Scanning electron microscopy: SEM ; an internat. journal of scanning electron microscopy, related techniques and applications
Gespeichert in:
Späterer Titel: | Scanning microscopy |
---|---|
Format: | Zeitschrift |
Sprache: | Undetermined |
Veröffentlicht: |
O'Hara, Ill.
Scanning Electron Microscopy Inc.
1968-1986
Chicago, Ill. 1968-1977 |
Schlagworte: | |
Veröffentlicht: | [1.]1968 - 10.1977; 1978 - 1986 |
ISSN: | 0586-5581 0891-7035 |
Internformat
MARC
LEADER | 00000nas a2200000 c 4500 | ||
---|---|---|---|
001 | BV002686071 | ||
003 | DE-604 | ||
005 | 20230413194256 | ||
007 | t | ||
008 | 991119d19681986xxu|| p| |||| 1 ||und d | ||
016 | 7 | |a 011309369 |2 DE-101 | |
016 | 7 | |a 221741-7 |2 DE-600 | |
022 | |a 0586-5581 |2 6 | ||
030 | |a SEMBY | ||
030 | |a SEMYB | ||
035 | |a (OCoLC)1371235771 | ||
035 | |a (DE-599)ZDB221741-7 | ||
040 | |a DE-604 |b ger | ||
041 | |a und | ||
044 | |a xxu |c XD-US | ||
049 | |a DE-12 |a DE-91 |a DE-355 |a DE-83 | ||
084 | |a BIODIV |q DE-30 |2 fid | ||
084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
084 | |a WC 3100 |0 (DE-625)148081: |2 rvk | ||
084 | |a 570 |2 22sdnb | ||
084 | |a CHE 264f |2 stub | ||
084 | |a PHY 135f |2 stub | ||
210 | 1 | 0 | |a Scan Electron Microsc |2 din1502 |
210 | 1 | 0 | |a Scanning Electron Microsc. |2 din1502 |
210 | 1 | 0 | |a Scanning Electron Microsc. (USA) |2 din1502 |
245 | 1 | 0 | |a Scanning electron microscopy |b SEM ; an internat. journal of scanning electron microscopy, related techniques and applications |c Symposium director Om Johari; Irene Corvin |
246 | 1 | 3 | |a SEM |
247 | 1 | 0 | |a proceedings of the Symposium on the Scanning Electron Microscope |f Zusatz [1.]1968 |
247 | 1 | 0 | |a the instrument and its applications |f Zusatz [1.]1968 |
247 | 1 | 0 | |a proceedings of the P.1,4. Annual Scanning Electron Microscope Symposium (April 27-29, 1971), and P.2, Workshop on Forensic Applications of the Scanning Electron Microscope |f Zusatz 4.1971 |
247 | 1 | 0 | |a proceedings of the ... Annual Scanning Electron Microscope Symposium, held at IIT Research Institute |f Zusatz später |
264 | 3 | 1 | |a O'Hara, Ill. |b Scanning Electron Microscopy Inc. |c 1968-1986 |
264 | 2 | 1 | |a Chicago, Ill. |c 1968-1977 |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
362 | 0 | |a [1.]1968 - 10.1977; 1978 - 1986 | |
363 | 0 | 0 | |8 1.1\x |i 1968 |
363 | 1 | 0 | |8 1.2\x |i 1986 |
650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Aufsatzsammlung |0 (DE-588)4143413-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4067488-5 |a Zeitschrift |2 gnd-content | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
689 | 0 | 1 | |a Aufsatzsammlung |0 (DE-588)4143413-4 |D s |
689 | 0 | |5 DE-604 | |
710 | 2 | |a IIT Research Institute |0 (DE-588)25523-3 |4 isb | |
785 | 0 | 0 | |i Forts.: |t Scanning microscopy |d Chicago, Ill. : Scanning Microscopy Int., 1987-1996 |x 0891-7035 |w (DE-604)BV002714381 |
787 | 0 | 8 | |i 1969=2 von |a Scanning Electron Microscope Symposium |t Proceedings of the Annual Scanning Electron Microscope Symposium |d Chicago, Ill. : [Verlag nicht ermittelbar], 1969- |w (DE-600)1159193-6 |
999 | |a oai:aleph.bib-bvb.de:BVB01-001721240 |
Datensatz im Suchindex
_version_ | 1804117056561348608 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV002686071 |
classification_rvk | UH 6300 WC 3100 |
classification_tum | CHE 264f PHY 135f |
ctrlnum | 221741-7 (OCoLC)1371235771 (DE-599)ZDB221741-7 |
dateSpan | [1.]1968 - 10.1977; 1978 - 1986 |
discipline | Physik Biologie Chemie |
format | Journal |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02752nas a2200625 c 4500</leader><controlfield tag="001">BV002686071</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20230413194256 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">991119d19681986xxu|| p| |||| 1 ||und d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">011309369</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">221741-7</subfield><subfield code="2">DE-600</subfield></datafield><datafield tag="022" ind1=" " ind2=" "><subfield code="a">0586-5581</subfield><subfield code="2">6</subfield></datafield><datafield tag="030" ind1=" " ind2=" "><subfield code="a">SEMBY</subfield></datafield><datafield tag="030" ind1=" " ind2=" "><subfield code="a">SEMYB</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1371235771</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)ZDB221741-7</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">BIODIV</subfield><subfield code="q">DE-30</subfield><subfield code="2">fid</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WC 3100</subfield><subfield code="0">(DE-625)148081:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">570</subfield><subfield code="2">22sdnb</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 264f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="210" ind1="1" ind2="0"><subfield code="a">Scan Electron Microsc</subfield><subfield code="2">din1502</subfield></datafield><datafield tag="210" ind1="1" ind2="0"><subfield code="a">Scanning Electron Microsc.</subfield><subfield code="2">din1502</subfield></datafield><datafield tag="210" ind1="1" ind2="0"><subfield code="a">Scanning Electron Microsc. (USA)</subfield><subfield code="2">din1502</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy</subfield><subfield code="b">SEM ; an internat. journal of scanning electron microscopy, related techniques and applications</subfield><subfield code="c">Symposium director Om Johari; Irene Corvin</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">SEM</subfield></datafield><datafield tag="247" ind1="1" ind2="0"><subfield code="a">proceedings of the Symposium on the Scanning Electron Microscope</subfield><subfield code="f">Zusatz [1.]1968</subfield></datafield><datafield tag="247" ind1="1" ind2="0"><subfield code="a">the instrument and its applications</subfield><subfield code="f">Zusatz [1.]1968</subfield></datafield><datafield tag="247" ind1="1" ind2="0"><subfield code="a">proceedings of the P.1,4. Annual Scanning Electron Microscope Symposium (April 27-29, 1971), and P.2, Workshop on Forensic Applications of the Scanning Electron Microscope</subfield><subfield code="f">Zusatz 4.1971</subfield></datafield><datafield tag="247" ind1="1" ind2="0"><subfield code="a">proceedings of the ... Annual Scanning Electron Microscope Symposium, held at IIT Research Institute</subfield><subfield code="f">Zusatz später</subfield></datafield><datafield tag="264" ind1="3" ind2="1"><subfield code="a">O'Hara, Ill.</subfield><subfield code="b">Scanning Electron Microscopy Inc.</subfield><subfield code="c">1968-1986</subfield></datafield><datafield tag="264" ind1="2" ind2="1"><subfield code="a">Chicago, Ill.</subfield><subfield code="c">1968-1977</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="362" ind1="0" ind2=" "><subfield code="a">[1.]1968 - 10.1977; 1978 - 1986</subfield></datafield><datafield tag="363" ind1="0" ind2="0"><subfield code="8">1.1\x</subfield><subfield code="i">1968</subfield></datafield><datafield tag="363" ind1="1" ind2="0"><subfield code="8">1.2\x</subfield><subfield code="i">1986</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Aufsatzsammlung</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4067488-5</subfield><subfield code="a">Zeitschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Aufsatzsammlung</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">IIT Research Institute</subfield><subfield code="0">(DE-588)25523-3</subfield><subfield code="4">isb</subfield></datafield><datafield tag="785" ind1="0" ind2="0"><subfield code="i">Forts.:</subfield><subfield code="t">Scanning microscopy</subfield><subfield code="d">Chicago, Ill. : Scanning Microscopy Int., 1987-1996</subfield><subfield code="x">0891-7035</subfield><subfield code="w">(DE-604)BV002714381</subfield></datafield><datafield tag="787" ind1="0" ind2="8"><subfield code="i">1969=2 von</subfield><subfield code="a">Scanning Electron Microscope Symposium</subfield><subfield code="t">Proceedings of the Annual Scanning Electron Microscope Symposium</subfield><subfield code="d">Chicago, Ill. : [Verlag nicht ermittelbar], 1969-</subfield><subfield code="w">(DE-600)1159193-6</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001721240</subfield></datafield></record></collection> |
genre | (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Zeitschrift Konferenzschrift |
id | DE-604.BV002686071 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:48:20Z |
institution | BVB |
institution_GND | (DE-588)25523-3 |
issn | 0586-5581 0891-7035 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001721240 |
oclc_num | 1371235771 |
open_access_boolean | |
owner | DE-12 DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-83 |
owner_facet | DE-12 DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-83 |
publishDate | 1968 |
publishDateSearch | 1968 1969 1970 1971 1972 1973 1974 1975 1976 1977 1978 1979 1980 1981 1982 1983 1984 1985 1986 |
publishDateSort | 1986 |
publisher | Scanning Electron Microscopy Inc. |
record_format | marc |
spelling | Scan Electron Microsc din1502 Scanning Electron Microsc. din1502 Scanning Electron Microsc. (USA) din1502 Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications Symposium director Om Johari; Irene Corvin SEM proceedings of the Symposium on the Scanning Electron Microscope Zusatz [1.]1968 the instrument and its applications Zusatz [1.]1968 proceedings of the P.1,4. Annual Scanning Electron Microscope Symposium (April 27-29, 1971), and P.2, Workshop on Forensic Applications of the Scanning Electron Microscope Zusatz 4.1971 proceedings of the ... Annual Scanning Electron Microscope Symposium, held at IIT Research Institute Zusatz später O'Hara, Ill. Scanning Electron Microscopy Inc. 1968-1986 Chicago, Ill. 1968-1977 txt rdacontent n rdamedia nc rdacarrier [1.]1968 - 10.1977; 1978 - 1986 1.1\x 1968 1.2\x 1986 Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Aufsatzsammlung (DE-588)4143413-4 gnd rswk-swf (DE-588)4067488-5 Zeitschrift gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Rasterelektronenmikroskopie (DE-588)4048455-5 s Aufsatzsammlung (DE-588)4143413-4 s DE-604 IIT Research Institute (DE-588)25523-3 isb Forts.: Scanning microscopy Chicago, Ill. : Scanning Microscopy Int., 1987-1996 0891-7035 (DE-604)BV002714381 1969=2 von Scanning Electron Microscope Symposium Proceedings of the Annual Scanning Electron Microscope Symposium Chicago, Ill. : [Verlag nicht ermittelbar], 1969- (DE-600)1159193-6 |
spellingShingle | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Aufsatzsammlung (DE-588)4143413-4 gnd |
subject_GND | (DE-588)4048455-5 (DE-588)4143413-4 (DE-588)4067488-5 (DE-588)1071861417 |
title | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications |
title_alt | SEM |
title_auth | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications |
title_exact_search | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications |
title_full | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications Symposium director Om Johari; Irene Corvin |
title_fullStr | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications Symposium director Om Johari; Irene Corvin |
title_full_unstemmed | Scanning electron microscopy SEM ; an internat. journal of scanning electron microscopy, related techniques and applications Symposium director Om Johari; Irene Corvin |
title_new | Scanning microscopy |
title_short | Scanning electron microscopy |
title_sort | scanning electron microscopy sem an internat journal of scanning electron microscopy related techniques and applications |
title_sub | SEM ; an internat. journal of scanning electron microscopy, related techniques and applications |
topic | Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Aufsatzsammlung (DE-588)4143413-4 gnd |
topic_facet | Rasterelektronenmikroskopie Aufsatzsammlung Zeitschrift Konferenzschrift |
work_keys_str_mv | AT iitresearchinstitute scanningelectronmicroscopysemaninternatjournalofscanningelectronmicroscopyrelatedtechniquesandapplications AT iitresearchinstitute sem AT iitresearchinstitute proceedingsofthesymposiumonthescanningelectronmicroscope AT iitresearchinstitute theinstrumentanditsapplications AT iitresearchinstitute proceedingsofthep14annualscanningelectronmicroscopesymposiumapril27291971andp2workshoponforensicapplicationsofthescanningelectronmicroscope AT iitresearchinstitute proceedingsoftheannualscanningelectronmicroscopesymposiumheldatiitresearchinstitute |
zdb_num | 221741-7 (DE-599)ZDB221741-7 |