Automatische Testgenerierung für CMOS-Fehler durch Modifikation des FAN-Algorithmus:
Saved in:
Bibliographic Details
Main Author: Hinsen Isler, Heike 1962- (Author)
Format: Thesis Book
Language:German
Published: Sankt Augustin GMD 1991
Series:GMD-Studien 194
Subjects:
Physical Description:131 S. Ill.
ISBN:388457194X

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!