Holdings: Optical characterization of semiconductors

Optical characterization of semiconductors: proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990

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Bibliographic Details
Format:	Conference Proceeding Book
Language:	English
Published:	Aedermannsdorf, Switzerland Trans Tech Publ. 1992
Series:	Key engineering materials 65
Subjects:	Semiconductors > Testing > Optical methods > Congresses Konferenz Quantenwell Fotoemission Photoleitung Optische Eigenschaft Halbleiter Konferenzschrift > 1990 > Sofia
Item Description:	Literaturangaben
Physical Description:	240 S. graph. Darst.
ISBN:	0878496327

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MARC


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Record in the Search Index

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genre	(DE-588)1071861417 Konferenzschrift 1990 Sofia gnd-content
genre_facet	Konferenzschrift 1990 Sofia
id	DE-604.BV004792228
illustrated	Illustrated
indexdate	2024-07-09T16:17:43Z
institution	BVB
institution_GND	(DE-588)3013127-3 (DE-588)5050216-5
isbn	0878496327
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-002948173
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physical	240 S. graph. Darst.
publishDate	1992
publishDateSearch	1992
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publisher	Trans Tech Publ.
record_format	marc
series	Key engineering materials
series2	Key engineering materials
spelling	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev Aedermannsdorf, Switzerland Trans Tech Publ. 1992 240 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Key engineering materials 65 Literaturangaben Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd rswk-swf Quantenwell (DE-588)4124010-8 gnd rswk-swf Fotoemission (DE-588)4140771-4 gnd rswk-swf Photoleitung (DE-588)4174515-2 gnd rswk-swf Optische Eigenschaft (DE-588)4123887-4 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Sofia gnd-content Halbleiter (DE-588)4022993-2 s Optische Eigenschaft (DE-588)4123887-4 s DE-604 Konferenz (DE-588)4032055-8 s 1\p DE-604 Fotoemission (DE-588)4140771-4 s 2\p DE-604 Quantenwell (DE-588)4124010-8 s 3\p DE-604 Photoleitung (DE-588)4174515-2 s 4\p DE-604 Kušev, D. B. Sonstige oth International Conference on Optical Characterization of Semiconductors 1990 Sofia Sonstige (DE-588)3013127-3 oth International Conference on the Physics of Semiconductors 20 1990 Thessaloniki Sonstige (DE-588)5050216-5 oth Key engineering materials 65 (DE-604)BV001898328 65 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 Key engineering materials Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd Quantenwell (DE-588)4124010-8 gnd Fotoemission (DE-588)4140771-4 gnd Photoleitung (DE-588)4174515-2 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Halbleiter (DE-588)4022993-2 gnd
subject_GND	(DE-588)4032055-8 (DE-588)4124010-8 (DE-588)4140771-4 (DE-588)4174515-2 (DE-588)4123887-4 (DE-588)4022993-2 (DE-588)1071861417
title	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990
title_auth	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990
title_exact_search	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990
title_full	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev
title_fullStr	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev
title_full_unstemmed	Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev
title_short	Optical characterization of semiconductors
title_sort	optical characterization of semiconductors proceedings of the international conference on optical characterization of semiconductors satellite conference of the 20th international conference on the physics of semiconductors sofia bulgaria august 2 4 1990
title_sub	proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990
topic	Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd Quantenwell (DE-588)4124010-8 gnd Fotoemission (DE-588)4140771-4 gnd Photoleitung (DE-588)4174515-2 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Halbleiter (DE-588)4022993-2 gnd
topic_facet	Semiconductors Testing Optical methods Congresses Konferenz Quantenwell Fotoemission Photoleitung Optische Eigenschaft Halbleiter Konferenzschrift 1990 Sofia
volume_link	(DE-604)BV001898328
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