Microelectronic reliability:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Norwood, MA
Artech House
|
| Schriftenreihe: | The Artech House materials science library
|
| Schlagworte: |
Internformat
MARC
| LEADER | 00000nam a2200000 ca4500 | ||
|---|---|---|---|
| 001 | BV002646443 | ||
| 003 | DE-604 | ||
| 005 | 20021217 | ||
| 007 | t | ||
| 008 | 900510nuuuuuuuu |||| 00||| eng d | ||
| 035 | |a (DE-599)BVBBV002646443 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 084 | |a ELT 240f |2 stub | ||
| 245 | 1 | 0 | |a Microelectronic reliability |c Edward B. Hakim |
| 264 | 1 | |a Norwood, MA |b Artech House | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a The Artech House materials science library | |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 1 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Hakim, Edward B. |e Sonstige |4 oth | |
| 700 | 1 | |a Pollino, Emiliano |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012165656 | ||
Datensatz im Suchindex
| _version_ | 1804132007816462336 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV002646443 |
| classification_rvk | ZN 4040 |
| classification_tum | ELT 240f |
| ctrlnum | (DE-599)BVBBV002646443 |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01199nam a2200361 ca4500</leader><controlfield tag="001">BV002646443</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20021217 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">900510nuuuuuuuu |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002646443</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microelectronic reliability</subfield><subfield code="c">Edward B. Hakim</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Norwood, MA</subfield><subfield code="b">Artech House</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">The Artech House materials science library</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hakim, Edward B.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pollino, Emiliano</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-012165656</subfield></datafield></record></collection> |
| id | DE-604.BV002646443 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:45:59Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012165656 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | Artech House |
| record_format | marc |
| series2 | The Artech House materials science library |
| spelling | Microelectronic reliability Edward B. Hakim Norwood, MA Artech House txt rdacontent n rdamedia nc rdacarrier The Artech House materials science library Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Prüftechnik (DE-588)4047610-8 s Hakim, Edward B. Sonstige oth Pollino, Emiliano Sonstige oth |
| spellingShingle | Microelectronic reliability Zuverlässigkeit (DE-588)4059245-5 gnd Prüftechnik (DE-588)4047610-8 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4047610-8 (DE-588)4039207-7 |
| title | Microelectronic reliability |
| title_auth | Microelectronic reliability |
| title_exact_search | Microelectronic reliability |
| title_full | Microelectronic reliability Edward B. Hakim |
| title_fullStr | Microelectronic reliability Edward B. Hakim |
| title_full_unstemmed | Microelectronic reliability Edward B. Hakim |
| title_short | Microelectronic reliability |
| title_sort | microelectronic reliability |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Prüftechnik (DE-588)4047610-8 gnd Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Zuverlässigkeit Prüftechnik Mikroelektronik |
| work_keys_str_mv | AT hakimedwardb microelectronicreliability AT pollinoemiliano microelectronicreliability |