
Future Symposia
-
Dates and Places
.........................................
cover
3
1992
Symposium
-
General Information
.......................................
cover
4
1992
Symposium
-
Brief Call For Papers
......................................
cover
4
Proceedings Price List for
1991 .............................................
cover
4
О О О
»91
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
Activities Not Otherwise Listed In This Proceedings
John J. Hudiberg
Chair n Emeritus
Florida Power
&
Light Co.
ЗА
-
Panel
John Ingram-Cotton
* ·
DSG
·
TRW
Darold Griffin
· P.A.
Deputy for Research, Development
&
Acquisition
·
HQ Army Materiel Command
William Kleinhofer
·
Commercial/General Products
Div.
·
IBM Corporation
Charles C. Packard
·
Unisys Corporation
Robert Thomas, PhD
·
Rome Air Development Center
Edmund J. Westcott
·
T.D. Deputy Chief of Staff, Engineering
·
HQ US Air Force Systems Command
у
t
of JP
лго
<3
и
o· t JR&
2
Ј.&£>Л
JL JL t y on
i?etujrn on JC
ri s-f=>Ě!
tr.m&ntz
6B
-
Panel
Tilak C. Sharma
* ·
Principal
Engineer, R&M Engineering
·
Boeing
Commercial Airplane
Group
A. A.
(Sandy)
Aitken
·
Head, Operations
&
Customer
Service;
Product Support
CEG
·
Rolls-Royce
ріс
Richard
L.
Bonis
·
Chief,
Systems
Analysis; Garrett Auxiliary Power
Div.
·
Allied Signal Aerospace Company
Barry C. Latter
·
Chief, R&M Engineering
·
Boeing Commercial Airplane Group
Louis J.
Mancini
·
Director, Maintenance Process Automation
·
United Airlines
Advisoiry
ЈЗо&згеЗ
Pane J.
Communicating the Value of
BSłi
to Senior Management
Martin Meth
* ·
Director, Weapon Support
IG ·
Office of As St. Sec. Defense (Production
&
Logistics), US DoD
Jack V. Lavery
·
Vice President, Product Assurance
·
Litton Laser Systems
Scott L. Shumway
·
V.P.
&
Director, Quality
·
Motorola Semiconductor Products
LTG Billy Thomas
·
D.C.G. for Research, Development
&
Acquisition
·
US Army Materiel Command
Gus A. Vassiliades
·
Director, Manufacturing Product
&
Process Technology
·
IBM Corporation
The Personal
Siđe
of Quality
Robert Galvin
Chair n of Executive Committee
Motorola Inc.
*
Moderator
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
xvii
iV«a
ŕ J
«r» n
га
1
ζ^>
u
^t
2
.i. ir
y
9C
-
Panel
f* J.
η η
*э
z-
¿st
William
С
Quinn
* ·
Harnischfeger Institute
John F. Cooney
·
Mgr.
Nat l Quality Award Office
·
Xerox Corp. Business Products
&
Systems
Jack H. Fooks
·
VP
Quality
&
Productivity
·
Westinghouse
Electric Corporation
Ruth
Haines,
PW
·
D.Dir. Baldrige Nat l Quality Award Office
·
Nat l Inst. of Standards
&
Technology
William Smith
·
VP
&
Service Quality
Mgr.
·
Motorola Inc.
Michael E. Spiess
·
Vice President
·
Wallace Company
*
Moderator
Tu t,
<э
J JSr
? ¿3
-J-
ОЈГЗ
S
The Tutorial NtDtes for these Sessions are available separately.
See Price Lint on page cx-1 or on back cover.
Basic Fault-Tree Analysis
Basic Logistics
Basic Reliability
Environmental Stress Screening
Modeling Advanced Fault-Tolerant Systems
with HARP S.
Design to Cost, Life-Cycle Cost
Stochastic Modeling of Realistic Systems
with the Monte Carlo Method
Mechanical-System Reliability
Practical Reliability Engineering
&
Management
Reliability of Repairable Systems
Probabilistic Models
&
Statistical Methods
in Reliability
System Safety
Understanding Part Failure-Mechanisms
James M.
Koren
Richard
Α.
Romer
Gus Constantinides
Patrick
C. Larter
Joanne
В.
Dugan
J.
Bavuso
&
M.
A. Boyd
Ben Blanchard
Ari
Dubi
Richard
Doyle
Ralph Evans
Harold
Ascher
Lawrence Leemis
Thomas Janicik
David Deroian
Science Applications Int l Corp.
SEA Inc.
— ManTech
AC
Sciences Ltd.
Sacramento Air Logistics Ctr.
Duke
University
Virginia Tech
Ben Gurion
University
Doyle & Associates
Product Assurance Consultant
Naval Research
Laboratory
University of Oklahoma
Science Applications Int l Corp.
Westinghouse
Electric Corp.
XV1U
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
Author Index
(Lists Page Numbers For Each Author In This Proceedings)
A— A —-A.
Agarwala, Ajay
S
....... 280
Aitken, A. A. (Sandy)
.... 272
Alexander, Suraj
M
...... 208
Allred, Alan .......... 502
Arellano,
Loretta
...... 384
Arjunan, Maliik
....... 559
Babcock
IV,
Philip
S
..... 360
Barker, Donald
В
....... 451
Barody,
Imre
......... 248
Bazu, Marius
......... 307
Benski,
H. Claudio
...... 460
Benz,
Glen
E
.......... 98
Benzin, Robert W. ...... 4
Berke,
Toby
M
......... 326
Bhagat, Wilbur
W
....... 516
Bieda,
John
.......... 317
Bocchi
Jr.,
William
J
..... 214
Bonis, Richard
L
....... 272
Bordelon,
Bruce A
...... 202
Boyd, Mark
A..........
610
Breneman, James E. ..... 137
Brennan, James
R
....... 332
C, ŕ 1*
__
t
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Cabrera,
Armando
...... 509
Caldwell,
Richard E
..... 277
Chamblee, Neal
F
....... 368
Chenoweth, Halsey
В
..... 416
Clark, William
В
........ 438
Cohen,
Steven
R........
4
Collas,
Gerard
........ 301
Constantinides,
Augustus
. 497
Cortes,
Eladio R.
...... 129
Crow, Larry
H......
411, 478
D —D —D
Dacko,
Leszek
M
........ 391
Dao,
Thien-My
........ 446
Dasgupta, Abhijit
...... 451
Daugherty Jr., George
Lee
397
Dingwall, Richard
В.....
541
Doshay, Irving ........ 384
Dreckman,
G.
Thomas .... 411
Driessnack, John ...... 345
Dugan, Joanne Bechta . . . 598
Duncan,
Dennis
L
....... 525
Dunn,
William
R........
531
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Easterling, Robert
G
..... 592
Eberhard,
Douglas
P
..... 70
Ekström, James
........ 502
Ellis, Karen
E
......... 85
F*— F — F
Fard, Nasser Sanatgar
... 44
Fifield, John A
........ 48
Fleming,
Paulo V
....... 248
Flores, Carlos A.
...... 20
Followell, David A
...... 214
Folsom,
Rolfe
A
........ 531
Frey,
Robert A
......... 521
G — G — C3
Gibson, Gregory J.
..... 85
Gill, Janet A
.......... 290
Gonzalez, Charles
С
.... 149
Green, Owen
R
......... 531
Griffin, Darold
........ 1
__
J
t
__
Hage,
Richard T
........ 108
Haim, Meir
........... 582
Haire, M.
Jonathan
..... 615
Hamilton, Clinton
M.
.... 39
Hansen,
Christian
Kornerup 604
Hartman,
John A
........ 161
Heimann,
David 1
....... 120
Hergatt,
N.
Keith
...... 357
Heuser,
Robert
E
....... 20
Higgins, Philip
E.......
497
Hinchcliffe, Glenn
R
..... 101
Huang, Zhaofeng
....... 183
Hudak, George J
........ 565
Huebner, Walter
F
...... 368
I — X — I
Isaacson, Donald
N...... 332
Issen,
Harold
S
........ 15
СГ —
J —
СГ
Jackson, Tyrone
....... 168
Johnson, Barry
W
....... 242
Johnson, Robert
Б.
..... 571
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Kalter,
Howard
L.......
48
Kapuscinski, Randall J.
. . 391
Kara-Zaitri, Chakib
..... 248
Keene Jr., Samuel J
..... 433
Keller, Alfred Zelma
.... 248
Kennedy, William J
...... 10
Kher, Shirish
N........ 509
Kleinhofer, William
С
... 1
Klinger,
David
J
....... 295
Knight,
C.
Raymond
..... 156
Kramer, Robert A
....... 57
Kuehn, Ralph
E
........ 76
L —L —L
Lahoti,
Anil ..........
10
Lakey,
Mary J
......... 340
LaSala,
Kenneth P
...... 551
Latter,
Barry
С
........ 272
Leonard, Charles
T......
174
Liguore,
Salvator L
..... 214
Liu, Zhaoheng
........ 446
Luthra,
Puran
........ 235
M — M — M
Mancini,
Louis
J
....... 272
Massoud, Mounir
....... 446
Mazumdar, Mainak
...... 592
Mazzuchi, Thomas A.
.... 322
McGraw, Richard J
...... 290
McKinney, Barry Thomas
. . 253
McNolty, Frank
........ 226
Melachrinoudis,
Emanuel
. . 44
Merdgen, David
В
...... . 277
Mettler,
Gerald
P.......
481
Miller, Phillip
E
....... 405
Mirra, Jean
.......... 226
Mittal, Nitin ......... 120
Moore, Richard
1
....... 405
Munoz-Rovira, Francisco . 4
N — N —
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Nagle, Amber Lanier .... 494
Nevoia
Jr.,
Louis
M.·
.... 489
Nilson,
Donald
R
....... 380
Nowicki, David
R.......
400
О —О —О
O Leary, Daniel J
....... 578
Otani, Hirosni
........ 190
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
XIX
Packard, Charles
С
...... 1
Pauperas,
John
........ 196
Pecht,
Michael
G.
... 174, 451
Pepper Jr., Richard
E.
... 20
Perera,
U.
Daya
.......
ЗО
Perez,
Rigo
.......... 214
Pet-Edwards,
Julia ..... 242
Porát, Ze ev
.......... 582
Porter, Albert
A
....... 183
Prairie,
Richard
R......
536
Price,
Richard
W
....... 82
Prince, Blynn
E........
615
R —R —K
Rai, Suresh
.......... 374
Reid,
Seiina .......... 332
Rise,
Jan L
........... 468
Ritchie, Paul
......... 312
Rosch, Gene
.......... 360
S — S — S
Safie, Fayssal
M
....... 108
Sandoh, Hiroaki
....... 428
Sawada, Kiyoshi
....... 428
Schwab, Andrew
J
....... 242
Sears Jr., Raymond W.
... 64
Sexton, Ronald
D
....... 222
Sharma, Tilak
С
........ 272
Sheng, Yixing
......... 112
Sherwood, William
E
..... 226
Shimeall, Timothy
J
..... 290
Shooman, Martin L.
..... 129
Shupe, Richard
H
....... 345
Skorupski, Andrew
P
..... 391
Smith, Anthony M. (Mac)
20, 101
Smith II, George
....... 547
Soh, Sieteng
......... 374
Soyer, Refik
......... 322
Spencer, Floyd
W
....... 592
Stapper,
Charles
H......
48
Stone, Bonnie K.
....... 15
Stone, Jonathan
M
...... 149
Story, James
К
......... 352
Stracener, Jerrell
T
..... 137
Strandberg, Kjell
...... 463
Syracuse, Kenneth
С.....
70
S2yđlowski,
Philip
J
..... 368
X —T —T
Tagg,
Bruce A
......... 516
Tazlauanu,
Mihai
....... 307
Thomas, Robert
W
....... 1
Thomas, Valerie C.
..... 149
Thompson, John
D
....... 208
Thyregod,
Poul
........ 604
Towner III, Paul
D
...... 481
Trivedi, Kishor
S
....... 120
Tu, Qingci
........... 112
Tuazon, Jesus
О........
610
U —U—U
Upperco, Elin C
........ 50 9
Usher, John
S
......... 208
v — v — v
Vienneau,
Robert
L
...... 42 3
Visbisky,
Mark
........ 70
Voehl, Frank
W
........ 101
Ví —
W —
Ví
Wang, Cheng Julius
..... 93
Watterson, James
W
...... 598
Wei, Benjamin
С
........ 260
Westcott, Edmund
J
...... 1
White, Allan
L
......... 587
Whitt, James
H
......... 161
Wiggins, James H.
...... 285
Wing, Thomas E.
....... 411
Wojtisek, Joseph
E
...... 101
Wu, Percy
S
........... 442
Y—Y — Y
Yang, Weimin ......... 112
Yates
III,
Wilson D. . . 214. 571
Yoo, James N
.......... 547
__
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Zaino
Jr., Nicholas A.
... 326
Znu, Yuan
........... 112
Zimmer,
William
J
....... 536
Zinchuk, Jeffrey
J
...... 360
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<>
XX
1991
PROCEEDINGS Annual RELIABILITY AND MAINTAINABILITY Symposium
|
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| author_corporate | Reliability and Maintainability Symposium Orlando, Fla |
| author_corporate_role | aut |
| author_facet | Reliability and Maintainability Symposium Orlando, Fla |
| author_sort | Reliability and Maintainability Symposium Orlando, Fla |
| building | Verbundindex |
| bvnumber | BV004801677 |
| classification_rvk | ZG 9270 |
| classification_tum | TEC 700f |
| ctrlnum | (OCoLC)630820323 (DE-599)BVBBV004801677 |
| discipline | Technik Technik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift 1991 Orlando Fla. |
| id | DE-604.BV004801677 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:17:50Z |
| institution | BVB |
| institution_GND | (DE-588)5059513-1 |
| issn | 0149-144X |
| language | Undetermined |
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| physical | XX, 623, 75 S. zahlr. Ill. u. graph. Darst. |
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| spelling | Reliability and Maintainability Symposium 1991 Orlando, Fla. Verfasser (DE-588)5059513-1 aut Proceedings 1991, January 29 - 31 Annual Reliability and Maintainability Symposium New York, NY IEEE 1991 XX, 623, 75 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Technik (DE-588)4059205-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Orlando Fla. gnd-content Technik (DE-588)4059205-4 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002952768&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Proceedings 1991, January 29 - 31 Zuverlässigkeit (DE-588)4059245-5 gnd Technik (DE-588)4059205-4 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4059205-4 (DE-588)1071861417 |
| title | Proceedings 1991, January 29 - 31 |
| title_auth | Proceedings 1991, January 29 - 31 |
| title_exact_search | Proceedings 1991, January 29 - 31 |
| title_full | Proceedings 1991, January 29 - 31 Annual Reliability and Maintainability Symposium |
| title_fullStr | Proceedings 1991, January 29 - 31 Annual Reliability and Maintainability Symposium |
| title_full_unstemmed | Proceedings 1991, January 29 - 31 Annual Reliability and Maintainability Symposium |
| title_short | Proceedings |
| title_sort | proceedings 1991 january 29 31 |
| title_sub | 1991, January 29 - 31 |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Technik (DE-588)4059205-4 gnd |
| topic_facet | Zuverlässigkeit Technik Konferenzschrift 1991 Orlando Fla. |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002952768&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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