Optimal circuit segmentation for pseudo-exhaustive testing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Stanford, Calif.
Dep. of Computer Sci. and Medicine, Stanford Univ.
1990
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| Schlagworte: | |
| Beschreibung: | Stanford, Calif., Univ., Diss. |
| Beschreibung: | IX, 101 S. graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Patashnik, Oren |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Optimal circuit segmentation for pseudo-exhaustive testing |
| 246 | 1 | 3 | |a STAN CS 90 1308 |
| 264 | 1 | |a Stanford, Calif. |b Dep. of Computer Sci. and Medicine, Stanford Univ. |c 1990 | |
| 300 | |a IX, 101 S. |b graph. Darst. | ||
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| 500 | |a Stanford, Calif., Univ., Diss. | ||
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Patashnik, Oren |
| author_facet | Patashnik, Oren |
| author_role | aut |
| author_sort | Patashnik, Oren |
| author_variant | o p op |
| building | Verbundindex |
| bvnumber | BV004219789 |
| classification_tum | ELT 238d |
| ctrlnum | (OCoLC)631655637 (DE-599)BVBBV004219789 |
| discipline | Elektrotechnik |
| format | Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
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| id | DE-604.BV004219789 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:10:01Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002627334 |
| oclc_num | 631655637 |
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| physical | IX, 101 S. graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Dep. of Computer Sci. and Medicine, Stanford Univ. |
| record_format | marc |
| spelling | Patashnik, Oren Verfasser aut Optimal circuit segmentation for pseudo-exhaustive testing STAN CS 90 1308 Stanford, Calif. Dep. of Computer Sci. and Medicine, Stanford Univ. 1990 IX, 101 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Stanford, Calif., Univ., Diss. (DE-588)4113937-9 Hochschulschrift gnd-content |
| spellingShingle | Patashnik, Oren Optimal circuit segmentation for pseudo-exhaustive testing |
| subject_GND | (DE-588)4113937-9 |
| title | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_alt | STAN CS 90 1308 |
| title_auth | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_exact_search | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_fullStr | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full_unstemmed | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_short | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_sort | optimal circuit segmentation for pseudo exhaustive testing |
| topic_facet | Hochschulschrift |
| work_keys_str_mv | AT patashnikoren optimalcircuitsegmentationforpseudoexhaustivetesting AT patashnikoren stancs901308 |