(1987). Modern optical characterization techniques for semiconductors and semiconductor devices: 26 - 27 March 1987, Bay Point, Florida. Internat. Soc. for Optical Engineering.
Chicago-Zitierstil (17. Ausg.)Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices: 26 - 27 March 1987, Bay Point, Florida. Bellingham, Wash: Internat. Soc. for Optical Engineering, 1987.
MLA-Zitierstil (9. Ausg.)Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices: 26 - 27 March 1987, Bay Point, Florida. Internat. Soc. for Optical Engineering, 1987.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.