Characterization of defects in materials: symposium held December 1 - 2 1986, Boston, Massachusetts, USA
Saved in:
Bibliographic Details
Other Authors: Siegel, Richard W. (Editor)
Format: Book
Language:English
Published: Pittsburgh, Pa. 1987
Series:Materials Research Society: Materials Research Society symposia proceedings 82
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:XV, 532 S. Ill., graph. Darst.
ISBN:0931837472

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes