Untersuchungen ultradünner Vanadium- und Palladium-Schichten auf W{110} mit LEED, AES, TDS und CPD:
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Bibliographic Details
Main Author: Voss, Eckart (Author)
Format: Book
Language:German
Published: 1991
Subjects:
Item Description:Köln, Univ., Diss., 1991
Physical Description:64 S. Ill., graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!