X-ray spectroscopy: an introduction
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin u.a.
Springer
1991
|
| Ausgabe: | 2. ed. |
| Schriftenreihe: | Springer series in optical sciences
15 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturverz. S. 374 - 399 |
| Beschreibung: | XV, 419 S. graph. Darst. |
| ISBN: | 3540507191 0387507191 |
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| 100 | 1 | |a Agarwal, Bipin K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a X-ray spectroscopy |b an introduction |c B. K. Agarwal |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a Berlin u.a. |b Springer |c 1991 | |
| 300 | |a XV, 419 S. |b graph. Darst. | ||
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| 490 | 1 | |a Springer series in optical sciences |v 15 | |
| 500 | |a Literaturverz. S. 374 - 399 | ||
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| 650 | 4 | |a X-Rays | |
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Datensatz im Suchindex
| _version_ | 1804118799410003968 |
|---|---|
| adam_text | B.K.AGARWAL X-RAY SPECTROSCOPY AN INTRODUCTION SECOND EDITION WITH 239
FIGURES SPRINGER-VERLAG BERLIN HEIDELBERG NEW YORK LONDON PARIS TOKYO
HONGKONG BARCELONA BUDAPEST CONTENTS 1. CONTINUOUS X-RAYS 1 1.1 FIELD OF
A POINT CHARGE MOVING WITH UNIFORM VELOCITY 1 1.2 RADIATION FROM AN
ACCELERATED OR DECELERATED CHARGED PARTICLE . 3 1.3 TRANSVERSE RADIATION
FIELD DUE TO THE ACCELERATION OF AN ELECTRON TO LOW VELOCITY (SS 1 A) 5
1.4 MAXWELL S EQUATIONS 6 1.5 COULOMB POTENTIAL 7 1.6 RETARDED
POTENTIALS 8 1.7 LIENARD-WIECHERT POTENTIALS 11 1.8 RADIATION FROM AN
ACCELERATED CHARGE 12 1.9 RADIATION AT LOW VELOCITIES 14 1.10
POLARIZATION OF CONTINUOUS X-RAYS 16 1.11 THE CASE OF V PARALLEL TO V
(RELATIVISTIC) 18 1.12 SOMMERFELD S THEORY FOR THE SPATIAL DISTRIBUTION
OF CONTINUOUS X-RAYS 18 1.13 FREQUENCY SPECTRUM OF CONTINUOUS X-RAYS 21
1.14 EXPERIMENTAL SPECTRAL AND SPATIAL DISTRIBUTIONS 23 1.15
SHORTCOMINGS OF CLASSICAL THEORY 25 1.16 KRAMERS SEMICLASSICAL THEORY
27 1.17 QUANTUM MECHANICAL CONSIDERATIONS 38 1.17.1 BORN APPROXIMATION
39 1.17.2 SOMMERFELD S RESULT 40 1.17.3 POLARIZATION 43 1.17.4 SCREENING
46 1.18 BREMSSTRAHLUNG IN OTHER PROCESSES 46 2. CHARACTERISTIC X-RAYS 51
2.1 LINE EMISSION 51 2.2 MOSELEY LAW 53 2.3 CLASSICAL OSCILLATOR MODEL
54 2.4 QUANTUM THEORY 56 2.5 IONIZATION FUNCTION 57 2.5.1 CLASSICAL
THEORY 57 2.5.2 QUANTUM THEORY 59 2.5.3 HEAVY PROJECTILES 62 2.5.4
INTENSITY 63 2.5.5 MOLECULAR-ORBITAL X-RAYS 66 XII CONTENTS 2.6 RATIO OF
CHARACTERISTICS TO CONTINUOUS RADIATION 66 2.7 X-RAY TERMS , . . 67 2.8
ENERGIES OF ATOMIC X-RAY LEVELS AND ENERGY-LEVEL DIAGRAEMS . 70 2.9
ELECTRIC-DIPOLE SELECTION RULES 75 2.10 RELATIVE INTENSITIES OF EMISSION
LINES IN A MULTIPLET 77 2.11 SCREENING AND SPIN DOUBLETS 79 2.12 QUANTUM
THEORY OF SPONTANEOUS EMISSION OF X-RAY LINES AND MULTIPOLES 89 2.12.1
SPONTANEOUS ELECTRIC-DIPOLE TRANSITION 90 2.12.2 SPONTANEOUS
HIGHER-MULTIPOLE TRANSITIONS 91 2.13 PARITY SELECTION RULES AND
FORBIDDEN LINES 92 2.14 ABSORPTION DISCONTINUITIES 96 2.15 COMPARISON OF
OPTICAL AND X-RAY SPECTRA 101 2.16 NOMENCLATURE OF X-RAY LINES 102 3.
INTERACTION OF X-RAYS WITH MATTER 105 3.1 FREE, DAMPED OSCILLATOR 105
3.2 FORM AND WIDTH OF LINES 106 3.3 FORCED, DAMPED OSCILLATOR 109 3.4
COMPLEX DIELECTRIC CONSTANT 110 3.5 REFRACTIVE INDEX 112 3.6 CORRECTION
OF THE BRAGG EQUATION 114 3.7 MEASUREMENT OF REFRACTIVE INDEX 116 3.7.1
THE METHOD OF CRITICAL ANGLE OF REFLECTION 116 3.7.2 THE METHOD OF
SYMMETRICAL REFLECTION 117 3.7.3 THE METHOD OF UNSYMMETRICAL REFLECTION
117 3.7.4 THE METHOD OF REFRACTION IN A PRISM 119 3.8 ABSORPTION OF
X-RAYS AND DISPERSION THEORY 120 3.8.1 ABSORPTION BY AN UNDAMPED
OSCILLATOR 120 3.8.2 ABSORPTION BY A DAMPED OSCILLATOR 122 3.9
KRAMERS-KALLMANN-MARK THEORY OF REFRACTIVE INDEX 126 3.10 QUANTUM THEORY
OF DISPERSION 129 3.10.1 OSCILLATOR STRENGTH 129 3.10.2 HOENL THEORY 134
3.10.3 VARIATION OF X-RAY ATOMIC SCATTERING FACTOR IN THE REGION OF
ANOMALOUS DISPERSION 137 3.11 QUANTUM THEORY OF LINE SHAPE AND
PHOTOABSORPTION CURVE SHAPE 140 3.12 ABSORPTION COEFFICIENTS 144 3.12.1
QUANTUM THEORY OF PHOTOABSORPTION 148 3.12.2 VARIOUS ATTENUATION
PROCESSES 149 3.13 ABSORPTION-JUMP RATIOS 150 3.14 TOTAL REFLECTION 151
3.15 X-RAY INTERFEROMETRY 153 4. SECONDARY SPECTRA AND SATELLITES 155
4.1 PHOTOELECTRIC EFFECT 155 CONTENTS XIII 4.2 QUANTUM THEORY OF THE
PHOTOELECTRIC EFFECT 156 4.2.1 BORN APPROXIMATION 156 4.2.2 SHAKE-UP
STRUCTURE ~ 159 4.3 EXPERIMENTAL SYSTEMS 161 4.4 AUGER EFFECT AND ITS
RELATION TO ESCA AND X-RAY SPECTRA. . . 164 4.4.1 AUGER EFFECT AND
WIDTHS OF X-RAY EMISSION LINES AND ABSORPTION EDGES 166 4.4.2 AUGER
EFFECT AND THE INTENSITIES OF X-RAY EMISSION LINES 166 4.5 BASIC THEORY
OF THE AUGER, EFFECT 167 4.5.1 THE NON-RELATIVISTIC.THEORY BASED ON
DIRECT INTERACTION OF TWO ELECTRONS 167 4.5.2 POSSIBLE AUGER TRANSITIONS
OF THE COSTER-KRONIG TYPE (X^X F Y) 169 4.5.3 AUGER TRANSITIONS AND
WIDTHS OF LEVELS 172 4.5.4 AUGER TRANSITIONS AND RELATIVE INTENSITIES OF
L-SERIES LINES 173 4.6 DETECTION OF AUGER ELECTRONS 174 4.7 X-RAY LINE
WIDTH 176 4.8 SATELLITES 178 4.8.1 LOW-ENERGY SATELLITES 183 4.9
FLUORESCENCE 185 4.10 MEASUREMENT OF FLUORESCENCE YIELD . . . . 188
4.11 AUTOIONIZATION AND INTERNAL CONVERSIONS 192 4.12 MUONIC X-RAYS 193
5. SCATTERING OF X-RAYS 195 5.1 CLASSICAL THEORY OF THOMSON AND RAYLEIGH
(COHERENT) SCATTERING 195 5.2 INCOHERENT (COMPTON) SCATTERING 199 5.3
X-RAY RAMAN AND PLASMON SCATTERING 202 6. CHEMICAL SHIFTS IN EMISSION
SPECTRA 207 6.1 SOLID-STATE EFFECTS AND BONDING 207 6.1.1 METALLICBOND
207 6.1.2 IONIC AND COVALENT BONDS 209 6.1.3 HYBRIDIZED ORBITALS 210
6.1.4 COORDINATION 213 6.1.5 IONIC CHARACTER OF COVALENT BONDS 214 6.2
CHEMICAL SHIFTS OF EMISSION LINES 219 6.2.1 LEVEL SHIFT 223 6.2.2 X-RAY
LINE SHIFT 225 6.3 APPEARANCE POTENTIAL SPECTROSCOPY 227 6.4 RESONANCE
X-RAY EMISSION SPECTROSCOPY 229 6.5 WIDTH AND FINE STRUCTURE OF EMISSION
LINES 229 6.6 ANISOTROPIE X-RAY EMISSION LINES 232 6.7 NUCLEAR
FINITE-SIZE EFFECTS 234 XIV CONTENTS 7. ABSORPTION SPECTRA 237 7.1
ABSORPTION EDGE . . . 237 7.2 NATURE OF THE ABSORPTION SPECTRUM AND THE
WHITE LINE . . . . 242 7.2.1 WHITE LINE 243 7.3 X-RAY ABSORPTION MAIN
EDGE STRUCTURE 247 7.4 CHEMICAL SHIFTS OF ABSORPTION EDGES 251 7.5 X-RAY
ABSORPTION NEAR EDGE STRUCTURE 253 7.6 EXTENDED X-RAY ABSORPTION FINE
STRUCTURE 257 7.6.1 HISTORY OF EXAFS 257 7.6.2 BASIC THEORY OF EXAFS 262
7.6.3 EXAFS EXPERIMENT AND FORM 267 7.6.4 DATA ANALYSIS: FOURIER
TRANSFORM 269 7.6.5 GRAPHICAL METHOD FOR BOND LENGTH 272 7.6.6 CURVE
FITTING METHOD 274 7.6.7 O PROBLEM 274 7.6.8 APPLICATIONS OF EXAFS . .
. 275 7.7 ISOCHROMATS 277 8. SOFT X-RAY SPECTROSCOPY 279 8.1
CONVENTIONAL SOURCES 280 8.2 THE SYNCHROTRON AS A SOURCE 282 8.2.1
THEORY 283 8.2.2 ANGULAR DISTRIBUTION 284 8.3 VACUUM SPECTROGRAPH 287
8.4 DETECTORS 288 8.5 EMISSION SPECTRA 288 8.6 ABSORPTION-SPECTRA
RECORDING 297 8.7 INTERPRETATION OF ABSORPTION SPECTRA 298 9.
EXPERIMENTAL METHODS 303 9.1 X-RAY TUBES 303 9.2 LINE-FOCUS FILAMENT 306
9.3 HIGH-TENSION CIRCUITS 307 9.4 WAVELENGTH UNITS 308 9.5 PLANE-CRYSTAL
SPECTROGRAPH 311 9.5.1 SOLLER SLIT 313 9.5.2 EDGE-CRYSTAL SPECTROGRAPH
314 9.6 CURVED-CRYSTAL SPECTROGRAPH 314 9.7 DOUBLE-CRYSTAL SPECTROMETER
319 9.7.1 THE CASE OF ZERO DISPERSION (MINUS POSITION) 321 9.7.2 THE
CASE OF NON-ZERO DISPERSION (PLUS SETTING) . . . . 324 9.8 USE OF RULED
GRAETINGS 325 9.9 DETECTORS 327 9.9.1 PHOTOGRAPHIC FILMS 327 9.9.2
GAS-FILLED DETECTORS 327 CONTENTS XV 9.9.3 SCINTILLATION COUNTER . .
332 I 9.9.4 SEMICONDUCTOR DETECTOR 333 9.10 ENERGY-DISPERSION
SPECTROMETRY . . . 336 9.10.1 PULSE-HEIGHT SELECTION 336 9.10.2
PULSE-HEIGHT DISTRIBUTION CURVES 337 9.10.3 AUTOMATIC PULSE-HEIGHT
SELECTION 339 9.11 NON-DISPERSIVE ANALYSIS 340 9.11.1 SELECTIVE
EXCITATION METHOD 340 9.11.2 SELECTIVE FILTRATION METHOD 341 9.11.3
OTHERMETHODS 341 9.12 X-RAY LASERS 342 9.13 INTENSITY MEASUREMENT 343
9.13.1 CHARACTERISTIC LINE INTENSITY 344 9.13.2 X-RAY DOSE 346 APPENDIX
A RUTHERFORD SCATTERING FOR AN ATTRACTIVE FIELD 347 A.L EQUATION OF
HYPERBOLA 347 A.2 RUTHERFORD SCATTERING 348 APPENDIX B BOHR S FORMULA
FOR ENERGY LOESS 349 APPENDIX C X-RAY ATOMIC ENERGY LEVELS 351 APPENDIX D
ELECTRON DISTRIBUTION AMONG THE LEVELS OF FREE ATOMS . . .35 3 APPENDIX
E CURVES REPRESENTING VALUES OF ELECTRON ENERGIES 357 APPENDIX F DIPOLE
SUM RULE 359 APPENDIX G SCREENING EFFECT, ACCORDING TO SLATER 361
APPENDIX H ELECRRONEGATIVITY SCALE 365 APPENDIX I COMMON ANALYZING
CRYSTALS 367 APPENDIX J WAVELENGTH TABLES 369 REFERENCES * 373 AUTHOR
INDEX 401 SUBJECT INDEX 415
|
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| physical | XV, 419 S. graph. Darst. |
| publishDate | 1991 |
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| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Agarwal, Bipin K. Verfasser aut X-ray spectroscopy an introduction B. K. Agarwal 2. ed. Berlin u.a. Springer 1991 XV, 419 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 15 Literaturverz. S. 374 - 399 Spectrum Analysis X-Rays X-ray spectroscopy Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf 1\p (DE-588)4151278-9 Einführung gnd-content Röntgenspektroskopie (DE-588)4050331-8 s DE-604 Springer series in optical sciences 15 (DE-604)BV000000237 15 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002875684&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Agarwal, Bipin K. X-ray spectroscopy an introduction Springer series in optical sciences Spectrum Analysis X-Rays X-ray spectroscopy Röntgenspektroskopie (DE-588)4050331-8 gnd |
| subject_GND | (DE-588)4050331-8 (DE-588)4151278-9 |
| title | X-ray spectroscopy an introduction |
| title_auth | X-ray spectroscopy an introduction |
| title_exact_search | X-ray spectroscopy an introduction |
| title_full | X-ray spectroscopy an introduction B. K. Agarwal |
| title_fullStr | X-ray spectroscopy an introduction B. K. Agarwal |
| title_full_unstemmed | X-ray spectroscopy an introduction B. K. Agarwal |
| title_short | X-ray spectroscopy |
| title_sort | x ray spectroscopy an introduction |
| title_sub | an introduction |
| topic | Spectrum Analysis X-Rays X-ray spectroscopy Röntgenspektroskopie (DE-588)4050331-8 gnd |
| topic_facet | Spectrum Analysis X-Rays X-ray spectroscopy Röntgenspektroskopie Einführung |
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