Ion beam analysis: proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988
Gespeichert in:
Format: | Tagungsbericht Buch |
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Sprache: | Undetermined |
Veröffentlicht: |
Amsterdam
North-Holland
1988
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Schriftenreihe: | Nuclear instruments and methods in physics research / B
35,3/4 |
Schlagworte: | |
Beschreibung: | Einzelaufn. e. Zs.-Heftes |
Beschreibung: | XVI S., S. 205 - 572 Ill., graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
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physical | XVI S., S. 205 - 572 Ill., graph. Darst. |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
publisher | North-Holland |
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spelling | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 eds.: H. J. Annegarn ... Amsterdam North-Holland 1988 XVI S., S. 205 - 572 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nuclear instruments and methods in physics research / B 35,3/4 Einzelaufn. e. Zs.-Heftes Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Johannesburg gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Annegarn, Harold J. Sonstige oth International Conference on Ion Beam Analysis 8 1988 Johannesburg Sonstige (DE-588)820040-3 oth |
spellingShingle | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
title | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 |
title_auth | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 |
title_exact_search | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 |
title_full | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 eds.: H. J. Annegarn ... |
title_fullStr | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 eds.: H. J. Annegarn ... |
title_full_unstemmed | Ion beam analysis proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 eds.: H. J. Annegarn ... |
title_short | Ion beam analysis |
title_sort | ion beam analysis proceedings of the 8 international conference on ion beam analysis johannesburg south africa 11 15 april 1988 |
title_sub | proceedings of the 8. International Conference on Ion Beam Analysis, Johannesburg, South Africa, 11 - 15 April 1988 |
topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift 1988 Johannesburg |
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