Holdings: Surface analytical techniques

Surface analytical techniques:

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Bibliographic Details
Main Author:	Rivière, John C. (Author)
Format:	Book
Language:	English
Published:	Oxford Clarendon Press 1990
Series:	Monographs on the physics and chemistry of materials
Subjects:	Methode - Oberflächenanalyse Physikalisch-chemische Messung Oberflächenanalyse
Online Access:	Inhaltsverzeichnis
Item Description:	Literaturangaben
Physical Description:	XIII, 702 S. Ill., graph. Darst.
ISBN:	0198513704

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MARC


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Record in the Search Index

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adam_text	SURFACE ANALYTICAL TECHNIQUES J. C. RIVIERE INSTITUT FUR PHYSIKALISCHE CHEMIE, UNIVERSITAT INNSBRUCK, AUSTRIA (PREVIOUSLY MATERIALS DEVELOPMENT DIVISION, HARWELL LABORATORY, OXFORDSHIRE, U.K.) CLARENDON PRESS * OXFORD 1990 CONTENTS 1 2 3 INTRODUCTION RESUME OF PHYSICAL PRINCIPLES 2.1 2.2 2.3 2.4 2.5 ELECTRON EXCITATION PHOTON EXCITATION ION EXCITATION OTHER TECHNIQUES SURFACE SPECIFICITY INSTRUMENTATION 3.1 3.2 3.3 3.4 3.5 VACUUM CONDITIONS SOURCES ANALYSERS SAMPLE INSERTION AND HANDLING DEPTH PROFILING 5 11 14 19 22 27 27 28 53 66 70 ELECTRON EXCITATION: AUGER ELECTRON SPECTROSCOPY (AES) AND SCANNING AUGER MICROSCOPY (SAM) 81 4.1 OPERATION 81 4.2 SPECTRAL FEATURES AND INTERPRETATION 85 4.3 QUANTIFICATION 97 4.4 APPLICATIONS 102 ELECTRON EXCITATION: ELECTRON ENERGY LOSS SPECTROSCOPY (ELS), CORE ELECTRON ENERGY LOSS SPECTROSCOPY (CEELS), AND HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS) 125 5.1 OPERATION 125 5.2 SPECTRAL FEATURES AND INTERPRETATION 126 5.3 QUANTIFICATION 141 5.4 APPLICATIONS 144 ELECTRON EXCITATION: SOFT X-RAY APPEARANCE POTENTIAL SPECTROSCOPY (SXAPS), AUGER ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY (AEAPS), AND DIS-APPEARANCE POTENTIAL SPECTROSCOPY (DAPS) 167 6.1 OPERATION 167 6.2 THEORY AND SPECTRAL IDENTIFICATION 172 6.3 APPLICATIONS 181 X CONTENTS 7 ELECTRON EXCITATION: INVERSE PHOTOEMISSION SPECTROSCOPY (IPES) 193 7.1 OPERATION 193 7.2 THEORY AND SPECTRAL IDENTIFICATION 197 7.3 APPLICATIONS 202 8 ELECTRON EXCITATION: CATHODOLUMINESCENCE SPECTROSCOPY (CLS) 210 8.1 OPERATION 210 8.2 THEORY AND SPECTRAL IDENTIFICATION 210 8.3 APPLICATIONS 212 9 ELECTRON EXCITATION: ELECTRON STIMULATED DESORPTION (ESD) AND ELECTRON SIMULATED DESORPTION ION ANGULAR DISTRIBUTION (ESDIAD) 219 9.1 OPERATION 219 9.2 THEORY AND SPECTRAL INTERPRETATION 223 9.3 APPLICATIONS 229 10 PHOTON EXCITATION: X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) AND X-RAY EXCITED AUGER ELECTRON SPECTROSCOPY (XAES) 238 10.1 10.2 10.3 10.4 10.5 10.6 10.7 OPERATION SPECTRAL INTERPRETATION THEORY QUANTIFICATION THE AUGER PARAMETER FINE STRUCTURE IN AUGER SPECTRA STUDIED BY XAES APPLICATIONS 238 258 265 274 278 280 283 11 PHOTON EXCITATION: ULTRA-VIOLET PHOTOELECTRON SPECTROSCOPY (UPS) AND SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY (SRPS) 314 11.1 OPERATION 314 11.2 THEORY AND SPECTRAL INTERPRETATION 318 11.3 QUANTIFICATION 338 11.4 APPLICATIONS 340 12 PHOTON EXCITATION: REFLECTION-ABSORPTION INFRA-RED SPECTROSCOPY (RAIRS) AND SURFACE-ENHANCED RAMAN SPECTROSCOPY (SERS) 357 12.1 REFLECTION-ABSORPTION INFRA-RED SPECTROSCOPY 357 12.1.1 OPERATION 357 12.1.2 THEORY AND SPECTRAL INTERPRETATION 362 12.1.3 QUANTIFICATION 367 CONTENTS XI 12.1.4 APPLICATIONS 369 12.2 SURFACE-ENHANCED RAMAN SPECTROSCOPY 373 12.2.1 OPERATION 374 12.2.2 THEORY AND SPECTRAL INTERPRETATION 375 12.2.3 QUANTIFICATION 378 12.2.4 APPLICATIONS 378 13 ION EXCITATION: ION-EXCITED AUGER ELECTRON SPECTROSCOPY (IAES) AND PROTON-EXCITED AUGER ELECTRON SPECTROSCOPY (PAES) 386 13.1 OPERATION 386 13.2 THEORY AND SPECTRAL INTERPRETATION 391 13.3 QUANTIFICATION AND APPLICATIONS 401 14 ION EXCITATION: ION NEUTRALIZATION SPECTROSCOPY (INS) AND METASTABLE QUENCHING SPECTROSCOPY (MQS) 403 14.1 ION NEUTRALIZATION SPECTROSCOPY 403 14.1.1 OPERATION 403 14.1.2 THEORY AND DATA PROCESSING 406 J 14.1.3 SPECTRAL INTERPRETATION 410 14.2 METASTABLE QUENCHING SPECTROSCOPY 417 15 ION EXCITATION: ION BEAM SPECTROCHEMICAL ANALYSIS (IBSCA) AND GLOW DISCHARGE OPTICAL SPECTROSCOPY (GDOS) 423 15.1 ION BEAM SPECTRO-CHEMICAL ANALYSIS 423 15.1.1 OPERATION 423 15.1.2 THEORY AND QUANTIFICATION 425 15.1.3 APPLICATIONS 429 15.2 GLOW DISCHARGE OPTICAL SPECTROSCOPY 431 15.2.1 OPERATION 432 15.2.2 QUANTIFICATION 435 15.2.3 APPLICATIONS 439 16 ION EXCITATION: ION SCATTERING SPECTROSCOPY (ISS) 445 16.1 OPERATION 445 16.2 THEORY AND SPECTRAL INTERPRETATION 450 16.3 QUANTIFICATION 454 16.4 APPLICATIONS 459 16.5 SURFACE STRUCTURAL ANALYSIS 467 17 ION EXCITATION: STATIC SECONDARY ION MASS SPECTROMETRY (SSIMS) 470 17.1 OPERATION 470 17.2 SPECTRAL IDENTIFICATION 480 XII CONTENTS 17.3 THEORY 482 17.4 QUANTIFICATION 504 17.5 APPLICATIONS 514 18 ION EXCITATION: SECONDARY NEUTRAL MASS SPECTROMETRY (SNMS) AND GLOW DISCHARGE MASS SPECTROMETRY (GDMS) 528 18.1 SECONDARY NEUTRAL MASS SPECTROMETRY 528 18.1.1 OPERATION 528 18.1.2 THEORY 545 18.1.3 SPECTRAL INTERPRETATION 552 18.1.4 QUANTIFICATION 554 18.1.5 APPLICATIONS 559 18.2 GLOW DISCHARGE MASS SPECTROMETRY 563 18.2.1 OPERATION 563 18.2.2 THEORY AND SPECTRAL IDENTIFICATION 567 18.2.3 QUANTIFICATION 567 18.2.4 APPLICATIONS 572 19 NEUTRAL EXCITATION: FAST ATOM BOMBARDMENT MASS SPECTROMETRY (FABMS) 578 19.1 OPERATION 578. 19.2 THEORY 580 19.3 SPECTRAL INTERPRETATION AND QUANTIFICATION 585 19.4 APPLICATIONS 585 20 HIGH FIELD EXCITATION: INELASTIC ELECTRON TUNNELLING SPECTROSCOPY (IETS) 593 593 598 604 607 612 21 HIGH FIELD EXCITATION: ATOM PROBE FIELD ION MICROSCOPY (APFIM) - 620 620 629 631 632 633 20.1 20.2 20.3 20.4 20.5 OPERATION THEORY SPECTRAL IDENTIFICATION QUANTIFICATION APPLICATIONS 21 21 21 21 21 .1 .2 .3 .4 .5 OPERATION THEORY SPECTRAL INTERPRETATION QUANTIFICATION APPLICATIONS CONTENTS XIII 22 HIGH FIELD EXCITATION: SCANNING TUNNELLING MICROSCOPY AND SPECTROSCOPY (STM AND STS) 648 22.1 OPERATION 648 22.2 THEORY AND IMAGE INTERPRETATION 655 22.3 QUANTIFICATION 660 22.4 APPLICATIONS 660 23 THERMAL EXCITATION: THERMAL DESORPTION SPECTROSCOPY (TDS) 671 23.1 OPERATION 671 23.2 THEORY AND INTERPRETATION 673 23.3 QUANTIFICATION 678 23.4 APPLICATIONS 681 INDEX 691
any_adam_object	1
author	Rivière, John C.
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ctrlnum	(OCoLC)246859403 (DE-599)BVBBV004173877
discipline	Physik
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indexdate	2024-07-09T16:09:26Z
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isbn	0198513704
language	English
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physical	XIII, 702 S. Ill., graph. Darst.
publishDate	1990
publishDateSearch	1990
publishDateSort	1990
publisher	Clarendon Press
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series2	Monographs on the physics and chemistry of materials
spelling	Rivière, John C. Verfasser (DE-588)1044198737 aut Surface analytical techniques J. C. Rivière Oxford Clarendon Press 1990 XIII, 702 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials Literaturangaben Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Physikalisch-chemische Messung (DE-588)4174602-8 s DE-604 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002602204&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis
spellingShingle	Rivière, John C. Surface analytical techniques Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd
subject_GND	(DE-588)4174602-8 (DE-588)4172243-7
title	Surface analytical techniques
title_auth	Surface analytical techniques
title_exact_search	Surface analytical techniques
title_full	Surface analytical techniques J. C. Rivière
title_fullStr	Surface analytical techniques J. C. Rivière
title_full_unstemmed	Surface analytical techniques J. C. Rivière
title_short	Surface analytical techniques
title_sort	surface analytical techniques
topic	Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd
topic_facet	Methode - Oberflächenanalyse Physikalisch-chemische Messung Oberflächenanalyse
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