Analysis of microelectronic materials and devices:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Chichester u.a.
Wiley
1991
|
Schlagworte: | |
Beschreibung: | XLVI, 934 S. Ill., graph. Darst. |
ISBN: | 0471917133 |
Internformat
MARC
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245 | 1 | 0 | |a Analysis of microelectronic materials and devices |c ed. by M. Grasserbauer ... |
264 | 1 | |a Chichester u.a. |b Wiley |c 1991 | |
300 | |a XLVI, 934 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Microstructure (Physique) | |
650 | 4 | |a Microélectronique - Essais | |
650 | 4 | |a Microélectronique - Matériaux - Essais | |
650 | 4 | |a Microelectronics |x Materials |x Testing | |
650 | 4 | |a Microelectronics |x Testing | |
650 | 4 | |a Microstructure | |
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650 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mikrostruktur |0 (DE-588)4131028-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
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Datensatz im Suchindex
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any_adam_object | |
author_GND | (DE-588)136012523 |
building | Verbundindex |
bvnumber | BV004659744 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871 |
callnumber-search | TK7871 |
callnumber-sort | TK 47871 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | UX 2350 |
ctrlnum | (OCoLC)22955491 (DE-599)BVBBV004659744 |
dewey-full | 621.3815/028/7 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/028/7 |
dewey-search | 621.3815/028/7 |
dewey-sort | 3621.3815 228 17 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
genre_facet | Aufsatzsammlung |
id | DE-604.BV004659744 |
illustrated | Illustrated |
indexdate | 2024-07-09T16:15:42Z |
institution | BVB |
isbn | 0471917133 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002862477 |
oclc_num | 22955491 |
open_access_boolean | |
owner | DE-384 DE-29T DE-634 DE-83 DE-11 |
owner_facet | DE-384 DE-29T DE-634 DE-83 DE-11 |
physical | XLVI, 934 S. Ill., graph. Darst. |
publishDate | 1991 |
publishDateSearch | 1991 |
publishDateSort | 1991 |
publisher | Wiley |
record_format | marc |
spelling | Analysis of microelectronic materials and devices ed. by M. Grasserbauer ... Chichester u.a. Wiley 1991 XLVI, 934 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microstructure (Physique) Microélectronique - Essais Microélectronique - Matériaux - Essais Microelectronics Materials Testing Microelectronics Testing Microstructure Werkstoff (DE-588)4065579-9 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Mikroelektronik (DE-588)4039207-7 s Werkstoffprüfung (DE-588)4037934-6 s DE-604 Mikrostruktur (DE-588)4131028-7 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Halbleiterbauelement (DE-588)4113826-0 s 2\p DE-604 Grasserbauer, Manfred 1945- Sonstige (DE-588)136012523 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Analysis of microelectronic materials and devices Microstructure (Physique) Microélectronique - Essais Microélectronique - Matériaux - Essais Microelectronics Materials Testing Microelectronics Testing Microstructure Werkstoff (DE-588)4065579-9 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Mikroelektronik (DE-588)4039207-7 gnd Mikrostruktur (DE-588)4131028-7 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
subject_GND | (DE-588)4065579-9 (DE-588)4037934-6 (DE-588)4039207-7 (DE-588)4131028-7 (DE-588)4113826-0 (DE-588)4143413-4 |
title | Analysis of microelectronic materials and devices |
title_auth | Analysis of microelectronic materials and devices |
title_exact_search | Analysis of microelectronic materials and devices |
title_full | Analysis of microelectronic materials and devices ed. by M. Grasserbauer ... |
title_fullStr | Analysis of microelectronic materials and devices ed. by M. Grasserbauer ... |
title_full_unstemmed | Analysis of microelectronic materials and devices ed. by M. Grasserbauer ... |
title_short | Analysis of microelectronic materials and devices |
title_sort | analysis of microelectronic materials and devices |
topic | Microstructure (Physique) Microélectronique - Essais Microélectronique - Matériaux - Essais Microelectronics Materials Testing Microelectronics Testing Microstructure Werkstoff (DE-588)4065579-9 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Mikroelektronik (DE-588)4039207-7 gnd Mikrostruktur (DE-588)4131028-7 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
topic_facet | Microstructure (Physique) Microélectronique - Essais Microélectronique - Matériaux - Essais Microelectronics Materials Testing Microelectronics Testing Microstructure Werkstoff Werkstoffprüfung Mikroelektronik Mikrostruktur Halbleiterbauelement Aufsatzsammlung |
work_keys_str_mv | AT grasserbauermanfred analysisofmicroelectronicmaterialsanddevices |