Atom-probe field ion microscopy and its applications:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Academic Press
1989
|
| Schriftenreihe: | Advances in electronic and electron physics / Supplement
20 |
| Schlagworte: | |
| Beschreibung: | VIII, 299 S. zahlr. Ill. u. graph. Darst. |
| ISBN: | 0120145820 |
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| id | DE-604.BV004732272 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:16:51Z |
| institution | BVB |
| isbn | 0120145820 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002910809 |
| oclc_num | 182872982 |
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| physical | VIII, 299 S. zahlr. Ill. u. graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Academic Press |
| record_format | marc |
| series2 | Advances in electronic and electron physics / Supplement |
| spelling | Atom-probe field ion microscopy and its applications Toshio Sakurai ... Boston u.a. Academic Press 1989 VIII, 299 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in electronic and electron physics / Supplement 20 Field ion microscopes Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s DE-604 Sakurai Toshio 1945- Sonstige (DE-588)1089285922 oth Supplement Advances in electronic and electron physics 20 (DE-604)BV001889378 20 |
| spellingShingle | Atom-probe field ion microscopy and its applications Field ion microscopes Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4153929-1 |
| title | Atom-probe field ion microscopy and its applications |
| title_auth | Atom-probe field ion microscopy and its applications |
| title_exact_search | Atom-probe field ion microscopy and its applications |
| title_full | Atom-probe field ion microscopy and its applications Toshio Sakurai ... |
| title_fullStr | Atom-probe field ion microscopy and its applications Toshio Sakurai ... |
| title_full_unstemmed | Atom-probe field ion microscopy and its applications Toshio Sakurai ... |
| title_short | Atom-probe field ion microscopy and its applications |
| title_sort | atom probe field ion microscopy and its applications |
| topic | Field ion microscopes Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Field ion microscopes Feldionenmikroskopie |
| volume_link | (DE-604)BV001889378 |
| work_keys_str_mv | AT sakuraitoshio atomprobefieldionmicroscopyanditsapplications |