Defect recognition in semiconductors before and after processing: proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bristol
IOP Publ. Ltd.
1992
|
| Schriftenreihe: | Seminconductor science and technology
7,1A |
| Schlagworte: | |
| Beschreibung: | Stücktitelaufnahme zu e. Zeitschriftenh. |
| Beschreibung: | 310 S. graph. Darst. |
Internformat
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| genre_facet | Konferenzschrift 1991 Wilmslow |
| id | DE-604.BV004705998 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:16:25Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002891516 |
| oclc_num | 35514467 |
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| physical | 310 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | IOP Publ. Ltd. |
| record_format | marc |
| series | Seminconductor science and technology |
| series2 | Seminconductor science and technology |
| spelling | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK eds. M. R. Brozel ... Bristol IOP Publ. Ltd. 1992 310 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Seminconductor science and technology 7,1A Stücktitelaufnahme zu e. Zeitschriftenh. Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Wilmslow gnd-content Halbleiterbauelement (DE-588)4113826-0 s Fehlererkennung (DE-588)4133764-5 s DE-604 Gitterbaufehler (DE-588)4125030-8 s Halbleiter (DE-588)4022993-2 s Brozel, M. R. Sonstige oth Seminconductor science and technology 7,1A (DE-604)BV002717172 7,1A |
| spellingShingle | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK Seminconductor science and technology Fehlererkennung (DE-588)4133764-5 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4133764-5 (DE-588)4113826-0 (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)1071861417 |
| title | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK |
| title_auth | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK |
| title_exact_search | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK |
| title_full | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK eds. M. R. Brozel ... |
| title_fullStr | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK eds. M. R. Brozel ... |
| title_full_unstemmed | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK eds. M. R. Brozel ... |
| title_short | Defect recognition in semiconductors before and after processing |
| title_sort | defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 22 march 1991 wilmslow uk |
| title_sub | proceedings of the fourth international conference, 18 - 22 March 1991, Wilmslow, UK |
| topic | Fehlererkennung (DE-588)4133764-5 gnd Halbleiterbauelement (DE-588)4113826-0 gnd Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Fehlererkennung Halbleiterbauelement Gitterbaufehler Halbleiter Konferenzschrift 1991 Wilmslow |
| volume_link | (DE-604)BV002717172 |
| work_keys_str_mv | AT brozelmr defectrecognitioninsemiconductorsbeforeandafterprocessingproceedingsofthefourthinternationalconference1822march1991wilmslowuk |