Materials analysis by ion channeling: submicron crystallography
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York u.a.
Acad. Pr.
1982
|
| Schlagworte: | |
| Beschreibung: | XIX, 300 S. graph. Darst. |
| ISBN: | 0122526805 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV004732805 | ||
| 003 | DE-604 | ||
| 005 | 19920720 | ||
| 007 | t | ||
| 008 | 920306s1982 d||| |||| 00||| eng d | ||
| 020 | |a 0122526805 |9 0-12-252680-5 | ||
| 035 | |a (OCoLC)8476304 | ||
| 035 | |a (DE-599)BVBBV004732805 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-384 |a DE-29T | ||
| 050 | 0 | |a QC176.8.C45 | |
| 082 | 0 | |a 620.1/1299 |2 19 | |
| 082 | 0 | |a 530.4/1 |2 19 | |
| 084 | |a UP 9300 |0 (DE-625)146457: |2 rvk | ||
| 100 | 1 | |a Feldman, Leonard C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Materials analysis by ion channeling |b submicron crystallography |c Leonard C. Feldman ; James W. Mayer ; S. Thomas Picraux |
| 264 | 1 | |a New York u.a. |b Acad. Pr. |c 1982 | |
| 300 | |a XIX, 300 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Channeling (Physics) | |
| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Crystals |x Defects | |
| 650 | 4 | |a Ion bombardment | |
| 650 | 4 | |a Solids |x Surfaces | |
| 650 | 0 | 7 | |a Channeling |0 (DE-588)4147560-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristallographie |0 (DE-588)4033217-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Tunneleffekt |0 (DE-588)4136216-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Ionenstrahl |0 (DE-588)4162347-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
| 689 | 0 | 1 | |a Channeling |0 (DE-588)4147560-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Kristallographie |0 (DE-588)4033217-2 |D s |
| 689 | 1 | 1 | |a Ionenstrahl |0 (DE-588)4162347-2 |D s |
| 689 | 1 | 2 | |a Tunneleffekt |0 (DE-588)4136216-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Mayer, James W. |d 1930-2013 |e Verfasser |0 (DE-588)121494349 |4 aut | |
| 700 | 1 | |a Picraux, S. T. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-002911264 | ||
Datensatz im Suchindex
| _version_ | 1804118851595534336 |
|---|---|
| any_adam_object | |
| author | Feldman, Leonard C. Mayer, James W. 1930-2013 Picraux, S. T. |
| author_GND | (DE-588)121494349 |
| author_facet | Feldman, Leonard C. Mayer, James W. 1930-2013 Picraux, S. T. |
| author_role | aut aut aut |
| author_sort | Feldman, Leonard C. |
| author_variant | l c f lc lcf j w m jw jwm s t p st stp |
| building | Verbundindex |
| bvnumber | BV004732805 |
| callnumber-first | Q - Science |
| callnumber-label | QC176 |
| callnumber-raw | QC176.8.C45 |
| callnumber-search | QC176.8.C45 |
| callnumber-sort | QC 3176.8 C45 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 9300 |
| ctrlnum | (OCoLC)8476304 (DE-599)BVBBV004732805 |
| dewey-full | 620.1/1299 530.4/1 |
| dewey-hundreds | 600 - Technology (Applied sciences) 500 - Natural sciences and mathematics |
| dewey-ones | 620 - Engineering and allied operations 530 - Physics |
| dewey-raw | 620.1/1299 530.4/1 |
| dewey-search | 620.1/1299 530.4/1 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations 530 - Physics |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV004732805 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:16:52Z |
| institution | BVB |
| isbn | 0122526805 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002911264 |
| oclc_num | 8476304 |
| open_access_boolean | |
| owner | DE-384 DE-29T |
| owner_facet | DE-384 DE-29T |
| physical | XIX, 300 S. graph. Darst. |
| publishDate | 1982 |
| publishDateSearch | 1982 |
| publishDateSort | 1982 |
| publisher | Acad. Pr. |
| record_format | marc |
| spelling | Feldman, Leonard C. Verfasser aut Materials analysis by ion channeling submicron crystallography Leonard C. Feldman ; James W. Mayer ; S. Thomas Picraux New York u.a. Acad. Pr. 1982 XIX, 300 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Channeling (Physics) Crystallography Crystals Defects Ion bombardment Solids Surfaces Channeling (DE-588)4147560-4 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Channeling (DE-588)4147560-4 s DE-604 Kristallographie (DE-588)4033217-2 s Ionenstrahl (DE-588)4162347-2 s Tunneleffekt (DE-588)4136216-0 s Mayer, James W. 1930-2013 Verfasser (DE-588)121494349 aut Picraux, S. T. Verfasser aut |
| spellingShingle | Feldman, Leonard C. Mayer, James W. 1930-2013 Picraux, S. T. Materials analysis by ion channeling submicron crystallography Channeling (Physics) Crystallography Crystals Defects Ion bombardment Solids Surfaces Channeling (DE-588)4147560-4 gnd Kristallographie (DE-588)4033217-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Tunneleffekt (DE-588)4136216-0 gnd Ionenstrahl (DE-588)4162347-2 gnd |
| subject_GND | (DE-588)4147560-4 (DE-588)4033217-2 (DE-588)4077346-2 (DE-588)4136216-0 (DE-588)4162347-2 |
| title | Materials analysis by ion channeling submicron crystallography |
| title_auth | Materials analysis by ion channeling submicron crystallography |
| title_exact_search | Materials analysis by ion channeling submicron crystallography |
| title_full | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman ; James W. Mayer ; S. Thomas Picraux |
| title_fullStr | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman ; James W. Mayer ; S. Thomas Picraux |
| title_full_unstemmed | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman ; James W. Mayer ; S. Thomas Picraux |
| title_short | Materials analysis by ion channeling |
| title_sort | materials analysis by ion channeling submicron crystallography |
| title_sub | submicron crystallography |
| topic | Channeling (Physics) Crystallography Crystals Defects Ion bombardment Solids Surfaces Channeling (DE-588)4147560-4 gnd Kristallographie (DE-588)4033217-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Tunneleffekt (DE-588)4136216-0 gnd Ionenstrahl (DE-588)4162347-2 gnd |
| topic_facet | Channeling (Physics) Crystallography Crystals Defects Ion bombardment Solids Surfaces Channeling Kristallographie Sekundärionen-Massenspektrometrie Tunneleffekt Ionenstrahl |
| work_keys_str_mv | AT feldmanleonardc materialsanalysisbyionchannelingsubmicroncrystallography AT mayerjamesw materialsanalysisbyionchannelingsubmicroncrystallography AT picrauxst materialsanalysisbyionchannelingsubmicroncrystallography |