Understanding semiconductor devices: concepts, experiments, and troubleshooting
Gespeichert in:
Hauptverfasser: | , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Englewood Cliffs, New Jersey
Prentice Hall
1989
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Schriftenreihe: | Prentice Hall understanding electronics technology series
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Schlagworte: | |
Beschreibung: | XIX, 508 S graph. Darst. |
ISBN: | 0139431926 |
Internformat
MARC
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035 | |a (OCoLC)18715823 | ||
035 | |a (DE-599)BVBBV004160497 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
050 | 0 | |a TK7871.85 | |
082 | 0 | |a 621.3815/2 |2 19 | |
084 | |a ELT 300f |2 stub | ||
100 | 1 | |a Patrick, Dale R. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Understanding semiconductor devices |b concepts, experiments, and troubleshooting |c Dale R. Patrick ; Stephen W. Fardo |
264 | 1 | |a Englewood Cliffs, New Jersey |b Prentice Hall |c 1989 | |
300 | |a XIX, 508 S |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
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700 | 1 | |a Fardo, Stephen W. |e Verfasser |4 aut | |
999 | |a oai:aleph.bib-bvb.de:BVB01-002594530 |
Datensatz im Suchindex
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any_adam_object | |
author | Patrick, Dale R. Fardo, Stephen W. |
author_facet | Patrick, Dale R. Fardo, Stephen W. |
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author_sort | Patrick, Dale R. |
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building | Verbundindex |
bvnumber | BV004160497 |
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callnumber-sort | TK 47871.85 |
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ctrlnum | (OCoLC)18715823 (DE-599)BVBBV004160497 |
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dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/2 |
dewey-search | 621.3815/2 |
dewey-sort | 3621.3815 12 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV004160497 |
illustrated | Illustrated |
indexdate | 2024-07-09T16:09:15Z |
institution | BVB |
isbn | 0139431926 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002594530 |
oclc_num | 18715823 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | XIX, 508 S graph. Darst. |
publishDate | 1989 |
publishDateSearch | 1989 |
publishDateSort | 1989 |
publisher | Prentice Hall |
record_format | marc |
series2 | Prentice Hall understanding electronics technology series |
spelling | Patrick, Dale R. Verfasser aut Understanding semiconductor devices concepts, experiments, and troubleshooting Dale R. Patrick ; Stephen W. Fardo Englewood Cliffs, New Jersey Prentice Hall 1989 XIX, 508 S graph. Darst. txt rdacontent n rdamedia nc rdacarrier Prentice Hall understanding electronics technology series Semiconductors Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s DE-604 Fardo, Stephen W. Verfasser aut |
spellingShingle | Patrick, Dale R. Fardo, Stephen W. Understanding semiconductor devices concepts, experiments, and troubleshooting Semiconductors Halbleiterbauelement (DE-588)4113826-0 gnd |
subject_GND | (DE-588)4113826-0 |
title | Understanding semiconductor devices concepts, experiments, and troubleshooting |
title_auth | Understanding semiconductor devices concepts, experiments, and troubleshooting |
title_exact_search | Understanding semiconductor devices concepts, experiments, and troubleshooting |
title_full | Understanding semiconductor devices concepts, experiments, and troubleshooting Dale R. Patrick ; Stephen W. Fardo |
title_fullStr | Understanding semiconductor devices concepts, experiments, and troubleshooting Dale R. Patrick ; Stephen W. Fardo |
title_full_unstemmed | Understanding semiconductor devices concepts, experiments, and troubleshooting Dale R. Patrick ; Stephen W. Fardo |
title_short | Understanding semiconductor devices |
title_sort | understanding semiconductor devices concepts experiments and troubleshooting |
title_sub | concepts, experiments, and troubleshooting |
topic | Semiconductors Halbleiterbauelement (DE-588)4113826-0 gnd |
topic_facet | Semiconductors Halbleiterbauelement |
work_keys_str_mv | AT patrickdaler understandingsemiconductordevicesconceptsexperimentsandtroubleshooting AT fardostephenw understandingsemiconductordevicesconceptsexperimentsandtroubleshooting |