Surface analytical techniques:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Clarendon Press
1990
|
| Schriftenreihe: | Monographs on the physics and chemistry of materials
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XIII, 702 S. Ill., graph. Darst. |
| ISBN: | 0198513704 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV004173877 | ||
| 003 | DE-604 | ||
| 005 | 19981216 | ||
| 007 | t | ||
| 008 | 901217s1990 ad|| |||| 00||| engod | ||
| 020 | |a 0198513704 |9 0-19-851370-4 | ||
| 035 | |a (OCoLC)246859403 | ||
| 035 | |a (DE-599)BVBBV004173877 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-91 |a DE-703 |a DE-29T |a DE-11 |a DE-188 | ||
| 084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
| 084 | |a PHY 160f |2 stub | ||
| 100 | 1 | |a Rivière, John C. |e Verfasser |0 (DE-588)1044198737 |4 aut | |
| 245 | 1 | 0 | |a Surface analytical techniques |c J. C. Rivière |
| 264 | 1 | |a Oxford |b Clarendon Press |c 1990 | |
| 300 | |a XIII, 702 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Monographs on the physics and chemistry of materials | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Methode - Oberflächenanalyse | |
| 650 | 0 | 7 | |a Physikalisch-chemische Messung |0 (DE-588)4174602-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 0 | 1 | |a Physikalisch-chemische Messung |0 (DE-588)4174602-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 856 | 4 | 2 | |m HEBIS Datenaustausch Darmstadt |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002602204&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-002602204 | ||
Datensatz im Suchindex
| _version_ | 1804118384105750528 |
|---|---|
| adam_text | SURFACE ANALYTICAL TECHNIQUES J. C. RIVIERE INSTITUT FUR PHYSIKALISCHE
CHEMIE, UNIVERSITAT INNSBRUCK, AUSTRIA (PREVIOUSLY MATERIALS DEVELOPMENT
DIVISION, HARWELL LABORATORY, OXFORDSHIRE, U.K.) CLARENDON PRESS *
OXFORD 1990 CONTENTS 1 2 3 INTRODUCTION RESUME OF PHYSICAL PRINCIPLES
2.1 2.2 2.3 2.4 2.5 ELECTRON EXCITATION PHOTON EXCITATION ION EXCITATION
OTHER TECHNIQUES SURFACE SPECIFICITY INSTRUMENTATION 3.1 3.2 3.3 3.4 3.5
VACUUM CONDITIONS SOURCES ANALYSERS SAMPLE INSERTION AND HANDLING DEPTH
PROFILING 5 11 14 19 22 27 27 28 53 66 70 ELECTRON EXCITATION: AUGER
ELECTRON SPECTROSCOPY (AES) AND SCANNING AUGER MICROSCOPY (SAM) 81 4.1
OPERATION 81 4.2 SPECTRAL FEATURES AND INTERPRETATION 85 4.3
QUANTIFICATION 97 4.4 APPLICATIONS 102 ELECTRON EXCITATION: ELECTRON
ENERGY LOSS SPECTROSCOPY (ELS), CORE ELECTRON ENERGY LOSS SPECTROSCOPY
(CEELS), AND HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS)
125 5.1 OPERATION 125 5.2 SPECTRAL FEATURES AND INTERPRETATION 126 5.3
QUANTIFICATION 141 5.4 APPLICATIONS 144 ELECTRON EXCITATION: SOFT X-RAY
APPEARANCE POTENTIAL SPECTROSCOPY (SXAPS), AUGER ELECTRON APPEARANCE
POTENTIAL SPECTROSCOPY (AEAPS), AND DIS-APPEARANCE POTENTIAL
SPECTROSCOPY (DAPS) 167 6.1 OPERATION 167 6.2 THEORY AND SPECTRAL
IDENTIFICATION 172 6.3 APPLICATIONS 181 X CONTENTS 7 ELECTRON
EXCITATION: INVERSE PHOTOEMISSION SPECTROSCOPY (IPES) 193 7.1 OPERATION
193 7.2 THEORY AND SPECTRAL IDENTIFICATION 197 7.3 APPLICATIONS 202 8
ELECTRON EXCITATION: CATHODOLUMINESCENCE SPECTROSCOPY (CLS) 210 8.1
OPERATION 210 8.2 THEORY AND SPECTRAL IDENTIFICATION 210 8.3
APPLICATIONS 212 9 ELECTRON EXCITATION: ELECTRON STIMULATED DESORPTION
(ESD) AND ELECTRON SIMULATED DESORPTION ION ANGULAR DISTRIBUTION
(ESDIAD) 219 9.1 OPERATION 219 9.2 THEORY AND SPECTRAL INTERPRETATION
223 9.3 APPLICATIONS 229 10 PHOTON EXCITATION: X-RAY PHOTOELECTRON
SPECTROSCOPY (XPS) AND X-RAY EXCITED AUGER ELECTRON SPECTROSCOPY (XAES)
238 10.1 10.2 10.3 10.4 10.5 10.6 10.7 OPERATION SPECTRAL INTERPRETATION
THEORY QUANTIFICATION THE AUGER PARAMETER FINE STRUCTURE IN AUGER
SPECTRA STUDIED BY XAES APPLICATIONS 238 258 265 274 278 280 283 11
PHOTON EXCITATION: ULTRA-VIOLET PHOTOELECTRON SPECTROSCOPY (UPS) AND
SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY (SRPS) 314 11.1
OPERATION 314 11.2 THEORY AND SPECTRAL INTERPRETATION 318 11.3
QUANTIFICATION 338 11.4 APPLICATIONS 340 12 PHOTON EXCITATION:
REFLECTION-ABSORPTION INFRA-RED SPECTROSCOPY (RAIRS) AND
SURFACE-ENHANCED RAMAN SPECTROSCOPY (SERS) 357 12.1
REFLECTION-ABSORPTION INFRA-RED SPECTROSCOPY 357 12.1.1 OPERATION 357
12.1.2 THEORY AND SPECTRAL INTERPRETATION 362 12.1.3 QUANTIFICATION 367
CONTENTS XI 12.1.4 APPLICATIONS 369 12.2 SURFACE-ENHANCED RAMAN
SPECTROSCOPY 373 12.2.1 OPERATION 374 12.2.2 THEORY AND SPECTRAL
INTERPRETATION 375 12.2.3 QUANTIFICATION 378 12.2.4 APPLICATIONS 378 13
ION EXCITATION: ION-EXCITED AUGER ELECTRON SPECTROSCOPY (IAES) AND
PROTON-EXCITED AUGER ELECTRON SPECTROSCOPY (PAES) 386 13.1 OPERATION 386
13.2 THEORY AND SPECTRAL INTERPRETATION 391 13.3 QUANTIFICATION AND
APPLICATIONS 401 14 ION EXCITATION: ION NEUTRALIZATION SPECTROSCOPY
(INS) AND METASTABLE QUENCHING SPECTROSCOPY (MQS) 403 14.1 ION
NEUTRALIZATION SPECTROSCOPY 403 14.1.1 OPERATION 403 14.1.2 THEORY AND
DATA PROCESSING 406 J 14.1.3 SPECTRAL INTERPRETATION 410 14.2 METASTABLE
QUENCHING SPECTROSCOPY 417 15 ION EXCITATION: ION BEAM SPECTROCHEMICAL
ANALYSIS (IBSCA) AND GLOW DISCHARGE OPTICAL SPECTROSCOPY (GDOS) 423 15.1
ION BEAM SPECTRO-CHEMICAL ANALYSIS 423 15.1.1 OPERATION 423 15.1.2
THEORY AND QUANTIFICATION 425 15.1.3 APPLICATIONS 429 15.2
GLOW DISCHARGE OPTICAL SPECTROSCOPY 431 15.2.1 OPERATION 432 15.2.2
QUANTIFICATION 435 15.2.3 APPLICATIONS 439 16 ION EXCITATION: ION
SCATTERING SPECTROSCOPY (ISS) 445 16.1 OPERATION 445 16.2 THEORY AND
SPECTRAL INTERPRETATION 450 16.3 QUANTIFICATION 454 16.4 APPLICATIONS
459 16.5 SURFACE STRUCTURAL ANALYSIS 467 17 ION EXCITATION: STATIC
SECONDARY ION MASS SPECTROMETRY (SSIMS) 470 17.1 OPERATION 470 17.2
SPECTRAL IDENTIFICATION 480 XII CONTENTS 17.3 THEORY 482 17.4
QUANTIFICATION 504 17.5 APPLICATIONS 514 18 ION EXCITATION: SECONDARY
NEUTRAL MASS SPECTROMETRY (SNMS) AND GLOW DISCHARGE MASS SPECTROMETRY
(GDMS) 528 18.1 SECONDARY NEUTRAL MASS SPECTROMETRY 528 18.1.1 OPERATION
528 18.1.2 THEORY 545 18.1.3 SPECTRAL INTERPRETATION 552 18.1.4
QUANTIFICATION 554 18.1.5 APPLICATIONS 559 18.2 GLOW DISCHARGE MASS
SPECTROMETRY 563 18.2.1 OPERATION 563 18.2.2 THEORY AND SPECTRAL
IDENTIFICATION 567 18.2.3 QUANTIFICATION 567 18.2.4 APPLICATIONS 572 19
NEUTRAL EXCITATION: FAST ATOM BOMBARDMENT MASS SPECTROMETRY (FABMS) 578
19.1 OPERATION 578. 19.2 THEORY 580 19.3 SPECTRAL INTERPRETATION AND
QUANTIFICATION 585 19.4 APPLICATIONS 585 20 HIGH FIELD EXCITATION:
INELASTIC ELECTRON TUNNELLING SPECTROSCOPY (IETS) 593 593 598 604 607
612 21 HIGH FIELD EXCITATION: ATOM PROBE FIELD ION MICROSCOPY (APFIM) -
620 620 629 631 632 633 20.1 20.2 20.3 20.4 20.5 OPERATION THEORY
SPECTRAL IDENTIFICATION QUANTIFICATION APPLICATIONS 21 21 21 21 21 .1 .2
.3 .4 .5 OPERATION THEORY SPECTRAL INTERPRETATION QUANTIFICATION
APPLICATIONS CONTENTS XIII 22 HIGH FIELD EXCITATION: SCANNING TUNNELLING
MICROSCOPY AND SPECTROSCOPY (STM AND STS) 648 22.1 OPERATION 648 22.2
THEORY AND IMAGE INTERPRETATION 655 22.3 QUANTIFICATION 660 22.4
APPLICATIONS 660 23 THERMAL EXCITATION: THERMAL DESORPTION SPECTROSCOPY
(TDS) 671 23.1 OPERATION 671 23.2 THEORY AND INTERPRETATION 673 23.3
QUANTIFICATION 678 23.4 APPLICATIONS 681 INDEX 691
|
| any_adam_object | 1 |
| author | Rivière, John C. |
| author_GND | (DE-588)1044198737 |
| author_facet | Rivière, John C. |
| author_role | aut |
| author_sort | Rivière, John C. |
| author_variant | j c r jc jcr |
| building | Verbundindex |
| bvnumber | BV004173877 |
| classification_rvk | UP 7500 |
| classification_tum | PHY 160f |
| ctrlnum | (OCoLC)246859403 (DE-599)BVBBV004173877 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01631nam a2200409 c 4500</leader><controlfield tag="001">BV004173877</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19981216 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">901217s1990 ad|| |||| 00||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0198513704</subfield><subfield code="9">0-19-851370-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)246859403</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV004173877</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 160f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Rivière, John C.</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1044198737</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Surface analytical techniques</subfield><subfield code="c">J. C. Rivière</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford</subfield><subfield code="b">Clarendon Press</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 702 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Monographs on the physics and chemistry of materials</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Methode - Oberflächenanalyse</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Physikalisch-chemische Messung</subfield><subfield code="0">(DE-588)4174602-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Physikalisch-chemische Messung</subfield><subfield code="0">(DE-588)4174602-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HEBIS Datenaustausch Darmstadt</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002602204&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-002602204</subfield></datafield></record></collection> |
| id | DE-604.BV004173877 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:09:26Z |
| institution | BVB |
| isbn | 0198513704 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002602204 |
| oclc_num | 246859403 |
| open_access_boolean | |
| owner | DE-12 DE-91 DE-BY-TUM DE-703 DE-29T DE-11 DE-188 |
| owner_facet | DE-12 DE-91 DE-BY-TUM DE-703 DE-29T DE-11 DE-188 |
| physical | XIII, 702 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Clarendon Press |
| record_format | marc |
| series2 | Monographs on the physics and chemistry of materials |
| spelling | Rivière, John C. Verfasser (DE-588)1044198737 aut Surface analytical techniques J. C. Rivière Oxford Clarendon Press 1990 XIII, 702 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials Literaturangaben Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Physikalisch-chemische Messung (DE-588)4174602-8 s DE-604 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002602204&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Rivière, John C. Surface analytical techniques Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4174602-8 (DE-588)4172243-7 |
| title | Surface analytical techniques |
| title_auth | Surface analytical techniques |
| title_exact_search | Surface analytical techniques |
| title_full | Surface analytical techniques J. C. Rivière |
| title_fullStr | Surface analytical techniques J. C. Rivière |
| title_full_unstemmed | Surface analytical techniques J. C. Rivière |
| title_short | Surface analytical techniques |
| title_sort | surface analytical techniques |
| topic | Methode - Oberflächenanalyse Physikalisch-chemische Messung (DE-588)4174602-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Methode - Oberflächenanalyse Physikalisch-chemische Messung Oberflächenanalyse |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=002602204&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT rivierejohnc surfaceanalyticaltechniques |