Semi-empirical calculations for point defects in silicon:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
1979
|
| Schlagworte: | |
| Beschreibung: | 107 S. zahlr. graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
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| author | Weigel, Christoph 1944- |
| author_GND | (DE-588)129209600 |
| author_facet | Weigel, Christoph 1944- |
| author_role | aut |
| author_sort | Weigel, Christoph 1944- |
| author_variant | c w cw |
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| bvnumber | BV003662144 |
| ctrlnum | (OCoLC)45920563 (DE-599)BVBBV003662144 |
| format | Thesis Book |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T16:03:28Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002331107 |
| oclc_num | 45920563 |
| open_access_boolean | |
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| physical | 107 S. zahlr. graph. Darst. |
| psigel | TUB-nveb |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| record_format | marc |
| spelling | Weigel, Christoph 1944- Verfasser (DE-588)129209600 aut Semi-empirical calculations for point defects in silicon 1979 107 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Würzburg, Univ., Habil.-Schr., 1979 Silicium (DE-588)4077445-4 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Störstelle (DE-588)4193400-3 s DE-604 |
| spellingShingle | Weigel, Christoph 1944- Semi-empirical calculations for point defects in silicon Silicium (DE-588)4077445-4 gnd Störstelle (DE-588)4193400-3 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4193400-3 (DE-588)4113937-9 |
| title | Semi-empirical calculations for point defects in silicon |
| title_auth | Semi-empirical calculations for point defects in silicon |
| title_exact_search | Semi-empirical calculations for point defects in silicon |
| title_full | Semi-empirical calculations for point defects in silicon |
| title_fullStr | Semi-empirical calculations for point defects in silicon |
| title_full_unstemmed | Semi-empirical calculations for point defects in silicon |
| title_short | Semi-empirical calculations for point defects in silicon |
| title_sort | semi empirical calculations for point defects in silicon |
| topic | Silicium (DE-588)4077445-4 gnd Störstelle (DE-588)4193400-3 gnd |
| topic_facet | Silicium Störstelle Hochschulschrift |
| work_keys_str_mv | AT weigelchristoph semiempiricalcalculationsforpointdefectsinsilicon |