Elektronenmikroskopie: Grundlagen und Anwendung
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | German English |
| Veröffentlicht: |
London [u.a.]
McGraw-Hill
1991
|
| Schlagworte: | |
| Beschreibung: | 244 S. Ill., graph. Darst. |
| ISBN: | 3890287824 |
Internformat
MARC
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| 041 | 1 | |a ger |h eng | |
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| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 240 | 1 | 0 | |a Electron microscopy and analysis |
| 245 | 1 | 0 | |a Elektronenmikroskopie |b Grundlagen und Anwendung |c P. J. Goodhew ; F. J. Humphreys |
| 264 | 1 | |a London [u.a.] |b McGraw-Hill |c 1991 | |
| 300 | |a 244 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Elektronenmikroskopie | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
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| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Humphreys, John F. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001688824 | ||
Datensatz im Suchindex
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| any_adam_object | |
| author | Goodhew, Peter J. Humphreys, John F. |
| author_facet | Goodhew, Peter J. Humphreys, John F. |
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| author_sort | Goodhew, Peter J. |
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| building | Verbundindex |
| bvnumber | BV002629238 |
| classification_rvk | UH 6300 ZM 8150 |
| ctrlnum | (OCoLC)256070636 (DE-599)BVBBV002629238 |
| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| id | DE-604.BV002629238 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:47:38Z |
| institution | BVB |
| isbn | 3890287824 |
| language | German English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001688824 |
| oclc_num | 256070636 |
| open_access_boolean | |
| owner | DE-384 DE-859 DE-19 DE-BY-UBM DE-355 DE-BY-UBR DE-20 DE-29T DE-523 DE-526 DE-83 DE-188 DE-634 DE-B768 DE-858 |
| owner_facet | DE-384 DE-859 DE-19 DE-BY-UBM DE-355 DE-BY-UBR DE-20 DE-29T DE-523 DE-526 DE-83 DE-188 DE-634 DE-B768 DE-858 |
| physical | 244 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | McGraw-Hill |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Elektronenmikroskopie Grundlagen und Anwendung P. J. Goodhew ; F. J. Humphreys London [u.a.] McGraw-Hill 1991 244 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Humphreys, John F. Verfasser aut |
| spellingShingle | Goodhew, Peter J. Humphreys, John F. Elektronenmikroskopie Grundlagen und Anwendung Elektronenmikroskopie Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Elektronenmikroskopie Grundlagen und Anwendung |
| title_alt | Electron microscopy and analysis |
| title_auth | Elektronenmikroskopie Grundlagen und Anwendung |
| title_exact_search | Elektronenmikroskopie Grundlagen und Anwendung |
| title_full | Elektronenmikroskopie Grundlagen und Anwendung P. J. Goodhew ; F. J. Humphreys |
| title_fullStr | Elektronenmikroskopie Grundlagen und Anwendung P. J. Goodhew ; F. J. Humphreys |
| title_full_unstemmed | Elektronenmikroskopie Grundlagen und Anwendung P. J. Goodhew ; F. J. Humphreys |
| title_short | Elektronenmikroskopie |
| title_sort | elektronenmikroskopie grundlagen und anwendung |
| title_sub | Grundlagen und Anwendung |
| topic | Elektronenmikroskopie Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmikroskopie |
| work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT humphreysjohnf electronmicroscopyandanalysis AT goodhewpeterj elektronenmikroskopiegrundlagenundanwendung AT humphreysjohnf elektronenmikroskopiegrundlagenundanwendung |