(1992). Defect recognition in semiconductors before and after processing: Proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK. IOP Publ. Ltd.
Chicago-Zitierstil (17. Ausg.)Defect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference, 18 - 22 March 1991, Wilmslow, UK. Bristol: IOP Publ. Ltd, 1992.
MLA-Zitierstil (9. Ausg.)Defect Recognition in Semiconductors Before and After Processing: Proceedings of the Fourth International Conference, 18 - 22 March 1991, Wilmslow, UK. IOP Publ. Ltd, 1992.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.