Optical characterization of semiconductors: proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Aedermannsdorf, Switzerland
Trans Tech Publ.
1992
|
| Schriftenreihe: | Key engineering materials
65 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | 240 S. graph. Darst. |
| ISBN: | 0878496327 |
Internformat
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| 245 | 1 | 0 | |a Optical characterization of semiconductors |b proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 |c ed. D. B. Kushev |
| 264 | 1 | |a Aedermannsdorf, Switzerland |b Trans Tech Publ. |c 1992 | |
| 300 | |a 240 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Key engineering materials |v 65 | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods |v Congresses | |
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| 650 | 0 | 7 | |a Photoleitung |0 (DE-588)4174515-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optische Eigenschaft |0 (DE-588)4123887-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
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| 689 | 4 | 0 | |a Photoleitung |0 (DE-588)4174515-2 |D s |
| 689 | 4 | |8 4\p |5 DE-604 | |
| 700 | 1 | |a Kušev, D. B. |e Sonstige |4 oth | |
| 711 | 2 | |a International Conference on Optical Characterization of Semiconductors |d 1990 |c Sofia |j Sonstige |0 (DE-588)3013127-3 |4 oth | |
| 711 | 2 | |a International Conference on the Physics of Semiconductors |n 20 |d 1990 |c Thessaloniki |j Sonstige |0 (DE-588)5050216-5 |4 oth | |
| 830 | 0 | |a Key engineering materials |v 65 |w (DE-604)BV001898328 |9 65 | |
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Datensatz im Suchindex
| _version_ | 1804118905507020800 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV004792228 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.6.O6 |
| callnumber-search | QC611.6.O6 |
| callnumber-sort | QC 3611.6 O6 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 3050 |
| classification_tum | PHY 685f PHY 770f |
| ctrlnum | (OCoLC)30537022 (DE-599)BVBBV004792228 |
| dewey-full | 537.622 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.622 |
| dewey-search | 537.622 |
| dewey-sort | 3537.622 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1990 Sofia gnd-content |
| genre_facet | Konferenzschrift 1990 Sofia |
| id | DE-604.BV004792228 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:17:43Z |
| institution | BVB |
| institution_GND | (DE-588)3013127-3 (DE-588)5050216-5 |
| isbn | 0878496327 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002948173 |
| oclc_num | 30537022 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-703 DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-703 DE-83 |
| physical | 240 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Trans Tech Publ. |
| record_format | marc |
| series | Key engineering materials |
| series2 | Key engineering materials |
| spelling | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev Aedermannsdorf, Switzerland Trans Tech Publ. 1992 240 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Key engineering materials 65 Literaturangaben Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd rswk-swf Quantenwell (DE-588)4124010-8 gnd rswk-swf Fotoemission (DE-588)4140771-4 gnd rswk-swf Photoleitung (DE-588)4174515-2 gnd rswk-swf Optische Eigenschaft (DE-588)4123887-4 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Sofia gnd-content Halbleiter (DE-588)4022993-2 s Optische Eigenschaft (DE-588)4123887-4 s DE-604 Konferenz (DE-588)4032055-8 s 1\p DE-604 Fotoemission (DE-588)4140771-4 s 2\p DE-604 Quantenwell (DE-588)4124010-8 s 3\p DE-604 Photoleitung (DE-588)4174515-2 s 4\p DE-604 Kušev, D. B. Sonstige oth International Conference on Optical Characterization of Semiconductors 1990 Sofia Sonstige (DE-588)3013127-3 oth International Conference on the Physics of Semiconductors 20 1990 Thessaloniki Sonstige (DE-588)5050216-5 oth Key engineering materials 65 (DE-604)BV001898328 65 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 Key engineering materials Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd Quantenwell (DE-588)4124010-8 gnd Fotoemission (DE-588)4140771-4 gnd Photoleitung (DE-588)4174515-2 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4032055-8 (DE-588)4124010-8 (DE-588)4140771-4 (DE-588)4174515-2 (DE-588)4123887-4 (DE-588)4022993-2 (DE-588)1071861417 |
| title | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 |
| title_auth | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 |
| title_exact_search | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 |
| title_full | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev |
| title_fullStr | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev |
| title_full_unstemmed | Optical characterization of semiconductors proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 ed. D. B. Kushev |
| title_short | Optical characterization of semiconductors |
| title_sort | optical characterization of semiconductors proceedings of the international conference on optical characterization of semiconductors satellite conference of the 20th international conference on the physics of semiconductors sofia bulgaria august 2 4 1990 |
| title_sub | proceedings of the International Conference on Optical Characterization of Semiconductors, satellite conference of the 20th International Conference on the Physics of Semiconductors, Sofia, Bulgaria, August 2 - 4, 1990 |
| topic | Semiconductors Testing Optical methods Congresses Konferenz (DE-588)4032055-8 gnd Quantenwell (DE-588)4124010-8 gnd Fotoemission (DE-588)4140771-4 gnd Photoleitung (DE-588)4174515-2 gnd Optische Eigenschaft (DE-588)4123887-4 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Semiconductors Testing Optical methods Congresses Konferenz Quantenwell Fotoemission Photoleitung Optische Eigenschaft Halbleiter Konferenzschrift 1990 Sofia |
| volume_link | (DE-604)BV001898328 |
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