Proceedings of Symposium B on Science and Technology of Defects in Silicon of the E-MRS meeting: Strasbourg, France, May 30 - June 2, 1989
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Bibliographic Details
Corporate Author: Symposium on Science and Technology of Defects in Silicon Straßburg (Author)
Format: Conference Proceeding Book
Language:English
Published: Lausanne Elsevier Sequoia 1989
Series:Materials science & engineering : B 4
Subjects:
Item Description:Literaturangaben. - Einzelaufnahme eines Zs.-Bandes
Physical Description:XII, 505 S. Ill., graph. Darst.

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